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ion scattering spectroscopy

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.t66910475
EISBN: 978-1-62708-250-1
... Mass spectrography Recording on a photographic plate of the spectrum produced after ionizing a solid sample and accelerating the ions through a magnetic field. Spectral line densities compared, subsequently, with a standard Quantitative bulk or local chemical composition. Minor and trace...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
...-of-flight secondary ion mass spectrometry; FTIR, Fourier transform infrared (spectroscopy) Comparison summary of scanning electron beam instruments equipped with secondary electron and x-ray detectors Table 2 Comparison summary of scanning electron beam instruments equipped with secondary electron...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
... location of sample, imaging plane, energy dispersive spectrometer and electron energy loss spectrometer (E is in incident electron energy and ΔE is the energy loss because of inelastic scattering by various elements in the sample). Figure 11 Planar TEM image of polysilicon lines. Contrast...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400149
EISBN: 978-1-62708-258-7
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430204
EISBN: 978-1-62708-253-2
... surface showed numerous pits. The morphology of the pit contours was indicative of a tunneling effect ( Fig. 6.69 ). Fig. 6.69 SEM image of the OD surface showing scattered pits with tunneling effect, 1000× Energy dispersive spectroscopy analysis on the outer surface of the tube showed...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
... of the iron and to determine the proportions of Fe 3+ and Fe 2+ ions, and in turn the relative proportion of Fe 3 O 4 and Fe 2 O 3 . Along similar lines, it is possible to analyze the type of oxide formed as a result of corrosion or scaling. X-ray photoelectron spectroscopy can also be used...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.9781627082532
EISBN: 978-1-62708-253-2
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780343
EISBN: 978-1-62708-281-5
..., chemical analysis Attenuated total reflectance (ATR) Surface functional groups Molecular information Nuclear magnetic resonance (NMR) spectroscopy Chemical shift of nuclei Molecular structure, functional group determination, sequence distribution Mass spectroscopy Mass/charge of ions produced...
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.9781627082921
EISBN: 978-1-62708-292-1
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220085
EISBN: 978-1-62708-259-4
... and emitted x-rays and the methods used to access it, namely wavelength and energy dispersive spectroscopy and electron backscattering diffraction techniques. It also describes the role of focused ion beam milling in sample preparation and provides information on atom probes, atomic force microscopes...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110434
EISBN: 978-1-62708-247-1
...Properties of analytical techniques including energy dispersive x-ray spectroscope (EDS) in the SEM or STEM (with thin samples), wavelength dispersive x-ray spectroscopy (WDS), Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS, also knows as ESCA), secondary ion mass...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430351
EISBN: 978-1-62708-253-2
.... Fatigue striations along with scattered corrosion deposits are shown. Fig. 6.161 (a) Parent metal structure of banded ferrite and pearlite, 400×. (b) Weld microstructure of acicular ferrite with finely distributed carbides, 400×. (c) Unetched view of ID having crack with wide opening and filled...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
... spray coatings. The techniques covered are optical microscopy, X-Ray diffraction, scanning electron microscopy, focused ion beam machining, electron probe microanalysis, transmission electron microscopy, and electron backscattered diffraction. The techniques also include electron channeling contrast...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2017
DOI: 10.31399/asm.tb.sccmpe2.t55090191
EISBN: 978-1-62708-266-2
..., and data are normalized using reactor operating time (i.e., percentage of components with intergranular cracks divided by months of online exposure). The scatter in Fig. 6.4(a) was attributed to variations influence and specific ion chemistry, as well as to limitations in the resolution of underwater...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110413
EISBN: 978-1-62708-247-1
...) or better to minimize scattering of the electron beam and to prevent contamination of the sample by beam-deposited materials. However, in some cases it is desirable to raise the chamber pressure. This can be achieved by “differential pumping” so that the electron source remains at low pressure while...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 2009
DOI: 10.31399/asm.tb.bcp.t52230459
EISBN: 978-1-62708-298-3
... of the native oxides that form on the surface of beryllium and their ability to withstand acids, bases, and corrosive agents found in rain and seawater. It explains how carbides, inclusions, ions, and impurities contribute to corrosion damage, particularly pitting, and how corrosion reduces the ductility...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.9781627082587
EISBN: 978-1-62708-258-7
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 2009
DOI: 10.31399/asm.tb.bcp.t52230361
EISBN: 978-1-62708-298-3
...Abstract Abstract This chapter discusses coating technologies that are applicable to beryllium, including physical and chemical vapor deposition, thermal evaporation, electroplating, sputtering, ion plating, and plasma arc spraying. It describes the advantages and disadvantages of each method...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 1999
DOI: 10.31399/asm.tb.caaa.t67870191
EISBN: 978-1-62708-299-0
... readily made. Frequent Analytical Concentration of the corroded metal ions or concentration of inhibitor Can identify specific corroding equipment. Wide range of analytical tools available. Specific ion electrodes readily used. Moderate Analytical pH of process stream Commonly used...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2015
DOI: 10.31399/asm.tb.cpi2.t55030082
EISBN: 978-1-62708-282-2
... Scattering Investigation of Ag 0.7 Au 0.3 Dealloying Under Potential Control , Mater. Res. Soc. Sym. Proc. , Vol 451 , 1997 , p 93 – 98 10.1557/PROC-451-93 22. Kelly R.G. , Frost A.J. , Shahrabi T. , and Newman R.C. , Brittle Fracture of an Au/Ag Alloy Induced by a Surface...