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ion scattering spectroscopy

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Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
... Abstract This article covers common techniques for surface characterization, including the modern scanning electron microscopy and methods for the chemical characterization of surfaces by Auger electron spectroscopy, X-ray photoelectron spectroscopy, and time-of-flight secondary ion mass...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
... scattered electrons are used to form an image. TEM based elemental analysis techniques utilize X-ray photons in energy dispersive spectroscopy (EDS) [1 - 2] and inelastically scattered electrons or the ‘energy-loss’ electron in electron energy loss spectroscopy (EELS) and Energy-filtered transmission...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
... Abstract This chapter describes some of the most effective tools for investigating boiler tube failures, including scanning electron microscopy, optical emission spectroscopy, atomic absorption spectroscopy, x-ray fluorescence spectroscopy, x-ray diffraction, and x-ray photoelectron...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430204
EISBN: 978-1-62708-253-2
... surface showed numerous pits. The morphology of the pit contours was indicative of a tunneling effect ( Fig. 6.69 ). Fig. 6.69 SEM image of the OD surface showing scattered pits with tunneling effect, 1000× Energy dispersive spectroscopy analysis on the outer surface of the tube showed...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.t66910475
EISBN: 978-1-62708-250-1
... for SEMs and permit simultaneous viewing and chemical analysis of a surface. To detect the elements in extremely thin surface layers, Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS), Mössbauer spectroscopy, secondary ion mass spectroscopy (SIMS), low-energy ion-scattering...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780343
EISBN: 978-1-62708-281-5
... reflectance (ATR) Surface functional groups Molecular information Nuclear magnetic resonance (NMR) spectroscopy Chemical shift of nuclei Molecular structure, functional group determination, sequence distribution Mass spectroscopy Mass/charge of ions produced Molecular structure X-ray...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400149
EISBN: 978-1-62708-258-7
... of the specimen from the primary beam to measure the inelastically scattered electrons that pass through the specimen. The detector measures the energy loss of the electrons passing through the specimen. The technique is called energy loss spectroscopy, or EELS. From an EELS spectrum, one can detect light...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220085
EISBN: 978-1-62708-259-4
... and emitted x-rays and the methods used to access it, namely wavelength and energy dispersive spectroscopy and electron backscattering diffraction techniques. It also describes the role of focused ion beam milling in sample preparation and provides information on atom probes, atomic force microscopes...
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.9781627082921
EISBN: 978-1-62708-292-1
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.9781627082532
EISBN: 978-1-62708-253-2
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 2009
DOI: 10.31399/asm.tb.bcp.t52230361
EISBN: 978-1-62708-298-3
... Abstract This chapter discusses coating technologies that are applicable to beryllium, including physical and chemical vapor deposition, thermal evaporation, electroplating, sputtering, ion plating, and plasma arc spraying. It describes the advantages and disadvantages of each method...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110434
EISBN: 978-1-62708-247-1
... (with thin samples), wavelength dispersive x-ray spectroscopy (WDS), Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS, also knows as ESCA), secondary ion mass spectrometry (SIMS), Rutherford backscattering spectrometry (RBS), Fourier transform infrared spectroscopy (FTIR), and total...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
... coatings. The techniques covered are optical microscopy, X-Ray diffraction, scanning electron microscopy, focused ion beam machining, electron probe microanalysis, transmission electron microscopy, and electron backscattered diffraction. The techniques also include electron channeling contrast imaging, X...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110413
EISBN: 978-1-62708-247-1
... be improved, especially at low voltage. [2] Beam-Sample Interactions When a primary electron beam enters a sample, the electrons are scattered laterally and gradually lose energy due to collisions with atoms in the sample. The overall result is that the electron energy is deposited in a tear-drop...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 30 September 2023
DOI: 10.31399/asm.tb.stmflw.t59390145
EISBN: 978-1-62708-459-8
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 2009
DOI: 10.31399/asm.tb.bcp.t52230459
EISBN: 978-1-62708-298-3
... oxides that form on the surface of beryllium and their ability to withstand acids, bases, and corrosive agents found in rain and seawater. It explains how carbides, inclusions, ions, and impurities contribute to corrosion damage, particularly pitting, and how corrosion reduces the ductility and fracture...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430351
EISBN: 978-1-62708-253-2
... 0.473 4.0 0.10 0.91 0.463 At ID 0.0620 0.930 0.463 Energy dispersive spectroscopy analysis on the inner surface showed the presence of oxygen, aluminum, silicon, chlorine (as chloride), calcium and potassium, whereas EDS on the outer surface revealed carbon, oxygen, magnesium...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400245
EISBN: 978-1-62708-258-7
.... A chemical substance that yields hydrogen ions (H ) when dissolved in water. Compare with base. acid embrittlement. A form of hydrogen embrittlement that may be induced in some metals by acid treatment. acid extraction. Removal of phases by dissolution of the matrix metal in an acid or other corrosive...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2017
DOI: 10.31399/asm.tb.sccmpe2.t55090191
EISBN: 978-1-62708-266-2
..., and data are normalized using reactor operating time (i.e., percentage of components with intergranular cracks divided by months of online exposure). The scatter in Fig. 6.4(a) was attributed to variations influence and specific ion chemistry, as well as to limitations in the resolution of underwater...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2015
DOI: 10.31399/asm.tb.cpi2.t55030045
EISBN: 978-1-62708-282-2
... cover is built up. A scatter of individual barnacles on a stainless steel surface creates oxygen concentration cells. The portion of the metal surface covered by the barnacle shell is shielded from dissolved oxygen in the water and thus becomes the anode. The result is crevice corrosion under the base...