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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110391
EISBN: 978-1-62708-247-1
...) device sectioning techniques, non-encapsulated device techniques, utilization of the focused ion beam (FIB) making a cross-section and/or enhancing a physically polished one. Delineation methods for revealing structures are also discussed. These can be chemical etchants, chemo-mechanical polishing...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.pnfn.t65900071
EISBN: 978-1-62708-350-8
... that glows brightly and crisply. Fig. 2 Paschen curve showing the relationship between voltage and current and the various glow discharge characteristics Fig. 3 Illustration of the ammonia molecule 2NH 3 and its decomposition Fig. 4 Glow discharge ion nitriding mechanisms...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.pnfn.t65900089
EISBN: 978-1-62708-350-8
...Comparison between hot-wall and cold-wall plasma ion nitriding systems Table 1 Comparison between hot-wall and cold-wall plasma ion nitriding systems Question Cold wall Hot wall At what temperature is plasma started? Room temperature At a suitable elevated temperature, usually...
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Published: 01 November 2013
Fig. 24 Ion-carburized gear tooth, 2H2N4A steel, ion carburized at 920 °C (1690 °F), austenitized at 830 °C (1525 °F), oil quenched and tempered at 150 °C (300 °F). Source: Ref 12 More
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Published: 01 June 2008
Fig. 21.7 Ion-carburized gear tooth, 2H2N4A steel, ion carburized at 920 °C (1690 °F), austenitized at 830 °C (1525 °F), oil quenched and tempered at 150 °C (300 °F). Source: Ref 4 More
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Published: 01 December 2003
Fig. 15 Time-of-flight secondary ion mass spectrometry positive ion spectrum of stainless steel surface More
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Published: 01 November 2019
Figure 2 A) Trace reroute performed by He ion beam. B) Deposition of <30nm cobalt lines with He ion beam induced deposition. C) 40nm wide via milled with neon FIB and tungsten filled with helium ion beam induced deposition. More
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Published: 01 November 2019
Figure 45 FIB cross section images of direct Ne and Ga ion sputtering into Si and Cu samples at a range of energies from 9 KeV to 35 keV. [95] More
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Published: 01 November 2019
Figure 46 Ne + ion beam top view and cross sections of backside circuit milling activities in a 32 nm node IC. [96] More
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Published: 01 November 2019
Figure 47 An example of Co depositions created with a helium ion beam. [99] More
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Published: 01 November 2019
Fig. 17 Ion mode view of the sample in Fig. 16 . The pattern has already been milled into it. More
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Published: 01 November 2019
Fig. 24 Top image shows section before ion milling. The bottom image is the same area after ion milling. More
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Published: 01 November 2019
Figure 3 Copper bumps prepared in cross-section (A) post cleave (B) after broad ion beam milling. More
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Published: 01 November 2019
Figure 12 Scanning electron micrograph of a cracked solder bump; ion beam milling was used to clean up the smear caused by manual cross sectioning and reveal the details of the failure. This device was subject to a temperature cycle stress. More
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Published: 01 January 2015
Fig. 22.5 Schematic diagram of ion-beam mixing process. Source: Ref 22.14 More
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Published: 01 January 2015
Fig. 22.10 (Ti 33 Al 17 )N coating deposited by triode ion plating at low substrate current density. Scanning electron micrograph. Courtesy of A.S. Korhonen, Helsinki University of Technology. Source: Ref 22.40 , 22.41 More
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Published: 01 January 2015
Fig. 22.11 (T i ,Al)N coating deposited by triode ion plating at high substrate current density. Courtesy of A.S. Korhonen, Helsinki University of Technology. Source: Ref 22.40 , 22.41 More
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Published: 01 January 2015
Fig. 22.12 ZrN coating deposited by triode ion plating. Scanning electron micrograph. Courtesy of A.S. Korhonen, Helsinki University of Technology. Source: Ref 22.40 , 22.41 More
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Published: 01 January 2017
Fig. 10.7 Influence of halide ion concentration on (a) crack velocity of titanium alloys in aqueous solution and (b) K ISCC More
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Published: 01 January 2017
Fig. 12.4 Effects of chloride-ion concentration and initial stress intensity on times to failure of U-7.5Nb-2.5Zr. Source: Ref 12.18 More