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interferometry

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110144
EISBN: 978-1-62708-247-1
... or a surface interferometry map must be obtained of a properly exposed die. Once there is evidence of clearing of the silicon anywhere, this area is avoided and the remaining area is targeted for another 5μm off. This process continues until most of the residual substrate is removed as shown in Figure 13...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850267
EISBN: 978-1-62708-260-0
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720117
EISBN: 978-1-62708-305-8
... are used extensively and can provide a high degree of deformation (strain) measurement accuracy. Other more advanced instrumentations, such as laser interferometry and video extensometers, are also available. The test piece is one of two basic types. Either it is a full cross section of the product...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780204
EISBN: 978-1-62708-281-5
... and growth. Researchers ( Ref 35 ) simultaneously studied the areal growth and change in craze thickness with time. From the resulting craze profiles, a blunting of the craze tip with time was observed. Double-exposure holographic interferometry was used to investigate the craze opening displacement profile...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110563
EISBN: 978-1-62708-247-1
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2011
DOI: 10.31399/asm.tb.htpa.t53310091
EISBN: 978-1-62708-346-1
..., differential confocal microscopes, nano measuring devices, or optical interferometers. When interferometry is used, the calibration is performed by a lateral surface of the pyramid being adjusted in such a way that no interference rings can be seen; then the next surface is adjusted likewise. The calibration...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110153
EISBN: 978-1-62708-247-1
... will force the surface concave. Figure 10 Interferometry image taken with 1064nm illumination. Newton’s rings show conical nature of the flat lap thinning to better approximate the convex shape. With the exception of the edges of the die where the fringe spacing decreases drastically (r 2 model...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110524
EISBN: 978-1-62708-247-1
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110351
EISBN: 978-1-62708-247-1
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 2009
DOI: 10.31399/asm.tb.bcp.t52230361
EISBN: 978-1-62708-298-3
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400109
EISBN: 978-1-62708-258-7
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.mmfi.t69540169
EISBN: 978-1-62708-309-6
... the plastic zone shape (under an optical microscope) and for quantitative measurement of its size. Other techniques include photostress and interferometry photography. Under normal circumstances, reliable results are difficult to obtain while the specimen is under load, due to testing machine vibration and so...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850410
EISBN: 978-1-62708-260-0
...). 6-4.3 Coating Thickness Many destructive and nondestructive techniques have been developed for measuring the thickness of surface coatings. Microscopic methods include nondestructive interferometry [ 24 ] or measurements on cross sections [ 25 – 30 ]. ASTM (American Society for Testing...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.9781627082600
EISBN: 978-1-62708-260-0