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interferometry

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Published: 01 November 2019
Figure 10 Interferometry image taken with 1064nm illumination. Newton’s rings show conical nature of the flat lap thinning to better approximate the convex shape. With the exception of the edges of the die where the fringe spacing decreases drastically (r 2 model), the flatness is close More
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 30 September 2023
DOI: 10.31399/asm.tb.stmflw.t59390145
EISBN: 978-1-62708-459-8
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110144
EISBN: 978-1-62708-247-1
... of this desk reference. If the warp deformation exceeds the thickness of the die, the RST method is not applicable and either the manual method must be used or a surface interferometry map must be obtained of a properly exposed die. Figure 14 Bottom die #8 in the stack exposed and intact after removal...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780204
EISBN: 978-1-62708-281-5
... craze profiles, a blunting of the craze tip with time was observed. Double-exposure holographic interferometry was used to investigate the craze opening displacement profile of solvent crazes grown in PS from preexisting cracks ( Ref 36 ). Most investigators have studied craze growth by measuring...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720117
EISBN: 978-1-62708-305-8
.... These devices are used extensively and can provide a high degree of deformation (strain) measurement accuracy. Other more advanced instrumentations, such as laser interferometry and video extensometers, are also available. General Procedures Numerous groups have developed standard methods for conducting...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110563
EISBN: 978-1-62708-247-1
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.tb.tt2.t51060101
EISBN: 978-1-62708-355-3
... to 4 length-to-width ratio is −0.05 times the major strain, which is close to the plane-strain condition of zero minor strain. The in-plane strains are measured by means of grid markings on the samples, and through-thickness deformations can be observed by holographic interferometry. A similar...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850267
EISBN: 978-1-62708-260-0
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2011
DOI: 10.31399/asm.tb.htpa.t53310091
EISBN: 978-1-62708-346-1
... devices, or optical interferometers. When interferometry is used, the calibration is performed by a lateral surface of the pyramid being adjusted in such a way that no interference rings can be seen; then the next surface is adjusted likewise. The calibration values for the angles are directly determined...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110153
EISBN: 978-1-62708-247-1
...] . Figure 10 Interferometry image taken with 1064nm illumination. Newton’s rings show conical nature of the flat lap thinning to better approximate the convex shape. With the exception of the edges of the die where the fringe spacing decreases drastically (r 2 model), the flatness is close to the center...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.tb.tt2.t51060065
EISBN: 978-1-62708-355-3
.... Other more advanced instrumentations, such as laser interferometry and video extensometers, are also available. Fig. 10 Test specimen with an extensometer attached to measure specimen deformation. Courtesy of Epsilon Technology Corporation Fig. 11 Strain gages mounted directly...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110524
EISBN: 978-1-62708-247-1
... inspection often reveals the presence of mechanical damage or contamination responsible for the device failure. It is also quick, non-destructive, and inexpensive. Nomarski Microscopy A Nomarski microscope can enhance the contrast of steps in height by using interferometry. Its output can be very...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110351
EISBN: 978-1-62708-247-1
... microscopy focal length measurement, pilot holes, optical interferometry, and direct visualization of the n-well diffusion layer of the IC. A recent technology uses IR interferometric based methods that provides measurable advantages to the FIB operator. Figure 7 shows an example. RST is measured...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400109
EISBN: 978-1-62708-258-7
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 2009
DOI: 10.31399/asm.tb.bcp.t52230361
EISBN: 978-1-62708-298-3
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.mmfi.t69540169
EISBN: 978-1-62708-309-6
... the plastic zone shape (under an optical microscope) and for quantitative measurement of its size. Other techniques include photostress and interferometry photography. Under normal circumstances, reliable results are difficult to obtain while the specimen is under load, due to testing machine vibration and so...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850410
EISBN: 978-1-62708-260-0
...). 6-4.3 Coating Thickness Many destructive and nondestructive techniques have been developed for measuring the thickness of surface coatings. Microscopic methods include nondestructive interferometry [ 24 ] or measurements on cross sections [ 25 – 30 ]. ASTM (American Society for Testing...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 30 September 2023
DOI: 10.31399/asm.tb.stmflw.t59390456
EISBN: 978-1-62708-459-8
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 30 September 2023
DOI: 10.31399/asm.tb.stmflw.t59390173
EISBN: 978-1-62708-459-8