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interference microscopy

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030089
EISBN: 978-1-62708-349-2
..., interference and contrast microscopy, and fluorescence microscopy. The chapter also provides a discussion of sample preparation materials such as dyes, etchants, and stains for the analysis of composite materials using optical microscopy. References References 1. Abromowitz M. , Contrast...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850267
EISBN: 978-1-62708-260-0
... on the nature of the problem, the expertise of the investigator, and the available equipment. Microscopy methods for enhancing contrast include the following Dark-field illumination Polarized light Phase contrast Interference methods Filters 4-2 Basic Concepts in Light Optical Theory...
Image
Published: 01 December 2016
Fig. 2.4 Microstructure of the AlCr15 alloy, precipitates of θ Cr phase. (a) Bright-field (BF) illumination. (b) Differential interference contrast (DIC) illumination. Light microscopy (LM), etch. 1HF(1). Source: Ref 12 More
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780141
EISBN: 978-1-62708-268-6
... material performance (e.g., fuels and explosives). Contaminants can interfere with painting and other coating operations, allowing corrosion to accelerate, coatings to flake off, and so on. There are numerous techniques for confirming contaminant presence. Magnification, optical microscopy...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780193
EISBN: 978-1-62708-268-6
..., scanning electron microscopy, along with EDAX, spectrometry, chromatography (depending on material type) Interference Dimensional inspection, tolerance analysis, visual examination, microscopic examination Wear Dimensional inspection, tolerance analysis, visual examination, microscopic examination...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030115
EISBN: 978-1-62708-349-2
... Fig. 6.1 Collage of micrographs taken from an ultrathin section of an interlayer-modified carbon fiber composite. The morphology of the interlayer area is shown with the use of transmitted-light Hoffman modulation contrast and differential interference contrast (DIC). Reflected-light bright...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110067
EISBN: 978-1-62708-247-1
... longitudinal, shear and surface waves in the sample [5 , 6] . Instead of the large water baths of C-scan, a tiny water droplet acoustically couples the transducer and sample. Image contrast is formed by the combined interference of longitudinal, shear and leaky surface waves. Narrow-band RF pulses...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110010
EISBN: 978-1-62708-247-1
... inspection, X-ray inspection, scanning acoustic microscopy, infrared (IR) microscopy, and electrical verification. The article discusses various fault isolation techniques to tackle the wide array of failure signatures, namely IR lock-in thermography, magnetic current imaging, time domain reflectometry...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110042
EISBN: 978-1-62708-247-1
... the image. For laser techniques, any residual waviness will cause interference artifacts that will impede the examination. Photoemission Infrared Microscopy Many defects permit unwanted electron-hole recombination. An example would be a conducting path punched through an oxide by static damage...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
... Abstract This chapter describes some of the most effective tools for investigating boiler tube failures, including scanning electron microscopy, optical emission spectroscopy, atomic absorption spectroscopy, x-ray fluorescence spectroscopy, x-ray diffraction, and x-ray photoelectron...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270102
EISBN: 978-1-62708-301-0
.... dowel bolts fatigue failure fractography low-cycle fatigue test metallography scanning electron microscopy Summary The spur and bevel gears of an aircraft engine were fastened by a set of six dowel bolts. Following a few incidents of dowel bolt failure, the diameter of the bolts...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780109
EISBN: 978-1-62708-268-6
... fracture in various manners. They can corrode, fracture, deform, interfere with one another, disconnect, or leak. They may not meet drawing requirements and fail as a nonconformance consequence. An examination of the failed system and its components can confirm or refute the existence of hypothesized...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030177
EISBN: 978-1-62708-349-2
... Fig. 10.4 Dispersed-phase-toughened carbon fiber composite material that was sectioned at an oblique angle to obtain a larger view of the interlayer region. A complex morphology was revealed, which was also present in the intraply area. Ultrathin section. Transmitted light, differential interference...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
... Abstract The ultimate goal of the failure analysis process is to find physical evidence that can identify the root cause of the failure. Transmission electron microscopy (TEM) has emerged as a powerful tool to characterize subtle defects. This article discusses the sample preparation procedures...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850165
EISBN: 978-1-62708-260-0
... in reflectivity from one another or from the matrix by at least 6 to 8 percent in the as-polished condition can be distinguished clearly. Smaller differences in reflectivity can be accentuated and made visible by the use of vapor-deposited interference films or by the use of phase-contrast illumination. Inclusion...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110550
EISBN: 978-1-62708-247-1
... nondestructive to maintain the integrity of the sample and verify that data collected can match that of the test fail data. When a component and area of interest are identified, additional non-destructive imaging techniques, such as X-Ray imaging and CSAM (Confocal Scanning Acoustic Microscopy) can be used...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110025
EISBN: 978-1-62708-247-1
...-destructive localization techniques. The techniques considered for advanced fault isolation are magnetic current imaging for shorts and opens; infrared thermography for electrical shorts; time-domain-reflectometry for shorts and opens; scanning acoustic microscopy; and 2D/3D X-Ray microscopy. The individual...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220085
EISBN: 978-1-62708-259-4
... Abstract This chapter discusses the use of electron microscopy in metallographic analysis. It explains how electrons interact with metals and how these interactions can be harnessed to produce two- and three-dimensional images of metal surfaces and generate crystallographic and compositional...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400109
EISBN: 978-1-62708-258-7
... for biological specimens. Strain-Free Objective For ferrous specimens, differential interference contrast, or the Nomarski technique, is more commonly used than phase contrast (previously mentioned). In this case, a strain-free objective is used, and this objective may be engraved with an “N” for Nomarski...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.9781627082600
EISBN: 978-1-62708-260-0