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Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780089
EISBN: 978-1-62708-281-5
... Abstract This article focuses on characterization techniques used for analyzing the physical behavior and chemical composition of thermoset resins, namely chromatography and infrared spectroscopy. The main purpose is to give sufficient detail to permit the reader understand a particular test...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780359
EISBN: 978-1-62708-281-5
... techniques are supplemented by a series of case studies that include pertinent visual examination results and the corresponding images that aided in the characterization of the failures. The techniques covered include Fourier transform infrared spectroscopy, differential scanning calorimetry...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780343
EISBN: 978-1-62708-281-5
... pertinent to structure analysis. This is followed by a review of the characterization of plastics by infrared and nuclear magnetic resonance spectroscopy. The article then provides information on the distribution of molecular weight of an engineering plastic. It further discusses the methods used in thermal...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
... >1 μm <0.1 at.% Difficult Note: EDS, energy-dispersive spectroscopy; WDS, wavelength-dispersive spectroscopy; AES, Auger electron spectroscopy; XPS, x-ray photoelectron spectroscopy; TOF-SIMS, time-of-flight secondary ion mass spectrometry; FTIR, Fourier transform infrared (spectroscopy...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110010
EISBN: 978-1-62708-247-1
... optical inspection, X-ray inspection, scanning acoustic microscopy, infrared (IR) microscopy, and electrical verification. The article discusses various fault isolation techniques to tackle the wide array of failure signatures, namely IR lock-in thermography, magnetic current imaging, time domain...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2007
DOI: 10.31399/asm.tb.smnm.t52140201
EISBN: 978-1-62708-264-8
... Abstract Temperature is a critical process parameter in the heat treatment and forging of steel and must be accurately measured to properly control it. This appendix discusses the operating principles of thermocouples and infrared pyrometers, describing the various types as well as advantages...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110434
EISBN: 978-1-62708-247-1
... electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS, also knows as ESCA), secondary ion mass spectrometry (SIMS), Rutherford backscattering spectrometry (RBS), Fourier transform infrared spectroscopy (FTIR), and total-reflection x-ray fluorescence (TXRF). Each of these capabilities is given...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720139
EISBN: 978-1-62708-305-8
... Abstract The overall chemical composition of metals and alloys is most commonly determined by x-ray fluorescence (XRF) and optical emission spectroscopy (OES). High-temperature combustion and inert gas fusion methods are typically used to analyze dissolved gases (oxygen, nitrogen, and hydrogen...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780093
EISBN: 978-1-62708-268-6
... electron probe microanalysis, Fourier transform infrared spectroscopy, mass spectrometry, secondary ion mass spectrometry, and Auger analysis), and chromatography. These technologies are described as follows. Several tools and instruments are available for examining and analyzing suspect...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.9781627082815
EISBN: 978-1-62708-281-5
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780141
EISBN: 978-1-62708-268-6
... microscopy, and scanning electron microscopy can reveal the presence of contaminants. Any of the materials analysis technologies (energy-dispersive analysis of x-rays, Fourier transform infrared spectroscopy, spectrometry, chromatography, secondary ion mass spectrometry, and Auger) can be used to identify...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780131
EISBN: 978-1-62708-268-6
..., and even skin oils can degrade a bond joint. If the epoxy or adhesive makes a clean break from one or both of the sealed surfaces, this usually indicates the presence of a contaminant. Fourier transform infrared spectroscopy is a good technology for identifying the presence of such contaminants...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780146
EISBN: 978-1-62708-281-5
... viscometry, measuring oxygen uptake, and monitoring the rate of formation of new groups, such as carbonyl (–C=O) groups, using Fourier transform infrared (FTIR) spectroscopy. Because there have been many investigations of the outdoor oxidative degradation of natural rubber, considerable information is...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780336
EISBN: 978-1-62708-281-5
... sterilized in ethylene oxide gas to stop the degradation process. The degraded material was analyzed by x-ray diffraction, infrared spectroscopy, and mechanical property tests. The degree of crystallinity, as measured by x-ray diffraction, was found to increase during the degradation by fungi. This is...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.scm.t52870063
EISBN: 978-1-62708-314-0
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.t66910475
EISBN: 978-1-62708-250-1
... both crystalline and amorphous solids, as well as liquids and gases. Infrared and ultraviolet spectroscopy are used to analyze organic materials. When organic materials, such as solvents, oils, greases, rubber, and plastic, are present in a complex mixture, the mixture is first separated into its...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110603
EISBN: 978-1-62708-247-1
... scanning electron microscope (E-SEM), energy dispersive spectroscopy (EDS), differential scanning calorimetry (DSC), thermomechanical analyzer (TMA), thermomechanical analyzer (TMA), dynamic mechanical analyzer (DMA), hardness testers, Fourier transform infrared spectroscope (FTIR). Information on original...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110563
EISBN: 978-1-62708-247-1
.... , Gallacher B.J. , “ Mode shape and failure analysis of high frequency MEMS/NEMS using Raman Spectroscopy ”, 3rd IEEE Int'l Conf. on Nano/Micro Engineered and Molecular Ssytems , Sanya, China , 2008 , pp. 842 - 46 . 10.1109/NEMS.2008.4484455 [25] Khuri-Yakub B.T. , Percin G...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 30 April 2020
DOI: 10.31399/asm.tb.bpapp.t59290139
EISBN: 978-1-62708-319-5
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110180
EISBN: 978-1-62708-247-1
...: Spectral Aspects of Photon Emission, ” Proc. IEEE/IPFA 2018 , vol. Vol. 25 , 2018 . 10.1109/IPFA.2018.8452506 [14] Kindereit U. , et al. , “ Near-Infrared Photon Emission Spectroscopy of a 45 nm SOI Ring Oscillators, ” Proc. IEEE IRPS 2012 , pp. 2D2.1 – 2D2.7 , 2012 . 10.1109/IRPS...