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infrared spectroscopy

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110434
EISBN: 978-1-62708-247-1
... STEM (with thin samples), wavelength dispersive x-ray spectroscopy (WDS), Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS, also knows as ESCA), secondary ion mass spectrometry (SIMS), Rutherford backscattering spectrometry (RBS), Fourier transform infrared spectroscopy (FTIR...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720139
EISBN: 978-1-62708-305-8
... Abstract The overall chemical composition of metals and alloys is most commonly determined by x-ray fluorescence (XRF) and optical emission spectroscopy (OES). High-temperature combustion and inert gas fusion methods are typically used to analyze dissolved gases (oxygen, nitrogen, and hydrogen...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110010
EISBN: 978-1-62708-247-1
... optical inspection, X-ray inspection, scanning acoustic microscopy, infrared (IR) microscopy, and electrical verification. The article discusses various fault isolation techniques to tackle the wide array of failure signatures, namely IR lock-in thermography, magnetic current imaging, time domain...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2007
DOI: 10.31399/asm.tb.smnm.t52140201
EISBN: 978-1-62708-264-8
... Abstract Temperature is a critical process parameter in the heat treatment and forging of steel and must be accurately measured to properly control it. This appendix discusses the operating principles of thermocouples and infrared pyrometers, describing the various types as well as advantages...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780141
EISBN: 978-1-62708-268-6
... microscopy, and scanning electron microscopy can reveal the presence of contaminants. Any of the materials analysis technologies (energy-dispersive analysis of x-rays, Fourier transform infrared spectroscopy, spectrometry, chromatography, secondary ion mass spectrometry, and Auger) can be used to identify...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780093
EISBN: 978-1-62708-268-6
... not available to the failure analysis team, many commercial laboratories can provide the services. Chemical and materials analysis technologies include energy-dispersive analysis of x-rays, spectrographic techniques (including electron probe microanalysis, Fourier transform infrared spectroscopy, mass...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.9781627082815
EISBN: 978-1-62708-281-5
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780131
EISBN: 978-1-62708-268-6
... transform infrared spectroscopy is a good technology for identifying the presence of such contaminants. The epoxy or adhesive application process can be critical. For example, some manufacturers require wetting both surfaces to be sealed with the epoxy or adhesive and then pushing the two surfaces...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.scm.t52870063
EISBN: 978-1-62708-314-0
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110603
EISBN: 978-1-62708-247-1
... with CTE of an authentic part. A DMA can be used to determine the visco-elastic material properties of an epoxy molding compound which can be compared to similar properties of expected molding compound. FTIR spectroscopy, by means of an infrared spectrum of absorption and emission characteristics of...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110351
EISBN: 978-1-62708-247-1
... columns, most often Ga liquid metal ion sources (LMIS) based, 2) an integrated infrared (IR) camera, mainly to enable through silicon operations 3) a dedicated dual nozzle gas/chemistry delivery system and 4) a high accuracy stage with CAD linkage. Through sample imaging capability is a widely used...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780109
EISBN: 978-1-62708-268-6
... silicone in the area, it is an indication that the bond area was contaminated. The failure analysis team can also use Fourier transform infrared (FTIR) spectroscopy (as outlined in Chapter 11 ) to assess if contaminants were present. FTIR is commonly used for this purpose, and it is particularly well...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110219
EISBN: 978-1-62708-247-1
... the packaging materials until it reaches the device surface. At the surface, this thermal energy forms a hot-spot from which it radiates off as infrared waves that are detected by an IR-sensitive camera. Despite the degradation in lateral resolution owed to lateral spreading of the thermal wave, lock...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2011
DOI: 10.31399/asm.tb.mnm2.9781627082617
EISBN: 978-1-62708-261-7
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.9781627082587
EISBN: 978-1-62708-258-7
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.9781627082600
EISBN: 978-1-62708-260-0