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image acquisition

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110062
EISBN: 978-1-62708-247-1
... of semiconductor packaging structures have prompted X-ray equipment manufacturers to significantly improve the 3D micro-CT imaging capability [11 , 12] . Most X-ray equipment manufacturers now provide 3D models with fully automated data acquisition, reconstruction, and data analysis packages. In a typical 3D...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110244
EISBN: 978-1-62708-247-1
... is used to form the LSM pattern image. The oscilloscope is critical in that it dictates the measurement capabilities of the tool, such as measurement bandwidth and sample rate. Even more importantly, the oscilloscope has a significant impact on acquisition time due to trigger efficiency/dead time...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110219
EISBN: 978-1-62708-247-1
... Example of a complex 3D package: Cross-sectional view of a DRAM memory device with TSV and μ-bump interconnects. Current LIT systems are based on direct thermal imaging techniques in combination with a two-phase, lock-in amplification as illustrated in Figure 2 . In Figure 2 , the investigated...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2012
DOI: 10.31399/asm.tb.smfpa.t53500301
EISBN: 978-1-62708-317-1
... ). They also provide the strain distribution on the parts, thinning, and information for forming limit diagrams ( Ref 15.24 ). All machine vision systems can be considered to be operating in three stages: Image acquisition Image processing and analysis Interpretation Fig. 15.20 Sheet metal...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
... is acquired serially; one pixel at a time. As a result, STEM image acquisition can take several seconds to a few minutes to achieve good signal to noise ratio. Any specimen drift or electro-magnetic (EM) interference can significantly degrade the resolution. To achieve consistent atomic resolution STEM...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110209
EISBN: 978-1-62708-247-1
... in Fig. 5c and Fig. 5d is indicated by a dotted rectangle in Fig. 5b . The measurement was performed at a lock-in frequency of 22 Hz for a few minutes of data acquisition time. The amplitude image in Fig. 5a is indeed strongly affected by the emissivity contrast caused by the metallization pattern...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110228
EISBN: 978-1-62708-247-1
... with the fail flag and loop trigger, Select the laser dwell time, and Select the shmoo bias point Setup Step 1: Create the Test Loop Reducing the Loop Length LADA/SDL requires a short test loop because the acquisition time is directly proportional to the loop length. In a 512x512 image, one...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110499
EISBN: 978-1-62708-247-1
... to provide high speed comparison allowing SDL image acquisition times of a few minutes. Introduction Electrical diagnosis of failures is the first step to a successful physical failure analysis of the failure provoking defects. In this paper, an introduction to the dynamic random access memory (DRAM...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110485
EISBN: 978-1-62708-247-1
... analysis are shown in Figures 6 - 9 . All images were acquired using a conventional silicon probe and using the intermittent-contact acquisition mode. Figure 6 is an intermittent-contact image that shows the structure of a small area of an aluminum-copper bond pad. The grain structure and grain...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110111
EISBN: 978-1-62708-247-1
... for acquisition is identical to that for current imaging explained above, but in this case we will detect RF magnetic fields, which required modifications to the electronics and sensor mode of operation to increase the bandwidth [23] . Unlike in TDR, where the spatial resolution is defined by the pulse...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110025
EISBN: 978-1-62708-247-1
...-ray images for direct comparison and defect analysis [20] . Most X-ray equipment manufacturers now provide 3D models with fully automated data acquisition, reconstruction, and data analysis packages. In a typical 3D imaging sequence, the operator will locate the region of interest (ROI...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110335
EISBN: 978-1-62708-247-1
... to be practical, automation is a necessity for both data collection and post-acquisition data processing. Throughout the data acquisition, fiducials are monitored and used to track the slice milling thickness and imaging position [65] . Periodically, as predefined by the operator, the system carries out focusing...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110067
EISBN: 978-1-62708-247-1
... that are invisible to x-ray radiography [1] . Figure 2 The inspection of IC packages with pulse-echo acoustic microscopy. Use of reflected signals for acquisition of SAM images is commonly referred to as reflection mode or pulse-echo mode imaging. C-mode SAM and “C-scan” automatically infer the use...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.t56090091
EISBN: 978-1-62708-462-8
... used for the past few decades and severely degrades the performance of others. This chapter provides an overview of EFI methods that are still applicable to ICs with BPD networks, including e-beam and atomic force probing, x-ray and magnetic field imaging, and lock-in thermography. It assesses...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.t56090021
EISBN: 978-1-62708-462-8
... acquisition parameters. Figure 14 shows a 160 kV x-ray image comparison of a virtual x-ray cross-section of a phone using the FDK method with 1,600 projections for a 1.5-hour scan vs. DLHRR, which only used 400 projections in a 22-minute scan. As shown, the image quality of the two images is comparable...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.t56090003
EISBN: 978-1-62708-462-8
... the factors that influence signal strength, spatial and timing resolution, and alignment accuracy between signal response images and the physical layout of the IC. crosstalk electrical fault isolation electron beam probing laser assisted device alteration laser probing optical fault isolation...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
... components of an image analysis system are the basic hardware and the image analysis software. The hardware includes a microscope, a high-resolution charge-coupled device (CCD) camera, PC-based image acquisition card (also known as a frame-grabber card), and a computer with a printer. The image...
Series: ASM Technical Books
Publisher: ASM International
Published: 30 April 2024
DOI: 10.31399/asm.tb.phtpp.t59380001
EISBN: 978-1-62708-456-7
... and set-point programmers; and process supervision or data management has been done by strip chart recorders or data loggers. This separation of functions requires communication among the logic controllers, loop controllers, and data-acquisition equipment. Finally, when a supervisory computer...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720233
EISBN: 978-1-62708-305-8
... in a fast dual ported memory. This permits quasi simultaneous access to the data during acquisition. Before the image is stored in the frame buffer and displayed on the monitor, simple preprocessing can be done, such as intensity correction of the x-ray tube by the data of the second detector and correction...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.9781627084628
EISBN: 978-1-62708-462-8