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harmonic distortion analysis

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110067
EISBN: 978-1-62708-247-1
... historical development of SAM for integrated circuit package inspection, SAM theory, and analysis considerations. Case studies are presented to illustrate the practical applications of SAM. Other non-destructive imaging tools are briefly discussed, as well as SAM challenges and methods including spectral...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2015
DOI: 10.31399/asm.tb.cpi2.t55030349
EISBN: 978-1-62708-282-2
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2015
DOI: 10.31399/asm.tb.cpi2.t55030292
EISBN: 978-1-62708-282-2
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2015
DOI: 10.31399/asm.tb.cpi2.t55030247
EISBN: 978-1-62708-282-2
... calcareous deposit forms on cathodically protected steel, the current demand to maintain cathodic protection is reduced considerably. However, poor mass transport under deposits and in crevices promotes localization of attack particularly if deposits are nonuniform. In the final analysis, limiting the mass...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110244
EISBN: 978-1-62708-247-1
... Harmonic Detection on Submicron Technology ”, Proceedings from the International Symposium for Testing and Failure Analysis (ISTFA) , pp. 176 - 180 ( 2012 ) [32] Niu Baohua , et al. , “ Laser Logic State Imaging (LLSI) ”, Proceedings from the 40th International Symposium for Testing and...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110153
EISBN: 978-1-62708-247-1
... interfaces with the same expected surface finish. Removing a significant portion of the die substrate will usually affect the stability of the package. Proper planning of the entire backside analysis strategy is a requirement that is frequently trivialized at the peril of the project, as will be shown in...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110643
EISBN: 978-1-62708-247-1
... time (the time until the output phase is continuously aligned to the input’s new phase). And there are many datasheet specification-based analyses that BIST may be required to perform, ranging from computing harmonic distortion and signal-to-noise ratio, to computing the duty cycle, phase delay, gain...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2015
DOI: 10.31399/asm.tb.piht2.t55050025
EISBN: 978-1-62708-311-9
.... One indication of this may be the number of SCRs used for inversion. As modules increase in power, additional SCR models are paralleled into the circuit. The switching action of solid-state devices can produce “notches” or harmonics back on the supply voltage. The extent of these distortions...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220193
EISBN: 978-1-62708-259-4
.... , Caballero F.G. , Capdevila C. , and Álvarez L.F. , Application of Dilatometric Analysis to the Study of Solid–Solid Phase Transformations in Steels , Mat. Charact. , Vol 48 , 2002 , p 101 – 11 10.1016/S1044-5803(02)00259-0 46. Llewellyn D.T. and Hudd R.C. , Steels...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 September 2011
DOI: 10.31399/asm.tb.cfw.9781627083386
EISBN: 978-1-62708-338-6
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.9781627082600
EISBN: 978-1-62708-260-0