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fluorescence microscopy

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030089
EISBN: 978-1-62708-349-2
... include bright-field illumination, dark-field illumination, polarized-light microscopy, interference and contrast microscopy, and fluorescence microscopy. The chapter also provides a discussion of sample preparation materials such as dyes, etchants, and stains for the analysis of composite materials using...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
... imaging, X-Ray photoelectron spectroscopy, X-ray fluorescence, Auger electron spectroscopy, Raman spectroscopy, oxygen analysis, and nanoindentation. cold-sprayed coatings residual-stress analysis hardness bond adhesion strength microscopy spectroscopy diffraction MATERIALS...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030177
EISBN: 978-1-62708-349-2
...-fluorescence microscopy with a 390 to 440 nm excitation range, each individual phase becomes distinctly colored, as shown in Fig. 10.11 . This technique more accurately defines each phase and shows that each of the phases is a different chemistry. Because more contrast is possible, the morphology can be more...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
...Abstract Abstract This chapter describes some of the most effective tools for investigating boiler tube failures, including scanning electron microscopy, optical emission spectroscopy, atomic absorption spectroscopy, x-ray fluorescence spectroscopy, x-ray diffraction, and x-ray photoelectron...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850267
EISBN: 978-1-62708-260-0
... light and orthochromatic film. Achromats are useful in fluorescence microscopy, since fluorite components in more highly corrected objectives will autofluoresce. Achromats generally have relatively large working distances (distance from front of lens to sample) and are useful in hot-stage microscopy...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030193
EISBN: 978-1-62708-349-2
...,” Polarized Light Microscopy, Olympus Microscopy Resource Center , http://www.olympusmicro.com/primer/techniques/polarized/berekcompensator.html 13. Evans A.G. et al. , Mechanisms of Toughening in Rubber Toughened Polymers , Acta Metall. , Vol 34 ( No. 1 ), 1986 , p 79 – 87 10.1016/0001...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030023
EISBN: 978-1-62708-349-2
...- and dark-field illumination, and epi-fluorescence. The viewing of dyed specimens is discussed in Chapter 5, “Viewing the Specimen Using Reflected-Light Microscopy,” in this book. The molds used for composite materials should provide convenient mounting dimensions and be economical and easy to use...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030159
EISBN: 978-1-62708-349-2
... in composite materials. bright-field illumination composite materials dark-field illumination epi-fluorescence microcrack analysis polarized light microscopy The formation of microcracks in composite materials may arise from static-, dynamic-, impact-, or fatigue-loading situations and also...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780093
EISBN: 978-1-62708-268-6
.... Techniques in this area include visual examination, low-power magnification, optical and scanning electron microscopy, and photography. Dimensional inspection and related approaches for assessing suspected item dimensions and conformance to drawing and specification requirements and determining...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110209
EISBN: 978-1-62708-247-1
... results and a series of examples illustrating the application of this technique are also shown. Brief sections are devoted to the discussion on liquid-crystal imaging and fluorescent microthermal imaging technique for thermal detection. References References [1] Elliott C. T. , Day D...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720139
EISBN: 978-1-62708-305-8
... are emitted as the excited atoms relax. In a sense, they are the complements of the characteristic x-rays that are used for chemical characterization in x-ray fluorescence (XRF), SEM, EPMA, and transmission electron microscopy (TEM). When atoms become excited by electrons being ejected from their inner shells...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780193
EISBN: 978-1-62708-268-6
..., optical microscopy, scanning electron microscopy, along with EDAX, spectrometry, chromatography (depending on material type) Interference Dimensional inspection, tolerance analysis, visual examination, microscopic examination Wear Dimensional inspection, tolerance analysis, visual examination...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030245
EISBN: 978-1-62708-349-2
... be remounted to provide adequate handling of the microscopic sample. Polished cross-sectional mounts can be examined with a variety of microscopy techniques, including polarized light, bright- and dark-field illumination, and epi-fluorescence. The damage characteristics depend on many factors, including...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430325
EISBN: 978-1-62708-253-2
... with a thin adherent magnetite scale that was grayish black in color. Fig. 6.137 Portion of a failed superheater tube showing failure location Wet fluorescent magnetic particle inspection studies indicated hairline cracks emanating from the corner of the rupture contours ( Fig. 6.138a...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110434
EISBN: 978-1-62708-247-1
... spectrometry (SIMS), Rutherford backscattering spectrometry (RBS), Fourier transform infrared spectroscopy (FTIR), and total-reflection x-ray fluorescence (TXRF). Each of these capabilities is given for “ideal” conditions, and optimum sensitivity and lateral resolution may not be achievable at the same time...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.9781627083492
EISBN: 978-1-62708-349-2
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030001
EISBN: 978-1-62708-349-2
... methods, and dispersed-phase toughening. In addition, the chapter provides information on interlayer-toughened composites and honeycomb or foam structure composite materials. It also discusses the processes in optical microscopy of composite materials. dispersed-phase toughening honeycomb structure...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270019
EISBN: 978-1-62708-301-0
..., 0.005 to 10%; accuracy, 2 to 5% X-ray fluorescence analysis: Normally applicable to elements heavier than sodium; accessible range, 0.005 to 10%; accuracy, 2 to 5% Laser probe microanalysis: Applicable to nearly all elements; accessible range, 0.01 to 100%; accuracy, semiquantitative...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270025
EISBN: 978-1-62708-301-0
..., and optical and electron microscopy. It presents a number of images recorded using these methods and explains what they reveal about the mode of fracture and the state of the component prior to failure. fractography microscopic examination macroscopy IN FAILURE ANALYSIS, examination is done...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110603
EISBN: 978-1-62708-247-1
..., OH, February 2010 . [11] EIA/JEDEC, Publication J-STD-035, “Acoustic Microscopy for Nonhermetic Encapsulated Electronic Components”, Arlington, VA, May 1999 . [12] NASA, PEM-INST-001, “Instructions for Plastic Encapsulated Microcircuits (PEM) Selection, Screening, and Qualification...