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Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1989
DOI: 10.31399/asm.tb.dmlahtc.t60490183
EISBN: 978-1-62708-340-9
... for boiler components and assemblies. It demonstrates the use of various methods, including analytical techniques that estimate life expenditure based on operating history, component geometry, and material properties; predictive methods based on the extrapolation of failure statistics; methods that predict...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2006
DOI: 10.31399/asm.tb.fdsm.t69870001
EISBN: 978-1-62708-344-7
...Abstract Abstract This chapter gives a brief overview of the role of fatigue in component failures. It presents examples of fatigue failures along with statistics on the causes and costs of fatigue damage in various industries. It also includes a chapter-by-chapter summary of the content...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.horfi.t51180061
EISBN: 978-1-62708-256-3
... Abstract Abstract Statistics, data analysis, root cause analysis, and problem-solving processes play a key role in failure investigations. This chapter explains how to collect failure investigation data, how to build and maintain a database for company-related failures, and how to use corresponding...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780157
EISBN: 978-1-62708-268-6
...Abstract Abstract Failure analysis can sometimes involve considerations of statistics and probability. This chapter reviews some of the basic types of statistical distributions in order to understand some basic principles in their use. The main focus is on the uses of the normal distribution...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110666
EISBN: 978-1-62708-247-1
... in Probability and Mathematical Statistics ( 1982 ) [8] McPherson J. , Reliability Physics and Engineering – Time-To-Failure Modeling , Springer , ( 2010 ). 10.1007/978-1-4419-6348-2_4 [9] Tobias P. and Trinidade D. , Applied Reliability : Second Edition , Chapman and Hall/CRC...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2012
DOI: 10.31399/asm.tb.ffub.t53610147
EISBN: 978-1-62708-303-4
... Histograms showing fatigue-life distribution for 57 specimens of a 75S-T6 aluminum alloy tested at 207 MPa (30 ksi). Note the influence of a (a) linear or (b) logarithmic plot of cycles to failure N on the shape of the histogram. Source: Ref 9 Fig. 14 Schematic showing the fatigue curve...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2006
DOI: 10.31399/asm.tb.fdsm.t69870375
EISBN: 978-1-62708-344-7
... strain components. It also provides information on mechanical property and fatigue testing, the use of hysteresis energy to analyze fatigue, a procedure for inverting equations to solve for dependent variables, and a method for dealing with the statistical nature of failure. cyclic stress-strain...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1989
DOI: 10.31399/asm.tb.dmlahtc.t60490001
EISBN: 978-1-62708-340-9
... criteria and definitions of component life (<xref ref-type="bibr" rid="t60490001-ref11">Ref 11</xref>) Table 1.4. Failure criteria and definitions of component life ( Ref 11 ) History-based criteria 30 to 40 years have elapsed Statistics of prior failures indicate impending failure...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2000
DOI: 10.31399/asm.tb.aet.t68260233
EISBN: 978-1-62708-336-2
... Fig. 2 Flow diagram for statistical quality test for purity acceptance Fig. 3 Flow diagram of statistical quality control for extrusion die variables Fig. 4 Flow diagram of statistical quality test for extrusion variables Fig. 1 Typical control chart for any...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1995
DOI: 10.31399/asm.tb.sch6.t68200220
EISBN: 978-1-62708-354-6
... with the intended service, the function of the component, and the consequences of component failure. The quality control program involves not only the inspection of the product, but also the process steps which affect the product quality. These process steps are carefully specified, and monitoring...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 September 2005
DOI: 10.31399/asm.tb.gmpm.t51250311
EISBN: 978-1-62708-345-4
..., the chapter describes the test procedures for surface durability (pitting), root strength (bending), and scoring (or scuffing) testing. durability fatigue test gear failure gears mechanical testing residual stress rolling contact fatigue test single-tooth fatigue test single-tooth overload test...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110613
EISBN: 978-1-62708-247-1
.... Parametric timing failures fall into two classes: (1) intrinsic ICs (free of defects), and (2) extrinsic ICs (presence of defects). Intrinsic ICs can fail due to an unfortunate distribution of circuit statistics and/or environmental conditions. An extrinsic IC may have subtle imperfections in vias...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780171
EISBN: 978-1-62708-268-6
.... The error sum of squares represents the total variability of individual values from their respective group means, and it is a reference point for the randomness due to normal statistical variation. The failure analysis team calculates the total sum of squares by finding the difference between each data...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.tb.tt2.t51060001
EISBN: 978-1-62708-355-3
.... The cross-sectional area of the gage section is reduced relative to that of the remainder of the specimen so that deformation and failure will be localized in this region. The gage length is the region over which measurements are made and is centered within the reduced section. The distances between...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110506
EISBN: 978-1-62708-247-1
... are important as well. Yield loss patterns on the wafer may reveal edge affects or other defect clustering issues. Trend charts of classification failure rates by process technology and memory type can be used to set up Statistical Process Control (SPC) charts for quick reaction to process excursions...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110513
EISBN: 978-1-62708-247-1
..., failure statistics and circumstances. Also, a careful evaluation of the circuitry around the failed device; possible missing overvoltage protection, inductance loads, EMI risks and other possible electrical detractors from outside is a mandatory part of such failure anamnesis. Let’s reconsider one...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110634
EISBN: 978-1-62708-247-1
...-free chips across technology generations. Figure 2 Photographs of two defects that behaved as “IDDQ-only” failures. (a) Extra polysilicon that shorted two input to a NOR gate. (b) Gate oxide short on the input of an XOR gate. Abstract Abstract This chapter presents an overview...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780075
EISBN: 978-1-62708-268-6
... to inspection error, calibration error (discussed subsequently), or normal statistical variability if the inspection was performed on a sampling basis. Test data: In addition to dimensional inspections, manufacturers and suppliers often test materials, components, and subassemblies. The failure analysis...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.horfi.t51180127
EISBN: 978-1-62708-256-3
... imposed. It is only when the scrap rate exceeds the company criteria that the reasons for scrap become a failure investigation unto themselves. Statistics on scrap can require that a failure investigation be performed. As a company begins to look at the reasons for scrap, many disturbing questions...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720293
EISBN: 978-1-62708-305-8
... Inspection Typical Equipment Measurement Process Statistical Analysis Control Charts Statistical Summary Report Histograms Other Applications for Computer-Aided Inspection Liquid penetrants will highlight surface defects so that detection is more certain. Liquid penetrant inspection...