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energy-dispersive X-ray spectrometers
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Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720139
EISBN: 978-1-62708-305-8
... Detectors The x-rays emitted from the sample in an XRF spectrometer are detected and analyzed in one of two ways: wavelength dispersive or energy dispersive analysis. In wavelength dispersive instruments, shown in Fig. 4 , the emitted x-ray beam is directed onto one of several crystals that separates...
Abstract
The overall chemical composition of metals and alloys is most commonly determined by x-ray fluorescence (XRF) and optical emission spectroscopy (OES). High-temperature combustion and inert gas fusion methods are typically used to analyze dissolved gases (oxygen, nitrogen, and hydrogen) and, in some cases, carbon and sulfur in metals. This chapter discusses the operating principles of XRF, OES, combustion and inert gas fusion analysis, surface analysis, and scanning auger microprobe analysis. The details of equipment set-up used for chemical composition analysis as well as the capabilities of related techniques of these methods are also covered.
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
..., multielemental, fast, and cost-effective method for elemental analysis of various materials including metals and alloys. There are two main types of XRF instruments available in the market, namely, energy dispersive (EDXRF) and wavelength dispersive types. Energy dispersive spectrometers measure x-ray...
Abstract
This chapter describes some of the most effective tools for investigating boiler tube failures, including scanning electron microscopy, optical emission spectroscopy, atomic absorption spectroscopy, x-ray fluorescence spectroscopy, x-ray diffraction, and x-ray photoelectron spectroscopy. It explains how the tools work and what they reveal. It also covers the topic of image analysis and its application in the measurement of grain size, phase/volume fraction, delta ferrite and retained austenite, inclusion rating, depth of carburization/decarburization, scale thickness, pearlite banding, microhardness, and hardness profiles. The chapter concludes with a brief discussion on the effect of scaling and deposition and how to measure it.
Book Chapter
Book: Systems Failure Analysis
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780093
EISBN: 978-1-62708-268-6
... microanalysis (EPMA) is a materials analysis technique that can be bundled with an SEM. Instead of relying on x-ray energy (as in the EDAX approach), EPMA uses a wavelength-dispersive spectrometer that is approximately an order of magnitude better than EDAX at detecting elemental peaks. That fact...
Abstract
After the fault-tree, a failure-cause identification method has identified potential failure causes and the failure analysis team has prepared a failure mode assessment and assignment (FMA&A). The team knows specifically what to search for when examining components and subassemblies from the failed system. There are numerous techniques and technologies available for examining and analyzing components and subassemblies, which are categorized as follows: optical approaches, dimensional inspection and related approaches, nondestructive test approaches, mechanical and environmental approaches, and chemical and composition analysis for assessing material characteristics. This chapter is a detailed account of the working principle and the steps involved in these techniques and technologies.
Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
... to obtain the x-ray spectrum from that point. Two types of x-ray detectors are used: wavelength-dispersive spectrometers and energy-dispersive spectrometers. Most SEMs are currently being equipped with energy-dispersive detectors. In contrast, the wavelength-dispersive detectors are large and slow. Because...
Abstract
This article covers common techniques for surface characterization, including the modern scanning electron microscopy and methods for the chemical characterization of surfaces by Auger electron spectroscopy, X-ray photoelectron spectroscopy, and time-of-flight secondary ion mass spectrometry. The principles of surface analysis and some of the applications of the technique in polymer failure studies are also provided.
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110434
EISBN: 978-1-62708-247-1
... Abstract This article provides an overview of the most common micro-analytical technique in the failure analysis laboratory: energy dispersive X-ray spectroscopy (EDS). It discusses the general characteristics, advantages, and disadvantages of some of the X-ray detectors attached...
Abstract
This article provides an overview of the most common micro-analytical technique in the failure analysis laboratory: energy dispersive X-ray spectroscopy (EDS). It discusses the general characteristics, advantages, and disadvantages of some of the X-ray detectors attached to the scanning electron microscope chamber including the lithium-drifted EDS detector, silicon drift detector (SDD), and wavelength dispersive X-ray detector. The article then provides information on qualitative and quantitative X-ray analysis programs followed by a discussion on EDS elemental mapping. The discussion includes a comparison of scanning transmission electron microscope-EDS elemental mapping and mapping with an SDD. A brief section is devoted to the discussion on the artifacts that occur during X-ray mapping.
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
... scattered electrons are used to form an image. TEM based elemental analysis techniques utilize X-ray photons in energy dispersive spectroscopy (EDS) [1 - 2] and inelastically scattered electrons or the ‘energy-loss’ electron in electron energy loss spectroscopy (EELS) and Energy-filtered transmission...
Abstract
The ultimate goal of the failure analysis process is to find physical evidence that can identify the root cause of the failure. Transmission electron microscopy (TEM) has emerged as a powerful tool to characterize subtle defects. This article discusses the sample preparation procedures based on focused ion beam milling used for TEM sample preparation. It describes the principles behind commonly used imaging modes in semiconductor failure analysis and how these operation modes can be utilized to selectively maximize signal from specific beam-specimen interactions to generate useful information about the defect. Various elemental analysis techniques, namely energy dispersive spectroscopy, electron energy loss spectroscopy, and energy-filtered TEM, are described using examples encountered in failure analysis. The origin of different image contrast mechanisms, their interpretation, and analytical techniques for composition analysis are discussed. The article also provides information on the use of off-axis electron holography technique in failure analysis.
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
... at levels as low as 100 parts per million (ppm) and to develop lateral distributions by mapping, using both an energy-dispersive x-ray spectrometer and a wavelength-dispersive spectrometer ( Ref 5.1 , 5.2 ). Electron probe microanalysis has been used in cold-sprayed coating characterization mainly...
Abstract
This chapter elucidates the indispensable role of characterization in the development of cold-sprayed coatings and illustrates some of the common processes used during coatings development. Emphasis is placed on the advanced microstructural characterization techniques that are used in high-pressure cold spray coating characterization, including residual-stress characterization. The chapter includes some preliminary screening of tool hardness and bond adhesion strength, as well as a distinction between surface and bulk characterization techniques and their importance for cold spray coatings. The techniques covered are optical microscopy, X-Ray diffraction, scanning electron microscopy, focused ion beam machining, electron probe microanalysis, transmission electron microscopy, and electron backscattered diffraction. The techniques also include electron channeling contrast imaging, X-Ray photoelectron spectroscopy, X-ray fluorescence, Auger electron spectroscopy, Raman spectroscopy, oxygen analysis, and nanoindentation.
Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2012
DOI: 10.31399/asm.tb.pdub.t53420239
EISBN: 978-1-62708-310-2
... of a sample, creating backscattered electrons, secondary electrons, characteristic X-rays, and Auger electrons, among other signals. Scanning electron microscopes are often coupled with energy-dispersive X-ray microanalysis (EDX), a microanalytical technique that uses the characteristic spectrum of X-rays...
Abstract
This chapter discusses some of the methods and measurements used to construct phase diagrams. It explains how cooling curves were widely used to determine phase boundaries, and how equilibrated alloys examined under controlled heating and cooling provide information for constructing isothermal and vertical sections as well as liquid projections. It also explains how diffusion couples provide a window into local equilibria and identifies typical phase diagram construction errors along with problems stemming from phase-boundary curvatures and congruent transformations.
Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780343
EISBN: 978-1-62708-281-5
... of surface species Auger electron spectroscopy (AES) Elemental concentrations Chemical compositions of surfaces Wavelength dispersive x-ray analysis Elements present on polymer surfaces Identification of contaminants on polymer surfaces Problem Solving A typical problem a material...
Abstract
This article introduces procedures an engineer or materials scientist can use to investigate failures. It provides a brief survey of polymer systems and key properties that need to be measured during failure analysis. The article begins with an overview of the problem-solving approach pertinent to structure analysis. This is followed by a review of the characterization of plastics by infrared and nuclear magnetic resonance spectroscopy. The article then provides information on the distribution of molecular weight of an engineering plastic. It further discusses the methods used in thermal analysis, namely differential thermal analysis, thermogravimetric analysis, thermal-mechanical analysis, and dynamic mechanical analysis. The following sections provide details on X-ray diffraction for analyzing crystalline phases and on a minimal scheme for polymer analysis and characterization to assist the design engineer. The article ends with a discussion on the thermal-analytical scheme for analyzing the milligram quantities of polymer samples.
Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 1998
DOI: 10.31399/asm.tb.ts5.t65900045
EISBN: 978-1-62708-358-4
... extraction ( Ref 7 ). Electron microprobes use single-crystal spectrometers set to diffract only the radiation from a given element, a process referred to as wavelength dispersive spectroscopy (WDS) and which is capable of high-precision chemical analysis. Characteristic x-ray intensity from the chemical...
Abstract
This chapter describes the various phases that form in tool steels, starting from the base of the Fe-C system to the effects of the major alloying elements. The emphasis is on the phases themselves: their chemical compositions, crystal structures, and properties. The chapter also provides general considerations of phases and phase diagrams and the determination of equilibrium phase diagrams. It describes the formation of martensite, characteristics of alloy carbides, and the design of tool steels.
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110335
EISBN: 978-1-62708-247-1
... + with a beam energy of 30keV in silicon. For each ion, 30 trajectories are shown in red, while the resulting silicon atom recoils are shown in green. The x-axis radial spread shown for each individual plot is 100nm. All collision data and sputter yield were calculated using TRIM. Plasma FIB The large...
Abstract
With the commercialization of heavier and lighter ion beams, adoption of focused ion beam (FIB) use for analysis of challenging regions of interest (ROI) has grown. In this chapter, the authors focus on highlighting commercially available and complementary FIB technologies and their implementation challenges and application trends.
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.9781627082532
EISBN: 978-1-62708-253-2
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 1997
DOI: 10.31399/asm.tb.wip.t65930039
EISBN: 978-1-62708-359-1
... and microsegregation, and the properties may be governed by the composition in a very local region. A thorough characterization of welds requires techniques with sufficient spatial resolution to characterize their inhomogeneity. Scanning electron microscopy with wavelength or energy dispersive x-ray analysis systems...
Abstract
This article reviews nondestructive and destructive test methods used to characterize welds. The first process of characterization discussed involves information that may be obtained by direct visual inspection and measurement of the weld. An overview of nondestructive evaluation is included that encompasses techniques used to characterize the locations and structure of internal and surface defects, including radiography, ultrasonic testing, and liquid penetrant inspection. The next group of characterization procedures discussed is destructive tests, requiring the removal of specimens from the weld. The third component of weld characterization is the measurement of mechanical and corrosion properties. Following the discussion on the characterization procedures, the second part of this article provides examples of how two particular welds were characterized according to these procedures.
Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.t66910475
EISBN: 978-1-62708-250-1
.... Surface Chemical Analysis A variety of analytical techniques and tools have been developed to provide investigators with information regarding the chemical composition of surface constituents ( Table 1 ). Energy-dispersive and wavelength-dispersive x-ray spectrometers are employed as accessories...
Abstract
This chapter discusses the techniques applicable to the diagnosis of corrosion failures, including visual and microscopic examination of corroded surfaces and microstructure; chemical analysis of the metal, corrosion products, and bulk environment; nondestructive evaluation methods; corrosion testing techniques; and mechanical testing techniques. A guide to investigative techniques used in corrosion failure analysis is provided in a table, describing the advantages and limitations of each technique. The principal stages of the investigation and analysis of corrosion failures discussed in the chapter are: collection of background information and sampling; preliminary laboratory examination; detailed metallographic and fractographic examinations; chemical analysis of corrosion products and bulk materials; corrosion testing for quality control; mechanical testing for quality control; and analysis of results and report writing.
Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400245
EISBN: 978-1-62708-258-7
.... Bragg equation. n 2d sin , where n is the order of re ection, is the wavelength of x-rays, d is the distance between lattice planes, and is the Bragg angle. See also order (in x-ray re ection). Bragg method. A method of x-ray diffraction in which a single crystal is mounted on a spectrometer...
Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2012
DOI: 10.31399/asm.tb.ffub.t53610549
EISBN: 978-1-62708-303-4
... microscopy because of the large depth of field and very high magnifications attainable, typically 5000 to 10,000×. In addition, SEMs are often equipped with microanalytical capabilities, for example, energy-dispersive x-ray spectroscopes. Chemical analysis can be helpful in confirming the chemistry...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.9781627082587
EISBN: 978-1-62708-258-7
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.horfi.t51180151
EISBN: 978-1-62708-256-3
... done with an SEM. An SEM has the advantage over light microscopy because of the large depth of field and very high magnifications attainable, typically 5000 to 10,000×. In addition, SEMs are often equipped with microanalytical capabilities, for example, energy-dispersive x-ray (EDX) spectroscopes...
Abstract
This appendix focuses on procedures, techniques, and precautions associated with the investigation and analysis of metallurgical failures that occur in service. It describes the steps of an orderly failure analysis from collecting and examining samples to performing mechanical and nondestructive tests, preparing and examining fractographs and micrographs, determining failure mode, writing the report, and developing follow-up recommendations. It also examines the fundamental mechanisms of failure, why they occur, and how to identify them by their characteristic features.
Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780359
EISBN: 978-1-62708-281-5
... are not obtained, and, in these cases, the results are complemented by the corresponding derivative curve. Noncombustible material remaining at the conclusion of the TGA evaluation is often associated with inorganic fillers. Such residue is often further analyzed using energy-dispersive x-ray spectroscopy (EDS...
Abstract
This article reviews various analytical techniques most commonly used in plastic component failure analysis. The description of the techniques is intended to make the reader familiar with the general principles and benefits of the methodologies. The descriptions of the analytical techniques are supplemented by a series of case studies that include pertinent visual examination results and the corresponding images that aided in the characterization of the failures. The techniques covered include Fourier transform infrared spectroscopy, differential scanning calorimetry, thermogravimetric analysis, thermomechanical analysis, and dynamic mechanical analysis. The article also discusses various analytical methods used to characterize the molecular weight distribution of a polymeric material. It provides information on a wide range of mechanical tests that are available to evaluate plastics and polymers, covering the various considerations in the selection and use of test methods.
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 1999
DOI: 10.31399/asm.tb.lmcs.9781627082914
EISBN: 978-1-62708-291-4
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