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energy-dispersive X-ray spectrometers

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Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720139
EISBN: 978-1-62708-305-8
... Detectors The x-rays emitted from the sample in an XRF spectrometer are detected and analyzed in one of two ways: wavelength dispersive or energy dispersive analysis. In wavelength dispersive instruments, shown in Fig. 4 , the emitted x-ray beam is directed onto one of several crystals that separates...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
..., multielemental, fast, and cost-effective method for elemental analysis of various materials including metals and alloys. There are two main types of XRF instruments available in the market, namely, energy dispersive (EDXRF) and wavelength dispersive types. Energy dispersive spectrometers measure x-ray...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780093
EISBN: 978-1-62708-268-6
... microanalysis (EPMA) is a materials analysis technique that can be bundled with an SEM. Instead of relying on x-ray energy (as in the EDAX approach), EPMA uses a wavelength-dispersive spectrometer that is approximately an order of magnitude better than EDAX at detecting elemental peaks. That fact...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
... to obtain the x-ray spectrum from that point. Two types of x-ray detectors are used: wavelength-dispersive spectrometers and energy-dispersive spectrometers. Most SEMs are currently being equipped with energy-dispersive detectors. In contrast, the wavelength-dispersive detectors are large and slow. Because...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110434
EISBN: 978-1-62708-247-1
... Abstract This article provides an overview of the most common micro-analytical technique in the failure analysis laboratory: energy dispersive X-ray spectroscopy (EDS). It discusses the general characteristics, advantages, and disadvantages of some of the X-ray detectors attached...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
... scattered electrons are used to form an image. TEM based elemental analysis techniques utilize X-ray photons in energy dispersive spectroscopy (EDS) [1 - 2] and inelastically scattered electrons or the ‘energy-loss’ electron in electron energy loss spectroscopy (EELS) and Energy-filtered transmission...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
... at levels as low as 100 parts per million (ppm) and to develop lateral distributions by mapping, using both an energy-dispersive x-ray spectrometer and a wavelength-dispersive spectrometer ( Ref 5.1 , 5.2 ). Electron probe microanalysis has been used in cold-sprayed coating characterization mainly...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2012
DOI: 10.31399/asm.tb.pdub.t53420239
EISBN: 978-1-62708-310-2
... of a sample, creating backscattered electrons, secondary electrons, characteristic X-rays, and Auger electrons, among other signals. Scanning electron microscopes are often coupled with energy-dispersive X-ray microanalysis (EDX), a microanalytical technique that uses the characteristic spectrum of X-rays...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780343
EISBN: 978-1-62708-281-5
... of surface species Auger electron spectroscopy (AES) Elemental concentrations Chemical compositions of surfaces Wavelength dispersive x-ray analysis Elements present on polymer surfaces Identification of contaminants on polymer surfaces Problem Solving A typical problem a material...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 1998
DOI: 10.31399/asm.tb.ts5.t65900045
EISBN: 978-1-62708-358-4
... extraction ( Ref 7 ). Electron microprobes use single-crystal spectrometers set to diffract only the radiation from a given element, a process referred to as wavelength dispersive spectroscopy (WDS) and which is capable of high-precision chemical analysis. Characteristic x-ray intensity from the chemical...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110335
EISBN: 978-1-62708-247-1
... + with a beam energy of 30keV in silicon. For each ion, 30 trajectories are shown in red, while the resulting silicon atom recoils are shown in green. The x-axis radial spread shown for each individual plot is 100nm. All collision data and sputter yield were calculated using TRIM. Plasma FIB The large...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.9781627082532
EISBN: 978-1-62708-253-2
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 1997
DOI: 10.31399/asm.tb.wip.t65930039
EISBN: 978-1-62708-359-1
... and microsegregation, and the properties may be governed by the composition in a very local region. A thorough characterization of welds requires techniques with sufficient spatial resolution to characterize their inhomogeneity. Scanning electron microscopy with wavelength or energy dispersive x-ray analysis systems...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.t66910475
EISBN: 978-1-62708-250-1
.... Surface Chemical Analysis A variety of analytical techniques and tools have been developed to provide investigators with information regarding the chemical composition of surface constituents ( Table 1 ). Energy-dispersive and wavelength-dispersive x-ray spectrometers are employed as accessories...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400245
EISBN: 978-1-62708-258-7
.... Bragg equation. n 2d sin , where n is the order of re ection, is the wavelength of x-rays, d is the distance between lattice planes, and is the Bragg angle. See also order (in x-ray re ection). Bragg method. A method of x-ray diffraction in which a single crystal is mounted on a spectrometer...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2012
DOI: 10.31399/asm.tb.ffub.t53610549
EISBN: 978-1-62708-303-4
... microscopy because of the large depth of field and very high magnifications attainable, typically 5000 to 10,000×. In addition, SEMs are often equipped with microanalytical capabilities, for example, energy-dispersive x-ray spectroscopes. Chemical analysis can be helpful in confirming the chemistry...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.9781627082587
EISBN: 978-1-62708-258-7
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.horfi.t51180151
EISBN: 978-1-62708-256-3
... done with an SEM. An SEM has the advantage over light microscopy because of the large depth of field and very high magnifications attainable, typically 5000 to 10,000×. In addition, SEMs are often equipped with microanalytical capabilities, for example, energy-dispersive x-ray (EDX) spectroscopes...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780359
EISBN: 978-1-62708-281-5
... are not obtained, and, in these cases, the results are complemented by the corresponding derivative curve. Noncombustible material remaining at the conclusion of the TGA evaluation is often associated with inorganic fillers. Such residue is often further analyzed using energy-dispersive x-ray spectroscopy (EDS...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 1999
DOI: 10.31399/asm.tb.lmcs.9781627082914
EISBN: 978-1-62708-291-4