Cross-sectioning is a technique used for process development and reverse engineering. This article introduces novice analysts to the methods of cross-sectioning semiconductor devices and provides a refresher for the more experienced analysts. Topics covered include encapsulated (potted) device sectioning techniques, non-encapsulated device techniques, utilization of the focused ion beam (FIB) making a cross-section and/or enhancing a physically polished one. Delineation methods for revealing structures are also discussed. These can be chemical etchants, chemo-mechanical polishing, and ion milling, either in the FIB or in a dedicated ion mill.

As semiconductor feature sizes have shrunk, the technology needed to encapsulate modern integrated circuits has expanded. Due to the various industry changes, package failure analyses are becoming much more challenging; a systematic approach is therefore critical. This article proposes a package failure analysis flow for analyzing open and short failures. The flow begins with a review of data on how the device failed and how it was processed. Next, non-destructive techniques are performed to document the condition of the as-received units. The techniques discussed are external optical inspection, X-ray inspection, scanning acoustic microscopy, infrared (IR) microscopy, and electrical verification. The article discusses various fault isolation techniques to tackle the wide array of failure signatures, namely IR lock-in thermography, magnetic current imaging, time domain reflectometry, and electro-optical terahertz pulse reflectometry. The final step is the step-by-step inspection and deprocessing stage that begins once the defect has been imaged.

The orientation of the devices within a package determine the best chosen approach for access to a select component embedded in epoxy both in package or System in Package and multi-chip module (MCM). This article assists the analyst in making decisions on frontside access using flat lapping, chemical decapsulation, laser ablation, plasma reactive ion etching (RIE), CNC based milling and polishing, or a combination of these coupled with optical or electrical endpoint means. This article discusses the general characteristics, advantages, and disadvantages of each of these techniques. It also presents a case study illustrating the application of CNC milling to isolate MCM leakage failure.

The complexity of semiconductor chips and their packages has continuously challenged the known methods to analyze them. With larger laminates and the inclusion of multiple stacked die, methods to analyze modern semiconductor products are being pushed toward their limits to support these 2.5D and 3D packages. This article focuses on these methods of fault isolation, non-destructive imaging, and destructive techniques through an iterative process for failure analysis of complex packages.

Most of the counterfeit parts detected in the electronics industry are either novel or surplus parts or salvaged scrap parts. This article begins by discussing the type of parts used to create counterfeits. It discusses the three most commonly used methods used by counterfeiters to create counterfeits. These include relabeling, refurbishing, and repackaging. The article presents a systematic inspection methodology that can be applied for detecting signs of possible part modifications. The methodology consists of external visual inspection, marking permanency tests, and X-ray inspection followed by material evaluation and characterization. These processes are typically followed by evaluation of the packages to identify defects, degradations, and failure mechanisms that are caused by the processes (e.g., cleaning, solder dipping of leads, reballing) used in creating counterfeit parts.

Solid-state welding processes are those that produce coalescence of the faying surfaces at temperatures below the melting point of the base metals being joined without the addition of brazing or solder filler metal. This chapter discusses solid-state welding processes such as diffusion welding, forge welding, roll welding, coextrusion welding, cold welding, friction welding, friction stir welding, explosion welding, and ultrasonic welding.

Lightning damage in polymer composites, as in metal structures, is manifested by damage at both the macroscopic or visual level and within the material microstructure. In addition to visual damage assessment, non-destructive inspection techniques are employed to detect damage within the composite part. This chapter describes the macroeffects of a lightning strike on composites and discusses the methods involved in the assessment of microstructural damage in composites.

This chapter presents the salts used and the process advantages of salt bath nitriding. It describes bath testing and analysis including the materials and equipment, analysis procedure, and determination of sodium carbonate and sodium cyanate for titration testing of the nitriding salt bath. The chapter explains the procedures for maintenance of the salt bath and related equipment. It also discusses safety precautions and design parameters for furnace equipment.

To ensure the proper application of plastics, one must keep in mind three factors that determine the appropriate end-use: material selection, processing, and design. This article begins by providing information on various factors pertinent to the anticipated use conditions of the article to be designed. This is followed by a discussion on several stages necessary to define the geometry of plastic parts. Details on the strength of and cost estimation for plastic parts are then provided. The article ends with a section providing information on the structure, properties, processing, and end-use applications of plastics.