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Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
... 37.1 61.9 Avg 39.02 59.36 Abstract Abstract This chapter describes some of the most effective tools for investigating boiler tube failures, including scanning electron microscopy, optical emission spectroscopy, atomic absorption spectroscopy, x-ray fluorescence spectroscopy, x...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720139
EISBN: 978-1-62708-305-8
...Abstract Abstract The overall chemical composition of metals and alloys is most commonly determined by x-ray fluorescence (XRF) and optical emission spectroscopy (OES). High-temperature combustion and inert gas fusion methods are typically used to analyze dissolved gases (oxygen, nitrogen...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.t66910475
EISBN: 978-1-62708-250-1
... and to identify compounds in alloys, bulky deposits, and samples of environmental fluids, lubricants, and suspensions. Techniques such as emission spectroscopy, atomic absorption spectroscopy, inductively coupled plasma atomic emission spectroscopy, and classical wet analytical chemistry can be used to determine...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270019
EISBN: 978-1-62708-301-0
... to nearly all elements and organic functional groups; accessible range, 0.001 to 50%; accuracy, 2 to 5% Atomic absorption spectrometry: Applicable to practically all elements; accessible range, 0.001 to 10%; accuracy, 2 to 5% Emission spectroscopy: Applicable to all elements; accessible range...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110563
EISBN: 978-1-62708-247-1
... Sample Preparation: Removing MEMS FIB (Focused Ion Beam) TEM (Transmission Electron Microscopy) LSIM (Laser Signal Injection Microscopy) PEM (Photon Emission Microscopy) 3-D Motion Analysis Raman Spectroscopy Introduction MEMS Process Integration Examples of Common MEMS Devices...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110180
EISBN: 978-1-62708-247-1
.... , “ A review of near infrared photon emission microscopy and spectroscopy, ” IPFA , pp. 275 – 281 , 2005 . [9] “ International Roadmap for Semiconductors ITRS 2013 edition ”. Semiconductor Industry Association (SIA), Austin TX , 2013 . [10] Ippolito S.B. , et al. , “ High Spatial...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110434
EISBN: 978-1-62708-247-1
...Properties of analytical techniques including energy dispersive x-ray spectroscope (EDS) in the SEM or STEM (with thin samples), wavelength dispersive x-ray spectroscopy (WDS), Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS, also knows as ESCA), secondary ion mass...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
..., trace metal analysis Comparison of selected surface analysis techniques Table 5 Comparison of selected surface analysis techniques Technique Probe radiation Analyzed emission Advantages Limitations X-ray photoelectron spectroscopy (XPS or ESCA) X-rays Photoelectrons...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 2009
DOI: 10.31399/asm.tb.bcp.t52230513
EISBN: 978-1-62708-298-3
... and analyzed from the same smear samples. Random and biased surface sampling is conducted by taking 100 cm 2 smears (nominally), and beryllium analysis is commonly performed using inductively coupled plasma/atomic emission spectroscopy (ICP/AES). Air sampling is conducted using personal sampling pumps...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430149
EISBN: 978-1-62708-253-2
... of the tube material by optical emission spectroscopy revealed that it did not meet the requirements of ASTM A213 T2, especially with respect to the amounts of important alloying elements such as chromium and molybdenum. The amount of these two elements in the failed tube sample was found to be less than...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.9781627082532
EISBN: 978-1-62708-253-2
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110447
EISBN: 978-1-62708-247-1
... used in semiconductor industry are: Auger spectroscopy, dynamic secondary ion mass spectroscopy, time of flight static secondary ion mass spectroscopy (ToF-SIMS), X-ray photoelectron spectroscopy, scanning electron microscope-energy dispersive X-ray spectroscopy (SEM-EDX), and transmission electron...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2004
DOI: 10.31399/asm.tb.aacppa.t51140061
EISBN: 978-1-62708-335-5
... records and time-temperature charts should be consulted to confirm that specified practices were observed. The chemical composition of alloys of aluminum is determined by light emission spectroscopy. Quantometers simplify and standardize chemical element concentrations. In some cases, wet chemistry...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2007
DOI: 10.31399/asm.tb.smnm.t52140201
EISBN: 978-1-62708-264-8
... it the heat flux, Q . The wavelengths, λ, of the emerging radiation vary over a wide range. The light can be spread into its wavelength components using spectroscopy techniques, making it is possible to measure R versus λ. Fig. A8 Cavity radiator In a first approach, one would normally just...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 1999
DOI: 10.31399/asm.tb.caaa.t67870063
EISBN: 978-1-62708-299-0
... of the specimen revealed that corrosion did not occur during the 5 days. Emission spectroscopy of the corrosion products showed that small amounts of aluminum (4%), sodium (3%), cobalt (2%), chromium (0.35%), boron (0.25%), and iron (0.05%) were present. The remaining 90% of the material analyzed...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2015
DOI: 10.31399/asm.tb.spsp2.t54410001
EISBN: 978-1-62708-265-5
... the characteristic energy spectra are typically measured by solid state detectors in the process referred to as Energy Dispersive Spectroscopy (EDS). In Electron Probe Microanalyzers the spectra are resolved with better resolution by diffraction of the characteristic Xrays from single crystals in a process referred...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780343
EISBN: 978-1-62708-281-5
... approach pertinent to structure analysis. This is followed by a review of the characterization of plastics by infrared and nuclear magnetic resonance spectroscopy. The article then provides information on the distribution of molecular weight of an engineering plastic. It further discusses the methods used...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720001
EISBN: 978-1-62708-305-8
... determined by x-ray fluorescence (XRF) and optical emission spectroscopy (OES). While these methods work well for most elements, they are not useful for dissolved gases and some nonmetallic elements that can be present in metals as alloying or impurity elements. High temperature combustion and inert gas...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
... imaging, X-Ray photoelectron spectroscopy, X-ray fluorescence, Auger electron spectroscopy, Raman spectroscopy, oxygen analysis, and nanoindentation. cold-sprayed coatings residual-stress analysis hardness bond adhesion strength microscopy spectroscopy diffraction MATERIALS...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2011
DOI: 10.31399/asm.tb.mnm2.9781627082617
EISBN: 978-1-62708-261-7