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electron probe microanalyzers

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Published: 01 March 2002
Fig. 6.24 An electron probe microanalyzer More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400149
EISBN: 978-1-62708-258-7
... equipment. This chapter describes how these instruments can be used to gather important information about a microstructure. The instruments covered include image analyzers, transmission electron microscopes, scanning electron microscopes, electron probe microanalyzers, scanning transmission electron...
Image
Published: 01 March 2002
Fig. 6.27 Preparing a specimen from an AISI/SAE 1335 steel bar for compositional analysis on the electron probe microanalyzer. (a) Vickers microhardness indentations used to mark the location of ferrite banding and (b) the same location with the etch removed by light polishing. 4% picral etch More
Image
Published: 01 August 1999
Fig. 6.14 (Part 2) (g) 0.4% C (0.45C-0.7Si-0.5Mn-1.2Cr, wt%). As cast. 180 HV. Picral. 50×. (h) 0.4% C (0.45C-0.7Si-0.5Mn-1.2Cr, wt%). As cast. 180 HV. Picral. 250×. (i) Electron probe microanalyzer line scans along line A-B in the section shown in the inset. Average composition: 0.20C More
Image
Published: 01 August 1999
. 115 HV. Picral. 250×. (g) 0.4% C (0.45C-0.7Si-0.5Mn-1.2Cr, wt%). As cast. 180 HV. Picral. 50×. (h) 0.4% C (0.45C-0.7Si-0.5Mn-1.2Cr, wt%). As cast. 180 HV. Picral. 250×. (i) Electron probe microanalyzer line scans along line A-B in the section shown in the inset. Average composition: 0.20C-0.32Si More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2015
DOI: 10.31399/asm.tb.spsp2.t54410001
EISBN: 978-1-62708-265-5
... Spectroscopy (EDS). In Electron Probe Microanalyzers the spectra are resolved with better resolution by diffraction of the characteristic Xrays from single crystals in a process referred to as Wavelength Dispersive Spectroscopy (WDS) ( Ref 1.3 ). Auger Electron Spectroscopy The X-ray spectra generated...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
... microscope is extremely useful, however, because when equipped with secondary electron and x-ray detectors, it becomes a SEM, an electron probe microanalyzer, a scanning Auger microscope, and a scanning electron loss microscope. Comparison summary of scanning electron beam instruments equipped...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 1999
DOI: 10.31399/asm.tb.lmcs.t66560125
EISBN: 978-1-62708-291-4
... parallel lamellar arrangement. Fig. 6.6 (Part 1) Pearlite structure in 0.8% C alloy. (a) to (c) 0.81 C-0.08Si-0.65Mn. Austenitized at 860 °C, cooled at 100 °C/h. 240 HV. (a) Picral. 500×. (b) 1% nital. 1000×. (c) Picral. 1000×. (d) Electron micrograph of a shadowed carbon replica...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.t66910475
EISBN: 978-1-62708-250-1
... may be detected by vacuum emission equipment.) Full range of photomultipliers may not be available. C.6 Electron probe microanalysis Analysis by crystal spectrometry or energy dispersion of x-rays emitted as a result of applying a focused (1 μm diam) electron beam to a surface Qualitative...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400215
EISBN: 978-1-62708-258-7
... and graphite flakes/nodules. Etching the specimen will simply complicate the microstructure and introduce potential errors in the analysis. Specimens for the electron probe microanalyzer (microprobe) are usually analyzed in the as-polished condition. This is because etching will remove some of the constituents...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400245
EISBN: 978-1-62708-258-7
... to austenite is completed during heating. Ac4. The temperature at which austenite transforms to delta ferrite during heating. accelerating potential. A relatively high voltage applied between the cathode and anode of an electron gun to accelerate electrons. The source of electrons in the electron microscope...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.9781627082587
EISBN: 978-1-62708-258-7
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400087
EISBN: 978-1-62708-258-7
... in a microstructure. The electron probe microanalyzer (EPMA, or simply “microprobe”) is the ultimate instrument to provide chemical composition. These instruments and others are discussed in detail in Chapter 6 . Fig. 4.5 Microstructure of a fully pearlitic steel rail. 4% picral etch. 1000× Fig. 4.6...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2015
DOI: 10.31399/asm.tb.spsp2.9781627082655
EISBN: 978-1-62708-265-5
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400049
EISBN: 978-1-62708-258-7
... grains is due to the dissolution of small aluminum nitride precipitates that were pinning the grain boundaries (the particles are much too small to be seen in the light microscope and must be examined in the transmission electron microscope). Once the particles dissolved upon heating, the grain...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400109
EISBN: 978-1-62708-258-7
... light microscopes or light optical microscopes. If a beam of electrons is employed, the microscope would be called an electron microscope, and if a beam of ions is employed, it is called an ion microscope. Electron microscopes are valuable tools for the metallographer and are discussed in the next...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400169
EISBN: 978-1-62708-258-7
.... This is an “artifact” that could result in a misleading compositional analysis conducted using a scanning electron microscope (SEM) or an electron probe microanalyzer (EPMA) (microprobe) where silicon and carbon will be detected. Although steels do not contain silicon carbide particles, most steels and cast irons...