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electron microscopes

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400149
EISBN: 978-1-62708-258-7
...Abstract Abstract Several specialized instruments are available for the metallographer to use as tools to gather key information on the characteristics of the microstructure being analyzed. These include microscopes that use electrons as a source of illumination instead of light and x-ray...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220085
EISBN: 978-1-62708-259-4
... and compositional data as well. It discusses the basic design and operating principles of scanning electron microscopes, transmission electron microscopes, and scanning transmission electron microscopes and how they are typically used. It describes the additional information contained in backscattered electrons...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110323
EISBN: 978-1-62708-247-1
... identification, and circuit editing. The article also presents methods to prepare electron beam probing samples where some remaining silicon is required for the transistor functions and transmission electron microscope samples from units where the substrate silicon has been partially or completely removed...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110434
EISBN: 978-1-62708-247-1
... to the scanning electron microscope chamber including the lithium-drifted EDS detector, silicon drift detector (SDD), and wavelength dispersive X-ray detector. The article then provides information on qualitative and quantitative X-ray analysis programs followed by a discussion on EDS elemental mapping...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110447
EISBN: 978-1-62708-247-1
.... The main six methods used in semiconductor industry are: Auger spectroscopy, dynamic secondary ion mass spectroscopy, time of flight static secondary ion mass spectroscopy (ToF-SIMS), X-ray photoelectron spectroscopy, scanning electron microscope-energy dispersive X-ray spectroscopy (SEM-EDX...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110413
EISBN: 978-1-62708-247-1
...Abstract Abstract This article provides an overview of how to use the scanning electron microscope (SEM) for imaging integrated circuits. The discussion covers the principles of operation and practical techniques of the SEM. The techniques include sample mounting, sample preparation, sputter...
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.t56000020
EISBN: 978-1-62708-292-1
...Abstract Abstract This chapter discusses the setup and use of a transmission electron detector in a typical scanning electron microscope (SEM). It describes the arrangement and function of the primary components in the detector, following the signal path from the sample to a micromirror array...
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.t56000001
EISBN: 978-1-62708-292-1
...Abstract Abstract This chapter discusses the principles of scanning transmission electron microscopy (STEM) as implemented using conventional scanning electron microscopes (SEMs). It describes the pros and cons of low-energy imaging and diffraction, addresses basic hardware requirements...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270100
EISBN: 978-1-62708-301-0
... that opens and closes the doors to the undercarriage compartment. The failed component was removed from the aircraft and examined using optical and electron microscopes. Under low magnification, the fracture surface appeared jagged except for one corner that was relatively smooth. SEM fractography revealed...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270122
EISBN: 978-1-62708-301-0
... electron microscopes, was flat and shiny with deformation marks and dimples, typical of torsional overload, and signs of severe rubbing on the periphery. Based on their observations, investigators concluded that the quill shaft failed by torsional overload, the source of which could not be determined...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270172
EISBN: 978-1-62708-301-0
...Abstract Abstract During a routine preflight inspection of a piston aircraft engine, part of a cooling fin was found that had broken off the cylinder. The piece, made of aluminum-silicon alloy, was cleaned and examined. Based on the fracture characteristics revealed by an electron microscope...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270185
EISBN: 978-1-62708-301-0
... optical and electron microscopes, indicating that the operating loads on the bolts far exceeded the design loads. Based on their observations, which are summarized in the report, failure analysts concluded that the design of the connecting rod system needs to be reassessed. connecting rod bolts SEM...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780276
EISBN: 978-1-62708-281-5
... Fig. 23 Scanning electron microscope micrographs of worn surfaces of PA 66 hybrid composites. AF, aramid fiber; CF, carbon fiber; N, normal; P, parallel. (a) Hybrid (layer) composite, AF(N)/CF(P). (b) Hybrid (sandwich) composite, AF(N)/CF(P), stopping crack responsible for less wear. (c) AF(N)/CF(P...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110285
EISBN: 978-1-62708-247-1
..., namely four probe transistor characterization, two probe transistor characterization, and probing and characterizing metallization issues. The imaging techniques discussed are those that are specific to atomic force nanoprober or scanning electron microscope based tools. They are current contrast imaging...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2007
DOI: 10.31399/asm.tb.smnm.t52140021
EISBN: 978-1-62708-264-8
... the various phases. The chapter concludes with a brief review of spheroidized microstructures. electron microscopes grain structure heat treatment microstructure optical microscopes steel THE OPTICAL MICROSCOPE is the principal tool used to characterize the internal grain structure of steels...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2015
DOI: 10.31399/asm.tb.spsp2.t54410001
EISBN: 978-1-62708-265-5
... to be resolved in the light microscope, for example, fine precipitates and crystal defects, and for the characterization of such features, electron microscopy must be used. In view of the fact that light microscopy was the only technique initially available, finer features now resolvable are often referred...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
... optimized Minimum area Comments Surface pictures Microchemical analysis Scanning electron microscope Surface pictures: above ~500× on polished and etched samples; at all magnifications on high depth-of-field surfaces; accuracy and sensitivity of microchemical analysis 4–5 nm (conventional...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
... Microscope , Plenum Press , 1996 . 10.1007/978-1-4757-5099-7 4. Disko M. M. , Ahn C. C. , and Fultz B. , Transmission Electron Energy Loss Spectrometry, TMS , 1992 . 5. Brydson R. , Electron Energy Loss Spectroscopy , Taylor & Francis , 2001 . 6. Monsegue...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 30 November 2013
DOI: 10.31399/asm.tb.uhcf3.t53630101
EISBN: 978-1-62708-270-9
... with a light microscope and those that can be examined only with an electron microscope at magnifications not attainable by a light microscope. Figure 5 shows the behavior that occurs within a typical ductile metal immediately prior to fracture due to a tensile force. Detailed study of these three...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270025
EISBN: 978-1-62708-301-0
..., and optical and electron microscopy. It presents a number of images recorded using these methods and explains what they reveal about the mode of fracture and the state of the component prior to failure. fractography microscopic examination macroscopy IN FAILURE ANALYSIS, examination is done...