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electron microprobe analysis

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220085
EISBN: 978-1-62708-259-4
... Abstract This chapter discusses the use of electron microscopy in metallographic analysis. It explains how electrons interact with metals and how these interactions can be harnessed to produce two- and three-dimensional images of metal surfaces and generate crystallographic and compositional...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720139
EISBN: 978-1-62708-305-8
... detail, and the operation and capabilities of several other surface analysis methods will be more briefly described in comparison to it. The scanning Auger microprobe is basically a scanning electron microscope (SEM) with two additional features: An Auger electron detector replaces an x-ray...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110447
EISBN: 978-1-62708-247-1
... semiconductor industry surface analysis time of flight static secondary ion mass spectroscopy transmission electron microscope-EDX X-ray photoelectron spectroscopy Some physical FA techniques with the focus on material characterization have been described. The purpose is to establish the manufacturing...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110285
EISBN: 978-1-62708-247-1
.... editor, copyright 2011 ASM international . [11] Dickson K. , et al. , “ Electron Beam Absorbed Current as a Means of Locating Metal Defectivity on 45nm SOI Technology ,” Proc 36th International Symposium for Testing and Failure Analysis , Addison, Texas, USA , November 2010 , pp. 413...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2012
DOI: 10.31399/asm.tb.ffub.t53610549
EISBN: 978-1-62708-303-4
.../or cleaning of specimens (and comparison with parts that have not failed) Macroscopic examination and analysis and photographic documentation (fracture surfaces, secondary cracks, and other surface phenomena) Microscopic examination and analysis (electron microscopy may be necessary...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.horfi.t51180151
EISBN: 978-1-62708-256-3
... analysis of surface areas as small as 1 μm in diameter, the electron-microprobe analyzer is widely used. This instrument can determine the concentration of all but the low atomic number elements, with a limit of detection below 0.1%. The area examined with the secondary ion mass spectrometer (SIMS...
Series: ASM Technical Books
Publisher: ASM International
Published: 30 November 2013
DOI: 10.31399/asm.tb.uhcf3.t53630001
EISBN: 978-1-62708-270-9
... Analysis—How to Choose the Right Tool , Scanning Electron Microsc. , Vol 1 , SEM Inc. , 1979 • Brooks C.R. and Choudhury A. , Metallurgical Failure Analysis , McGraw Hill , 1993 • Case Histories in Failure Analysis , American Society for Metals , 1979 • Colangelo...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2017
DOI: 10.31399/asm.tb.sccmpe2.t55090419
EISBN: 978-1-62708-266-2
... used for microanalysis, using an electron microprobe or a scanning electron microscope (SEM) with an energy-dispersive x-ray analysis system (EDS) or other suitable analytical equipment. After stripping, the fracture surface should be ultrasonically cleaned in acetone. Additional information on...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400149
EISBN: 978-1-62708-258-7
... similar to those found on a SEM. Wavelength dispersive spectroscopy is much more time-consuming than EDS and is thus used for a more accurate and detailed analysis. Fig. 6.24 An electron probe microanalyzer The microprobe can also generate images of the backscattered and secondary electrons...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 2009
DOI: 10.31399/asm.tb.bcp.t52230253
EISBN: 978-1-62708-298-3
... vacuum induction melting, vacuum arc melting, and electron beam melting, and some of the ways they have been used to cast beryllium alloys. The chapter also includes information on metal purification and grain refinement procedures. beryllium casting grain refinement ingots melting...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720001
EISBN: 978-1-62708-305-8
... workpieces, thus dramatically increasing product quality. Machine vision is also used as an in-process gaging tool for controlling the process and correcting trends that could lead to the production of defective parts. The automotive and electronics industries make heavy use of machine vision for automated...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110042
EISBN: 978-1-62708-247-1
... focused with lenses, i.e., the visible light spectrum, plus the infrared and ultraviolet. We will not address non-photonic microscopy, e.g., electron microscopes, focused ion beams, ultrasonic or atomic force microscopes, none of which use photonic light for image formation. All light propagates through...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110652
EISBN: 978-1-62708-247-1
... absence of discoloration together with the need to de-process and to use high magnification (including the Scanning Electron Microscope) to locate the failure site indicates a type of ESD failure. May and Guravage [9] have also shown that the region of apparent discoloration which surrounds the...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2015
DOI: 10.31399/asm.tb.spsp2.t54410163
EISBN: 978-1-62708-265-5
... microprobe analyzers with wavelength dispersive spectroscopy (WDS) and scanning electron microscopes capable of energy dispersive spectroscopy (EDS). These instruments excite characteristic X-rays from the various component elements in inclusions to establish chemical composition ( Ref 9.20 ) and are used to...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2015
DOI: 10.31399/asm.tb.spsp2.t54410621
EISBN: 978-1-62708-265-5
...-ray diffraction and chemical analysis of extracted carbide residues, electron microprobe analysis, and scanning transmission electron microscopy. Another approach to characterizing the phases in tool steels is based on computing techniques that use thermodynamic functions to predict both carbide and...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2011
DOI: 10.31399/asm.tb.jub.t53290137
EISBN: 978-1-62708-306-5
... fluids. The microstructure of the metals at the bond zone shows clearly that the metals did not melt but flowed plastically during the process. Electron microprobe analysis across such plastically deformed areas shows that no diffusion occurs because of extremely rapid self-quenching of the metals...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2007
DOI: 10.31399/asm.tb.htcma.t52080379
EISBN: 978-1-62708-304-1
...; Properties of High Temperature Alloys: Applications of Analytical Electron Microscopy , King Fahd University of Petroleum & Minerals , Dhahran, Saudi Arabia , 1993 , p 144 14. Tawancy H.M. , Structure & Properties of High Temperature Alloys: Applications of Analytical Electron...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2012
DOI: 10.31399/asm.tb.lmub.t53550193
EISBN: 978-1-62708-307-2
... material for conducting waste heat away from active solid-state electronic components, particularly in aerospace applications. Table 4.1 Selected physical properties of beryllium Property Amount Elastic modulus, GPa (10 6 psi) 303 (44) Density, g/cm 3 (lb/in. 3 ) 1.8477 (0.067...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2000
DOI: 10.31399/asm.tb.ttg2.t61120065
EISBN: 978-1-62708-269-3
... banding. Electron microprobe analysis determined that the bands resulted from vanadium and aluminum segregation. The effect of macrosegregation on subsequent beta-phase decomposition during cooling depends on the extent of residual segregation at the transformation temperature and on the local alloy...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850060
EISBN: 978-1-62708-260-0
..., most mounts are round with diameters of 1, 1¼, or 1½ in. Mount height is usually ½ to ¾ in. These standard sizes are accommodated by automatic grinding and polishing machines and generally fit within the specimen chambers of the scanning electron microscope (SEM) or microprobe. Samples larger than this...