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electrical-resistance probe

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110485
EISBN: 978-1-62708-247-1
... scanning microwave impedance microscopy scanning probe microscope scanning spreading resistance microscopy scanning surface photo voltage microscopy In 1986 the Atomic Force Microscope (AFM) was invented by Gerd Binnig, Christoph Gerber, and Calvin Quate [1] . Since then, numerous analytical...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110323
EISBN: 978-1-62708-247-1
... detectable using two point EBAC. Figure 17 A TEM image of a defect identified using four terminal probing resistance measurements. Electron Beam Induced Resistance Change (EBIRCH) images are produced by applying a voltage across two probe tips landed on structures connected by an electrically...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110285
EISBN: 978-1-62708-247-1
... the transistor contact. For bulk semiconductor transistors, the first probe placed down is the probe tip for the Well contact. When the probe tip to the Well contact is placed down and electrical conductivity is achieved, a resistive short through the substrate to the grounded stage is visible in the...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2006
DOI: 10.31399/asm.tb.pht2.t51440085
EISBN: 978-1-62708-262-4
... oxygen or dew point monitoring devices are also often used for applications such as bell furnace annealing. The oxygen probe is an in situ type device; that is, it directly samples the atmosphere being measured. The electrical signal generated by an oxygen probe is directly proportional to the carbon...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
... coatings. The techniques covered are optical microscopy, X-Ray diffraction, scanning electron microscopy, focused ion beam machining, electron probe microanalysis, transmission electron microscopy, and electron backscattered diffraction. The techniques also include electron channeling contrast imaging, X...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110219
EISBN: 978-1-62708-247-1
... defined as the shift downwards relative to the surface of the sample. Electrical contact for stimulation of the thermal source was obtained through needle probing. Upon electrical stimulation, the thermal source radiated a signal which was then imaged by classical LIT. For recording a defocus series, the...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 2000
DOI: 10.31399/asm.tb.fec.9781627083027
EISBN: 978-1-62708-302-7
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720321
EISBN: 978-1-62708-305-8
... the automatic gain control function to provide electric compensation against distance variation. Fig. 9 Schematic of a rotating probe type eddy current flaw detector. Source: Ref 2 The relation between flaw depth and signal output is shown in Fig. 10 . Natural flaws produce a larger...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2001
DOI: 10.31399/asm.tb.aub.t61170596
EISBN: 978-1-62708-297-6
... approach 400 HV. Applications include potentiometers, brushes, make-break contacts, spring arms, and probes for integrated and printed circuits. Pd-38Ag-16Cu-1Pt-1Zn is another age-hardenable alloy. It is more economical than Pd-30Ag-14Cu-10Au-10Pt-1Zn because it does not have gold and has less...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110351
EISBN: 978-1-62708-247-1
... state or modify the circuit timing. The 10-12-micron deposition lengths appear to be outliers in the data trend, but upon further examination, these two peaks labeled Probe Points indicate the number and resulting usefulness of direct electrical probing of signals independent of technology nodes. The...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.t66910427
EISBN: 978-1-62708-250-1
... resistance method with two or three electrode probes Suitable for most engineering alloys, if process fluid is of suitable conductivity. Portable instruments at modest cost to more expensive automatic units are available. Frequent Electrical resistance Integrated metal loss is measured by the...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110196
EISBN: 978-1-62708-247-1
... other chapters in this Desk Reference. Passive laser-based methods using reflected light variations through photo-electric interactions as well as passive light emission techniques are also explored in detail in their respective chapters. Active photon probing takes advantage of the interactions of...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720345
EISBN: 978-1-62708-305-8
... differential systems and are most sensitive to flaws that involve a marked change in normal electrical characteristics. If the flaw is of considerable length and of uniform characteristics, it is sometimes necessary to use special arrangements for its detection. Small probe coils continuously compare the weld...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 1999
DOI: 10.31399/asm.tb.caaa.t67870191
EISBN: 978-1-62708-299-0
... of low-solubility oxide, phosphate, or chromate compounds produced by the reaction of suitable reagents with the metallic surface. These coatings affect the appearance, electrochemical potential, electrical resistivity, surface hardness, absorption, and other surface properties of the material. They...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110269
EISBN: 978-1-62708-247-1
... Fig. 13 definite voltages can be applied to definite structures. Fig. 13 4-probe nanoprober, mounted on a stage of a Dualbeam FIB. With an external voltage applied to such a chain as shown in Fig. 14 there are sufficient charges in the left part of the chain and at the faulty contact...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2015
DOI: 10.31399/asm.tb.cpi2.t55030005
EISBN: 978-1-62708-282-2
... techniques, such as electrochemical polarization curves and polarization resistance, electrochemical impedance spectroscopy, thin-film electrical resistance probe, galvanic current measurement, scanning electron microscopy and energy-dispersive spectroscopy surface analysis, Mössbauer spectroscopy and x-ray...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2015
DOI: 10.31399/asm.tb.cpi2.t55030209
EISBN: 978-1-62708-282-2
... Cyclic potentiodynamic polarization Use of electrical resistance probes Use of linear polarization resistance Use of galvanic currents Electrochemical impedance spectroscopy Use of electrochemical noise measurement Indirect methods include: pH Conductivity Temperature...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110132
EISBN: 978-1-62708-247-1
... umbilical cord. The transceiver box converts the high-speed optical pulse into an electrical impulse signal which is then injected into a test structure of the DUT through a high-speed probe. The electrical signal will be reflected back and be sampled by the transceiver itself to form a reflection waveform...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110111
EISBN: 978-1-62708-247-1
... definition, the passing of current. DC and low frequency signals, normally used in electrical probing of integrated circuits (IC), carry no net current through the defective trace because of the open boundary, and thus, a different technique needs to be used to localize them. If the probing signal is brought...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2015
DOI: 10.31399/asm.tb.cpi2.t55030184
EISBN: 978-1-62708-282-2
... cathode surface. In these circumstances, a Tafel extrapolation ( E log i ) technique is commonly used ( Fig. 10 ) ( Ref 14 ). Other criteria such as a net current flow onto a structure and the use of test probes are also used, although they are no longer included in recent versions of NACE RP0169...