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electrical resistance technique

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110010
EISBN: 978-1-62708-247-1
... requestor. Figure 5 Curve trace confirms the resistive short between bumps A2 and A3. Unless an analyst has collected an image of a defect that will cause the electrical failure signature, fault isolation is recommended. While there are several fault isolation techniques to tackle the wide...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110111
EISBN: 978-1-62708-247-1
... analysis for some present and most future applications, techniques are needed that are not obstructed by these complications. To some extent this can be accomplished in electrical test through scan architectures once adopted. However, diagnosis of defects using such methods is limited to one logical node...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2011
DOI: 10.31399/asm.tb.jub.t53290061
EISBN: 978-1-62708-306-5
... Abstract Resistance welding is a group of processes in which the heat for welding is generated by the resistance to the flow of an electrical current through the parts being joined. This chapter discusses the processes, advantages, and limitations of specific resistance welding processes...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780164
EISBN: 978-1-62708-281-5
... Materials 8. “ Test Methods for D-C Resistance or Conductance of Insulating Materials, ” D 257, Annual Book of ASTM Standards , American Society for Testing and Materials 9. “ Test Method for High-Voltage, Low-Current, Dry Arc Resistance of Solid Electrical Insulation, ” D 495, Annual Book of...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2001
DOI: 10.31399/asm.tb.secwr.t68350001
EISBN: 978-1-62708-315-7
.../or sulfidation resistance Improved wear resistance Reduced frictional energy losses Improved mechanical properties, for example, enhanced fatigue or toughness Improved electronic or electrical properties Improved thermal insulation Improved aesthetic appearance As indicated in...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780211
EISBN: 978-1-62708-281-5
... J -Δ a data pairs can be collected from one specimen. Crack growth is usually determined by an elastic compliance method or by an electrical resistance method. In the elastic compliance method, the specimen is unloaded periodically during the test. At each unloading point, Δ a is calculated as a...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2015
DOI: 10.31399/asm.tb.cpi2.t55030169
EISBN: 978-1-62708-282-2
... rolling extrusion quenching aging annealing THIS ARTICLE addresses the general effects of composition, mechanical treatment, surface treatment, and processing on the corrosion resistance of aluminum and aluminum alloys. Most of the techniques used to alter the properties of aluminum are intended...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2001
DOI: 10.31399/asm.tb.secwr.9781627083157
EISBN: 978-1-62708-315-7
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110499
EISBN: 978-1-62708-247-1
... Abstract This article provides an introduction to the dynamic random access memory (DRAM) operation with a focus to localization techniques of the defects combined with some physical failure analysis examples and case studies for memory array failures. It discusses the electrical measurement...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2008
DOI: 10.31399/asm.tb.emea.t52240547
EISBN: 978-1-62708-251-8
... alloys include electrical-resistance alloys, low-expansion alloys, magnetically soft alloys, and shape memory alloys. This chapter discusses the metallurgy, nominal composition, properties, applications, advantages, and disadvantages of these alloys. It also provides information on cobalt wear-resistant...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110323
EISBN: 978-1-62708-247-1
... techniques are E-beam Logic State Imaging, Electron-beam Signal Image Mapping, and E-beam Device Perturbation. Backside nano-probing techniques discussed include: Electron Beam Absorbed Current, Electron Beam Induced Resistance Change, four terminal resistance measurements, resistive gate defect...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110132
EISBN: 978-1-62708-247-1
... limitations of these techniques (TDR, EOTPR, and combo TDR/TDT) are summarized and compared. electrical connectors electro optical terahertz pulse reflectometry fault isolation semiconductor packages telegraph lines time domain reflectometry time domain transmissometry twisted cables...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720345
EISBN: 978-1-62708-305-8
... Abstract Wrought tubular products are nondestructively inspected chiefly by eddy current techniques (including the magnetic flux leakage technique) and by ultrasonic techniques. The methods discussed in this chapter include eddy current inspection, flux leakage inspection, ultrasonic inspection...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110144
EISBN: 978-1-62708-247-1
... lapping, chemical decapsulation, laser ablation, plasma reactive ion etching (RIE), CNC based milling and polishing, or a combination of these coupled with optical or electrical endpoint means. This article discusses the general characteristics, advantages, and disadvantages of each of these techniques...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110180
EISBN: 978-1-62708-247-1
... Abstract Photon emission (PE) is one of the major optical techniques for contactless isolation of functional faults in integrated circuits (ICs) in full electrical operation. This article describes the fundamental mechanisms of PE in silicon based ICs. It presents the opportunities of...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.t66910475
EISBN: 978-1-62708-250-1
... austenitic steel weldments provides information of limited value compared with a metallographic examination). (Ferrography requires specialized equipment.) B.2 Electrical resistance Application of known DC or high-frequency AC current and measurement of resulting potential(s) or of relative change of...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2008
DOI: 10.31399/asm.tb.emea.t52240487
EISBN: 978-1-62708-251-8
... Abstract Aluminum has many outstanding properties, leading it to be used for a wide range of applications. It offers excellent strength-to-weight ratio, good corrosion and oxidation resistance, high electrical and thermal conductivity, exceptional formability, and relatively low cost. This...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110285
EISBN: 978-1-62708-247-1
... easily show leakage (current conduction) through structures that should not be conducting current; and show resistive opens through structures that should be conducting current. This technique has a high level of sensitivity for showing electrical conduction differences in structures down to the low pA...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110485
EISBN: 978-1-62708-247-1
... Capacitance Microscopy, Scanning Spreading Resistance Microscopy, Conductive-AFM, Magnetic Force Microscopy, Scanning Surface Photo Voltage Microscopy, and Scanning Microwave Impedance Microscopy. An overview of each SPM technique is given along with examples of how each is used in the development of novel...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110379
EISBN: 978-1-62708-247-1
... consisting of aluminum alloys have been widely used in microchips since the invention of IC by Robert Noyce at Fairchild Semiconductor in 1959 [20] . These alloys allow for low electrical resistance and lower cost. Aluminum and its alloy properties also allow for excellent adhesion to dielectrics, good...