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dislocations
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Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850712
EISBN: 978-1-62708-260-0
... Abstract This appendix is a list of etchants that are used to reveal dislocations in various metals, alloys, and compounds. dislocation etching etchants metals Metallography Principles and Practice George F. Vander Voort, p 712-731 DOI: 10.31399/asm.tb.mpp.t67850712 Copyright © 1999...
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in Scanning Probe Microscopy for Nanoscale Semiconductor Device Analysis
> Microelectronics Failure Analysis: Desk Reference
Published: 01 November 2019
Figure 9 AFM image of slip lines (dislocations) at the silicon surface of a fabricated device. The green arrows point to the slip lines.
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Published: 01 January 2015
Fig. 12.33 Deformation twins and dislocations in an Fe-0.007 wt% C- 28 wt% Mn-3 wt% Al-3 wt% Si TWIP steel deformed to 20% strain. Thin foil transmission electron micrograph. Courtesy of Dean Pierce, Colorado School of Mines
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Published: 01 January 2015
Fig. 12.34 Stacking faults bounded by partial dislocations in austenite of an Fe-0.005 wt% C-25 wt% Mn-3 wt% Al-3 wt% Si TWIP steel deformed to 1.5% strain. Thin foil transmission electron micrograph. Courtesy of James Wittig, Vanderbilt University
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Published: 01 August 2013
Fig. 2.27 Grain boundaries act as barriers to slip by dislocations. Source: Ref 2.1
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Published: 01 December 2006
Fig. 4.33 Interaction of parallel dislocations of different signs. (a) Cancellation. (b) Formation of a vacancy
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Published: 01 December 2006
Fig. 4.39 Interaction of dislocations and particles [ Ber 83 ]. (a) Intersection of “soft” particles. (b) Bypassing of “hard particles”
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Published: 01 March 2012
Fig. A.37 Combination screw and line dislocations. Source: Ref A.1
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Published: 01 March 2012
Fig. A.42 Displacements caused by line and screw dislocations. Source: Ref A.1
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Published: 01 March 2006
Fig. 10.10 Moiré method used to observe dislocations in crystal lattice by electron microscopy. (a) Parallel case. (b) Rotation case. Source: Ref 10.13
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Published: 01 March 2006
Fig. 10.11 Observation of dislocations by decoration. Source: Ref 10.14
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Published: 01 March 2006
Fig. 10.13 Observation of dislocations in silicon by x-ray diffraction. Source: Ref 10.16
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Published: 01 March 2006
Fig. 10.16 Sketch of dislocations coalescing to form a crack nucleus. Source: Ref 10.10
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Published: 01 March 2006
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Published: 01 March 2006
Fig. 10.19 Edge dislocations of opposite sign (shown by ┴ shaped symbol) moving along glide planes to condense and increase size of nucleus ( N ). Source: Ref 10.6
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Published: 01 March 2006
Fig. A.17 Multiplication of dislocations by the Frank-Read source. Source: Ref A.22
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Published: 01 March 2006
Fig. A.18 A complex jungle of dislocations observed in silicon by x-ray diffraction. Source: Ref A.31
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Published: 01 March 2006
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in Crystal Structure Defects and Imperfections
> Crystalline Imperfections: Key Topics in Materials Science and Engineering
Published: 01 October 2021
Fig. 8 A grain boundary modeled as an array of edge dislocations
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