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diffractometers

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Published: 01 June 2008
Fig. C.7 Schematic of x-ray diffractometer. Source: Ref 2 More
Image
Published: 01 December 2018
Fig. 5.26 (a) Schematic diagram of a diffractometer system and (b) typical x-ray diffraction pattern More
Image
Published: 01 March 2012
Fig. A.27 Schematic of x-ray diffractometer. Source: Ref A.4 as published in Ref A.1 More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400149
EISBN: 978-1-62708-258-7
... microscopes, x-ray diffractometers, microhardness testers, and hot microhardness testers. A list of other instruments that are usually located in a research laboratory or specialized testing laboratory is also provided. electron probe microanalyzers image analyzers metallographic laboratory...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2008
DOI: 10.31399/asm.tb.emea.t52240631
EISBN: 978-1-62708-251-8
... strip that allows the diffraction angles to be measured. The distance d hkl between the reflecting atomic planes is then calculated using Bragg’s law. In addition to the photographic methods, there are diffractometer methods that measure the intensity of the beam in counts per second diffracted...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2008
DOI: 10.31399/asm.tb.emea.9781627082518
EISBN: 978-1-62708-251-8
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430343
EISBN: 978-1-62708-253-2
... Amount by wt.% Oxygen 15.79 Aluminum 0.76 Silicon 0.75 Chromium 1.38 Iron 79.13 Nickel 0.19 For the purpose of phase identification, the scale sample was subjected to x-ray diffraction (XRD) analysis using a powder x-ray diffractometer, and the results of analysis...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2012
DOI: 10.31399/asm.tb.pdub.t53420363
EISBN: 978-1-62708-310-2
... produces a cone of radiation. Different reflection cones are recorded on a film strip that allows the diffraction angles to be measured. The distance d hkl between the reflecting atomic planes is then calculated using Bragg’s law. In addition to the photographic methods, there are diffractometer...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400087
EISBN: 978-1-62708-258-7
... departments with up to 100 or so employees. To support a staff of this size, a typical metallographic laboratory employs one to three full-time metallographers, not including supporting personnel who operate the specialized instruments, such as a SEM, EMPA, or x-ray diffractometer. In this example...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780343
EISBN: 978-1-62708-281-5
... camera or diffractometer is used when the diffraction angle can be varied and the resulting diffraction intensity measured (counts per second). The x-ray diagram of unoriented PE at 100 and 120 °C (212 and 250 °F) is cited in Fig. 35 ( Ref 33 ). The three-dimensional crystalline order of PE can be seen...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.9781627082532
EISBN: 978-1-62708-253-2