1-20 of 447 Search Results for

design defects

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270005
EISBN: 978-1-62708-301-0
... Abstract This chapter identifies the primary causes of service failures and discusses the types of defects from which they stem. It presents more than a dozen examples of failures attributed to such causes as design defects, material defects, and manufacturing or processing defects as well...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430351
EISBN: 978-1-62708-253-2
... defects, forming and welding defects, design defects, improper cleaning methods, and ineffective maintenance. It also includes case studies and illustrations. boiler tubes chemical cleaning design defects forming defects material defects quality control welding defects The main...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780147
EISBN: 978-1-62708-268-6
... reach is that it missed something in its analysis or that the design is defective. This chapter focuses on the latter possibility by discussing the various factors that a failure analysis team should consider to identify the causes of defects in system design. These include requirements identification...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2012
DOI: 10.31399/asm.tb.ffub.t53610001
EISBN: 978-1-62708-303-4
... fracture and explains how they reshaped design philosophies, procedures, and tools. It also discusses the influence of material and manufacturing defects, operating conditions, stress concentration and intensity, temperature and pressure, and cyclic loading, all of which play a role in the onset of fatigue...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2012
DOI: 10.31399/asm.tb.ffub.t53610585
EISBN: 978-1-62708-303-4
... Abstract This appendix provides detailed information on design deficiencies, material and manufacturing defects, and service-life anomalies. It covers ingot-related defects, forging and sheet forming imperfections, casting defects, heat treating defects, and weld discontinuities. It shows how...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2012
DOI: 10.31399/asm.tb.smfpa.t53500211
EISBN: 978-1-62708-317-1
.... It explains how to determine strip width and bending sequences and identifies the cause of common roll-forming defects. It also discusses the selection of roll materials and explains how software helps simplify the design of roll forming lines. forming equipment roll forming IN ITS GENERAL FORM...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 September 2008
DOI: 10.31399/asm.tb.fahtsc.t51130503
EISBN: 978-1-62708-284-6
... analysis of steel welds may be divided into three categories. They include failures due to design deficiencies, weld-related defects usually found during inspection, and failures in field service. This chapter emphasizes the failures due to various discontinuities in the steel weldment. These include poor...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2015
DOI: 10.31399/asm.tb.spsp2.t54410001
EISBN: 978-1-62708-265-5
... This chapter provides perspective on the physical dimensions associated with the microstructure of steel and the instruments that reveal grain size, morphology, phase distributions, crystal defects, and chemical composition, from which properties and behaviors derive. The chapter also reviews...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2015
DOI: 10.31399/asm.tb.spsp2.t54410579
EISBN: 978-1-62708-265-5
... is that stainless steels cannot be hardened by heat treatment. As a result, they are highly sensitive to processing-induced defects and the formation of detrimental phases. The chapter explains how alloy design, phase equilibria, microstructure, and thermomechanical processing can be concurrently optimized...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.stg2.t61280149
EISBN: 978-1-62708-267-9
... agitation, downhill welding, and undercutting can lead to slag entrapment. These conditions can usually be prevented by good weld practice and proper weld design. Cracks and fissures are another set of defects that affect properties. These defects have been covered previously in discussions of hot...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2000
DOI: 10.31399/asm.tb.aet.t68260149
EISBN: 978-1-62708-336-2
... Abstract This chapter discusses the extrusion characteristics of relatively soft aluminum alloys. It begins by identifying alloy designations within the class and the types of extrusions made from them. It then explains how extruded shapes and cross-sections are defined and how to analyze...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430147
EISBN: 978-1-62708-253-2
... material Forming and welding defects Design defects Failures related to cleaning and maintenance Each one of these failure mechanisms is discussed in the following sections of this chapter along with relevant case studies. ...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270003
EISBN: 978-1-62708-301-0
... of one type or another introduced mostly inadvertently during the various stages of the manufacture of a component and its usage. These defects could get introduced during the design of a component, its manufacture, assembly, inspection, and maintenance. Manufacture of a component involves materials...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110262
EISBN: 978-1-62708-247-1
... the rapidly growing trend of design-for-test (DFT) scan based designs, defects within scan chains have become increasingly common in ICs [3] . An established technique for isolating failures along ATPG scan chains is Laser Voltage Imaging (LVI), also known as Frequency Mapping, along with CADNav applications...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110524
EISBN: 978-1-62708-247-1
... are either scribed and broken or diced with a wafer saw. Great care must be taken to not induce damage at the chip edge in many designs, since such damage can subsequently result in defects that will later grow to cause problems. A common chip size is 250 x 350 µm – visible by the unaided eye, but only...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2011
DOI: 10.31399/asm.tb.mnm2.t53060385
EISBN: 978-1-62708-261-7
..., called the Comet, mysteriously broke into pieces while in level flight. The cause was eventually identified as a design defect; the sharp corners around the windows produced high stress concentrations that initiated small cracks, leading to these sudden and catastrophic fractures. In 1988, the upper...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110101
EISBN: 978-1-62708-247-1
... that fail manufacturing test. Traditionally, scan diagnosis tools relied on the stuck-at fault model and could diagnose down to a logic net in the design. Although this approach is useful for localization, it has some limitations. Stuck-at patterns typically detect a vast variety of defect types, including...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110634
EISBN: 978-1-62708-247-1
... - 178 . [30] Koenemann B. et al. , “ Delay Test: The Next Frontier for LSSD Test Systems, ” Int. Test Conf. , Sept. 1992 , pp. 578 - 587 . 10.1109/TEST.1992.527878 [31] Bula O. et al. , “ Gross Delay Defect Evaluation for a CMOS Logic Design System Product, ” IBM J. Res...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110132
EISBN: 978-1-62708-247-1
...-based FI method. When the measurement to the defect location is based on these recognizable features, effect of unit-to-unit variation and signal velocity variation on measurement accuracy can be minimized [9] . Figure 4 Key design elements of flip-chip package: these design elements...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110666
EISBN: 978-1-62708-247-1
... to specification immediately following manufacture (designated time-zero or T 0 ), where reliability is an equivalent measure at any time later in the product (or component) lifetime. One example of the relationship between these two relates to defects. Quality ( T 0 ) defects are those that have escaped...