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Image
Published: 01 June 1983
Figure 8.13 Schematic plot of fatigue crack growth rate data trends, illustrating the sigmoidal curve of da / dN vs. Δ K .
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Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2015
DOI: 10.31399/asm.tb.cpi2.t55030360
EISBN: 978-1-62708-282-2
... collection and management, namely data acquisition, reporting, trending, reviewing, and auditing. Capabilities and limitations of in-service inspection techniques are discussed in the Appendix to this chapter. inspection techniques petroleum industries petrochemical industries data collection data...
Abstract
This chapter concentrates almost exclusively on inspection techniques related to pressure vessels and pipework. The discussion covers the general aspects associated with inspection and the key factors relevant to it. In addition, the chapter addresses processes involved in data collection and management, namely data acquisition, reporting, trending, reviewing, and auditing. Capabilities and limitations of in-service inspection techniques are discussed in the Appendix to this chapter.
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110634
EISBN: 978-1-62708-247-1
...] . Improved coverage can also be achieved by combining N-detect pattern generation with physically adjacent areas [49] . Another ermerging trend is the use of statistical methods to optimized the testing process [21] - [24] , [50] - [52] . For example, parametric data can be collected during wafer test...
Abstract
This chapter presents an overview of microprocessor and application specific integrated circuit (IC) testing. It begins with a description of key industry trends that will impact how ICs will be tested in the future. Next, it provides a brief description of the most common tests applied in the IC industry, where technical issues that are causing methodology changes are emphasized. These include functional testing, structural testing, scan-based delay testing, built-in self-testing, memory testing, analog circuit testing, system-on-a-chip testing, and reliability testing. Trends discussed have driven the development of novel focus areas in test and the chapter discusses several of those areas, including test data volume containment, test power containment, and novel methods of defect-based test.
Image
in Irradiation-Assisted Stress-Corrosion Cracking[1]
> Stress-Corrosion Cracking: Materials Performance and Evaluation
Published: 01 January 2017
under unirradiated conditions for type 304 stainless steel in 288 °C (550 °F) water. With the exception of the BWR measurements, all data were obtained in controlled-radiation on/off experiments ( Ref 1 ). Curves in (b) show the trends in the proton-irradiated data, where the effects of radiation
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Image
Published: 01 December 1984
Figure 6-23 Inclusion volume fraction measurements of nine samples with varying sulfur contents using image analysis with 16×, 32×, and 80 × objectives. The trend line shown was plotted by using the least-squares method to fit all the data points. (From Vander Voort, Ref. 61, courtesy
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Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 1983
DOI: 10.31399/asm.tb.mlt.t62860269
EISBN: 978-1-62708-348-5
..., a stress analysis of the structure, and experimental data relating crack growth and fracture to fracture mechanics parameters. In this chapter, the concepts of fracture mechanics and their application to materials evaluation and the design of cryogenic structures are reviewed. Emphasis is placed...
Abstract
This chapter reviews the concepts of fracture mechanics and their application to materials evaluation and the design of cryogenic structures. Emphasis is placed on an explanation of technology, a review of fracture mechanics testing methods, and a discussion on the many factors contributing to the fracture behavior of materials at cryogenic temperatures. Three approaches of elastic-plastic fracture mechanics are covered, namely the crack opening displacement, the J-integral, and the R-curve methods. The chapter also discusses the influence of thermal and metallurgical effects on toughness at low temperatures.
Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2006
DOI: 10.31399/asm.tb.pht2.t51440243
EISBN: 978-1-62708-262-4
... of automatic collection and use of process information in a SPC/SQC format has become mandatory. Data acquisition and documentation a few years ago meant a chart recorder for temperature and a log sheet for the operator’s dew point readings. Today, it more than likely means a computer system tied into key...
Abstract
A successful heat treating operation is determined by the ability to satisfy the customer's quality requirements consistently and economically. This chapter reviews the steps that are important to produce quality parts in heat treating with a brief practical explanation of each. The steps include selecting proper material and design of the part being treated; determining whether the process is capable of heat treatment; using statistical process control, control charting, and in-process inspection and testing; and applying statistical quality control and final testing (sampling) to verify the results.
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110062
EISBN: 978-1-62708-247-1
... samples’ position and view multiple angles to make real-time observations. Some manufacturers have also provided integration to CAD design data to allow live overlay on 3D X-ray images for direct comparison and defect analysis [10] . During the past decade, the increasing complexity and 3D nature...
Abstract
X-ray imaging systems have long played a critical role in failure analysis laboratories. This article begins by listing several favorable traits that make X-rays uniquely well suited for non-destructive evaluation and testing. It then provides information on X-ray equipment and X-ray microscopy and its application in failure analysis of integrated circuit (IC) packaging and IC boards. The final section is devoted to the discussion on nanoscale 3D X-ray microscopy and its applications.
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110506
EISBN: 978-1-62708-247-1
... Comprehensive report generation – wafer maps with thumbnail bitmap images, trend charts, pareto charts Integration with business practices – seamless interaction with manufacturing operations, file formats and data structures Data sharing - import data from, or export data to other yield analysis tools...
Abstract
Semiconductor memories are superb drivers for process yield and reliability improvement because of their highly structured architecture and use of aggressive layout rules. This combination provides outstanding failure signature analysis possibilities for the entire design, manufacturing, and test process. This article discusses five key disciplines of the signature analysis process that need to be orchestrated within the organization: design for test practices, test floor data collection methodology, post-test data analysis tools, root cause theorization, and physical failure analysis strategies.
Series: ASM Technical Books
Publisher: ASM International
Published: 01 February 2005
DOI: 10.31399/asm.tb.chffa.t51040185
EISBN: 978-1-62708-300-3
... finite-element analysis that requires a rather sophisticated software package, elaborate input data preparation, and considerable computer time. Therefore, it is often desirable to use a simple method for making quick estimates by using the so called “slab method” of analysis. This method takes...
Abstract
This chapter presents a relatively simple method for estimating forging loads and flow stresses. The method uses the slab analysis technique and accounts for material properties, friction and heat transfer, press ram speed, forging geometry, and billet and die temperatures. The chapter demonstrates the use of the method and compares the results with measured values.
Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 1988
DOI: 10.31399/asm.tb.eihdca.t65220315
EISBN: 978-1-62708-341-6
... used during these periods. The effects of utilization level on energy costs for several means of heating prior to forging are illustrated in Fig. 12.2 . In this plot, data are given for a typical motor-generator induction system as well as for a direct-resistance heating method. Not shown is the trend...
Abstract
Induction heating is a rapid, efficient technique for producing localized or through heating in a wide range of industries. The economics as well as the technical feasibility of induction heating should be important considerations prior to investing in such a system. A number of cost elements enter into the analysis. These include equipment and energy costs, production lot size and ease of automation, material savings, labor costs, and maintenance requirements. This chapter discusses each of these factors. It compares the cost elements of induction heating with those of its main competitor, gas-fired furnace heating. Several typical examples are provided to illustrate the economic considerations in design and application of induction heating processes.
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.t56090131
EISBN: 978-1-62708-462-8
.... Comprehensive data is now available due to the massive expansion of semiconductor content and a corresponding affinity for data collection across the world. With more data available for appraisal and analysis, the semiconductor industry is front and center utilizing artificial intelligence (AI), machine...
Abstract
This chapter assesses the potential impact of neural networks on package-level failure analysis, the challenges presented by next-generation semiconductor packages, and the measures that can be taken to maximize FA equipment uptime and throughput. It presents examples showing how neural networks have been trained to detect and classify PCB defects, improve signal-to-noise ratios in SEM images, recognize wafer failure patterns, and predict failure modes. It explains how new packaging strategies, particularly stacking and disintegration, complicate fault isolation and evaluates the ability of various imaging methods to locate defects in die stacks. It also presents best practices for sample preparation, inspection, and navigation and offers suggestions for improving the reliability and service life of tools.
Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.horfi.t51180061
EISBN: 978-1-62708-256-3
... investigation data and maintaining a database are rarely given a high priority by management. This mindset needs to change. Collecting the Data First, start within your own company and create a database of failures. Organize the database for particular needs and trends. The database will indicate which...
Abstract
Statistics, data analysis, root cause analysis, and problem-solving processes play a key role in failure investigations. This chapter explains how to collect failure investigation data, how to build and maintain a database for company-related failures, and how to use corresponding statistics including type of failure, material, and root cause. It describes the purpose and benefits of conducting a root cause analysis and the factors, namely relative failure importance and company value, that determine when an investigation should be performed. The chapter also discusses the four-step problem-solving process as it applies to failure investigation, how to assemble an investigation team, and the details of organization and planning. It concludes with a case history of the Firestone 500 steel-belted tire failure, stressing the importance of a systematic approach to failure investigations.
Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1989
DOI: 10.31399/asm.tb.dmlahtc.t60490415
EISBN: 978-1-62708-340-9
... of this property is an essential part of any life-assessment strategy. Future trends in turbine usage also dictate the need for improved life-assessment techniques. There is an increasing trend toward use of combustion turbines in cogeneration and combined-cycle plants operating in base-load or intermediate...
Abstract
Combustion turbines consist of a compressor, a combustor, and a turbine. As commonly configured, the compressor and turbine mount on a single shaft that connects directly to a generator. This chapter reviews the materials of construction, damage mechanisms, and life-assessment techniques for nozzles and buckets. It also presents key information from a detailed review of the literature and the results of a survey on combustion-turbine material problems.
Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720049
EISBN: 978-1-62708-305-8
... machine geometric measurement specialized surface measurement THE COORDINATE MEASURING MACHINE (CMM) is used for three-dimensional inspection of both in-process and finished parts. Historically, CMMs have been largely used to measure and collect dimensional inspection data used to make acceptance...
Abstract
The coordinate measuring machine (CMM) is used for three-dimensional inspection of both in-process and finished parts. This chapter provides a detailed account of the operating principles, measurement techniques, capabilities, and applications of CMMs. The types of CMMs are described. Vertical CMMs include cantilever-type, bridge-type, and gantry CMMs; horizontal CMMs, such as the horizontal-arm type, are also covered. The CMM application for geometric measurement, contour measurement, and specialized surface measurement are discussed.
Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1995
DOI: 10.31399/asm.tb.sch6.t68200274
EISBN: 978-1-62708-354-6
... the strength at temperature as a fraction of that at room temperature. An example of actual tensile strength data and the resulting strength ratio trend curve is shown in Figure 20-15 . Strength ratio trend curves of this type have proven useful in setting allowable stresses under the ASME code...
Abstract
This chapter describes the definitions, designation, chemical composition, room-temperature properties, elevated-temperature properties, and corrosion resistance of cast high alloy steels and stainless steels. In addition, the corrosion resistance of cast corrosion-resistant alloys is also covered.
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110025
EISBN: 978-1-62708-247-1
... acoustic microscopy time-domain-reflectometry X-ray microscopy Following ongoing trends of miniaturization and increased functionality, printed circuit boards (PCB) have to cope with increased solder joint densities, smaller feature sizes and an adaption to a larger variety of semiconductor package...
Abstract
In embedded systems, the separation between system level, board level, and individual component level failure analysis is slowly disappearing. In order to localize the initial defect area, prepare the sample for root cause analysis, and image the exact root cause, the overall functionality has to be maintained during the process. This leads to the requirement of adding additional techniques that help isolate and image defects that are buried deeply within the board structure. This article demonstrates an approach of advanced board level failure analysis by using several non-destructive localization techniques. The techniques considered for advanced fault isolation are magnetic current imaging for shorts and opens; infrared thermography for electrical shorts; time-domain-reflectometry for shorts and opens; scanning acoustic microscopy; and 2D/3D X-Ray microscopy. The individual methods and their operational principles are introduced along with case studies that will show the value of using them on board level defect analysis.
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110351
EISBN: 978-1-62708-247-1
... transistor and tying the original driving transistor output to either Vss or Vdd to permanently enable (freeze) the logic state or modify the circuit timing. The 10-12-micron deposition lengths appear to be outliers in the data trend, but upon further examination, these two peaks labeled Probe Points...
Abstract
Circuit edit has been instrumental to the development of focused ion beam (FIB) systems. FIB tools for advanced circuit edit play a major role in the validation of design and manufacture. This chapter begins with an overview of value, role, and unique capabilities of FIB circuit edit tools for first silicon debug. The etching capabilities of circuit edit FIB tools are then discussed, providing information on chemistry assisted etching in silicon oxides and low-k dielectrics. The chapter also discusses the requirements and procedures involved in edit operation: high aspect ratio milling, endpointing, and cutting copper. It then provides an introduction to FIB metal/conductor deposition and FIB dielectric deposition. Edit design rules that can facilitate prototype production from first silicon are also provided. The chapter concludes with a discussion on future trends in circuit edit technology.
Book Chapter
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2007
DOI: 10.31399/asm.tb.smnm.t52140099
EISBN: 978-1-62708-264-8
... and tempering operation changes the stress-strain characteristics of the steel. The tempering operation sacrifices the high strength of the steel to gain improvements in ductility and toughness. Figure 10.3 presents actual data for an oil-quenched 4340 steel that has been tempered at increasing temperatures...
Abstract
Most quenched steels are tempered because the toughness of as-quenched steels is generally very poor. The tempering operation sacrifices strength for improvements in ductility and toughness. This chapter discusses the tempering process, the challenge of tempered martensite embrittlement, and the effect of wt% carbon on toughness. It also explains how alloying elements improve the hardenability and tempering response of plain carbon steels.
Series: ASM Technical Books
Publisher: ASM International
Published: 30 September 2024
DOI: 10.31399/asm.tb.pmamfa.t59400367
EISBN: 978-1-62708-479-6
... market share ( Ref 16.2 ). The research presents the forecast for the development trend and future status of the PM market in different regions. The Asia-Pacific and European regions are currently main shareholders and are predicted to remain so in the future for powder market capacity. Particularly, due...
Abstract
This chapter discusses the economic importance of powder metallurgy in various countries, the types of jobs created, and the role of powder metallurgy associations around the world.
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