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contrast microscopy

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030089
EISBN: 978-1-62708-349-2
...Abstract Abstract The analysis of composite materials using optical microscopy is a process that can be made easy and efficient with only a few contrast methods and preparation techniques. This chapter is intended to provide information that will help an investigator select the appropriate...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030115
EISBN: 978-1-62708-349-2
... microscopy contrast methods are shown throughout. fiber-reinforced polymeric composites grinding mounting polishing thin-section preparation transmitted-light microscopy The technique that is used to prepare fiber-reinforced composite specimens for optical analysis dictates the information...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
... spray coatings. The techniques covered are optical microscopy, X-Ray diffraction, scanning electron microscopy, focused ion beam machining, electron probe microanalysis, transmission electron microscopy, and electron backscattered diffraction. The techniques also include electron channeling contrast...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
...-Thickness Contrast Phase Contrast Scanning Transmission Electron Microscopy (STEM) Applications of STEM STEM Challenges STEM in an SEM Diffraction Pattern Zone-Axis Imaging Thickness of a TEM Sample Planar (or Plan View) vs. Cross-Section TEM Sample Preparation Procedures...
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.t56000001
EISBN: 978-1-62708-292-1
...Abstract Abstract This chapter discusses the principles of scanning transmission electron microscopy (STEM) as implemented using conventional scanning electron microscopes (SEMs). It describes the pros and cons of low-energy imaging and diffraction, addresses basic hardware requirements...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030023
EISBN: 978-1-62708-349-2
... is dissolved in 7 mL of methanol. To achieve the desired contrast, more or less of the dye may be necessary, depending on the microscopist and the capability of the microscope used. The polished cross-sectional mounts can be examined with a variety of microscopy techniques, including polarized light, bright...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850267
EISBN: 978-1-62708-260-0
... illumination techniques is imperative with materials exhibiting low contrast or with optically anisotropic materials, especially those that are difficult to etch. Light microscopy has numerous applications. The most important application is the determination of the structural phases present...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720161
EISBN: 978-1-62708-305-8
...Abstract Abstract This chapter describes the methods and equipment applicable to metallographic studies and discusses the preparation of specimens for examination by light optical microscopy. Five major operations for preparation of metallographic specimens are discussed: sectioning, mounting...
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.9781627082921
EISBN: 978-1-62708-292-1
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030211
EISBN: 978-1-62708-349-2
... and artifacts in the sample. In contrast, proper thin-section development through grinding and polishing alleviates these phenomena when performed correctly. The details of this preparation technique were described in Chapter 6, “Thin-Section Preparation and Transmitted-Light Microscopy,” in this book...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030177
EISBN: 978-1-62708-349-2
..., ultrathin sections were developed from the composite materials to use transmitted-light optical microscopy contrast techniques to determine the phases. Figure 10.1 shows a cross section of a carbon-fiber-reinforced composite that has a very small dispersed-rubber phase in the matrix. The phase size...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.9781627083492
EISBN: 978-1-62708-349-2
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030001
EISBN: 978-1-62708-349-2
... section showing the microstructure of spruce wood. Transmitted-light phase contrast, 40× objective Optical microscopy is a valuable tool in materials investigations related to problem solving, failure analysis, advanced materials development, and quality control. Microscopy has been used for many...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110067
EISBN: 978-1-62708-247-1
... surface mount devices . [41] Plikat B. , “ Contrast Inversions in Scanning Acoustic Microscopy (C-SAM) of Glue Die Attach ,” in INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS , 2000 : ASM International ; 1998 , pp. 293 - 302 . [42] Canumalla S. , “ A broadband model...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030193
EISBN: 978-1-62708-349-2
...,” Polarized Light Microscopy, Olympus Microscopy Resource Center , http://www.olympusmicro.com/primer/techniques/polarized/berekcompensator.html 13. Evans A.G. et al. , Mechanisms of Toughening in Rubber Toughened Polymers , Acta Metall. , Vol 34 ( No. 1 ), 1986 , p 79 – 87 10.1016/0001...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110042
EISBN: 978-1-62708-247-1
... shorter wavelengths for best resolution. The manufacturers of thermal infrared microscopes balance these requirements and the overwhelming vast majority of fielded instruments operate between 2 to 4 microns wavelength. By contrast, recombination photons detected in emission microscopy are limited to 1.6...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220069
EISBN: 978-1-62708-259-4
...Abstract Abstract This chapter explains how to prepare material samples for optical microscopy, the most common method for characterizing the microstructure of cast iron and steel. It provides information on sectioning, mounting, polishing, etching, and recording. It describes the nature...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030223
EISBN: 978-1-62708-349-2
... of the contrast techniques of transmitted-light microscopy. Figure 13.1 shows an area of a honeycomb-cored sandwich structure composite cross section that is viewed using transmitted polarized light. The 3k-70 plain weave carbon fibers are visible as a black mass or short angled rods, and the epoxy resin...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.9781627082600
EISBN: 978-1-62708-260-0
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030159
EISBN: 978-1-62708-349-2
... of composite materials, namely bright-field analysis, polarized-light analysis, contrast dyes analysis, and dark-field analysis. The analysis of microcracked composites using epi-fluorescence is also covered. In addition, the chapter describes the procedures for the determination and recording of microcracks...