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contrast enhancement

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030115
EISBN: 978-1-62708-349-2
... several contrast-enhancement methods that are not commonly used in metallurgical reflective microscopy. These methods include: Bright field Polarized light Phase contrast Differential interference contrast (DIC), also known as Nomarski Modulation contrast, also known as Hoffman...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030089
EISBN: 978-1-62708-349-2
... material phases are often used to enhance the contrast. While these methods can be effectively used for many composite materials and matrices, significant time may be required to determine a functional dye or etchant material, and it is possible that a useful dye or etchant may not be found. Before...
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.9781627082921
EISBN: 978-1-62708-292-1
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
... contrast TEM image from a thick sample. (b) Zero-loss high-resolution phase contrast TEM image recorded using 10 eV energy window. Significant contrast enhancement noted in zero-loss image is a result of excluding background noise because of inelastically scattered electrons. Figure 33 (a) Energy...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110413
EISBN: 978-1-62708-247-1
...Comparison of SEM and Optical Microscopy. Table 1 Comparison of SEM and Optical Microscopy. Technique SEM Optical Microscope Resolution Few nm λ/2 ~ 250 nm Depth of field Large (up to mm) Very shallow (~λ) at high magnification Contrast Material composition, topography...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110209
EISBN: 978-1-62708-247-1
...) SEM image of a cross section through the defect site. Fig. 7 (a) Optical image, (b) and (c) fixed phase lock-in thermal images of an IC with a permanently applied supply voltage and a triggered control input. (c) is a contrast-enhanced presentation of (b) Fig. 8 (a) Optical image...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850165
EISBN: 978-1-62708-260-0
..., such as aluminum, are usually examined under polarized light to reveal grain contrast. Tint-etched samples and heat-tinted samples can be examined with bright-field illumination, although polarized light often enhances the color contrast. There are also a number of chemical etchants which render the surface...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030177
EISBN: 978-1-62708-349-2
...-fiber-reinforced composite under analysis, the complex, multiphase resin system was completely evaluated using only reflected-light techniques. The reflected-light optical microscopy techniques that were used to enhance the contrast and show the morphology include the sample as polished, chemically...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030223
EISBN: 978-1-62708-349-2
... of the contrast techniques of transmitted-light microscopy. Figure 13.1 shows an area of a honeycomb-cored sandwich structure composite cross section that is viewed using transmitted polarized light. The 3k-70 plain weave carbon fibers are visible as a black mass or short angled rods, and the epoxy resin...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400215
EISBN: 978-1-62708-258-7
... solution using a stainless steel cathode at 8 V. Enhanced by differential interference contrast illumination (also called Nomarski illumination). 500× Fig. 8.46 Annealed AISI/SAE 316 austenitic stainless steel showing grain boundaries but the absence of twins. Ideal for grain size measurements...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030159
EISBN: 978-1-62708-349-2
... contrast. The most common types of composite materials where microcracks can be enhanced by the use of dyes are those composites having translucent or transparent fibers (such as glass, polyamide, polypropylene, and polyethylene). Figures 9.6 through 9.9 show a variety of microcracked composite cross...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850267
EISBN: 978-1-62708-260-0
... on the nature of the problem, the expertise of the investigator, and the available equipment. Microscopy methods for enhancing contrast include the following Dark-field illumination Polarized light Phase contrast Interference methods Filters 4-2 Basic Concepts in Light Optical Theory...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720233
EISBN: 978-1-62708-305-8
... by structure visibility, resolution, variable radiographic magnification, and optical distortions Excellent; affected by resolution, enhanced by low contrast detectability Source: (a) General characteristics of real-time radiography with fluorescent screen-TV camera system or an image intensifier...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 1999
DOI: 10.31399/asm.tb.lmcs.t66560453
EISBN: 978-1-62708-291-4
.... Identifies the phases present in the compound layer on carbonitrided low-carbon steels. Immerse at room temperature. Identifies locations of solidification grain boundaries of austenite in ferritic weld metal. Enhances contrast between ferrite grains. Produces good distinction between lightly...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110335
EISBN: 978-1-62708-247-1
... prototype for enhancing negative ion yields during FIB-TOF-SIMS analysis in high vacuum, ” Ultramicroscopy 196 , ( 2019 ), pp. 10 - 17 . 10.1016/j.ultramic.2018.09.008 [36] Smith N. ,; Tesch P. ,; Martin N. ,; Kinion D. , “ A high brightness source for nano-probe secondary...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220039
EISBN: 978-1-62708-259-4
... reproduction, lighting, and image enhancement techniques. etching macrographic examination photographic reproduction sample preparation Macrographic examination is the examination under low or no magnification of a polished plane section of a part or a metallic sample, usually subjected...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030001
EISBN: 978-1-62708-349-2
... polarized light and various contrast media to enhance the differences in refractive index of discrete phases in the composite. Although an array of different types of composite materials is in use today, the utilization of both thermosetting- and thermoplastic (polymer)-matrix fiber-reinforced...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110524
EISBN: 978-1-62708-247-1
..., laboratory (“ALT”) aged VCSELs, and VCSELs with ❬100❭ DLDs. The line scans were taken from the devices shown in the previous figure, and oriented from the darkest to the lightest points. Fig 18 Image with spectral filter outside the mirror stop band (left) shows high contrast, where images...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780028
EISBN: 978-1-62708-281-5
... of polymer film; this bubble is later collapsed and wound on a roll. In contrast, flat film is produced by forcing the polymer melt through a wide rectangular die and onto a series of smooth, cooled rollers. Pipes and profiles are extruded through dies of the proper shape and held in that form until...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
... Atomic number contrast, channeling contrast, channeling patterns, and magnetic contrast in SEM Backscattered (inelastic) Energies less than beam energy Beam electron scattered back after inelastic collision Backscattered (plasmon and interband transition interactions) 1–1000 eV less than beam...