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computed tomography

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Published: 01 April 2013
Fig. 9 Comparison of (a) computed tomography (CT) system and a CT image at the height of the flaw shows the flaw in more detail and in a form an inexperienced viewer can readily recognize; (b) radiography system and a high quality digital radiograph of a solid rocket motor igniter shows More
Image
Published: 01 April 2013
Fig. 12 Use of computed tomography for examining automotive components. (a) Photograph of a cast aluminum transmission case with (b) corresponding tomographic image. (c) Two three-dimensional images of a cast aluminum cylinder head generated from a set of continuous tomographic scans used More
Image
Published: 01 April 2013
Fig. 8 Schematic of computed tomography, which is the reconstruction by computer of a series of tomographic planes (slices) of an object. The transmitted intensity of the fan shaped beam is processed by computer and the resulting image is displayed on a terminal. Source: Ref 5 More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720393
EISBN: 978-1-62708-305-8
..., computed tomography, gamma-ray density determination, and ultrasonic techniques. density measurements dimensional evaluation hardness testing nondestructive evaluation powder metallurgy parts FABRICATED POWDER METALLURGY (P/M) parts are evaluated and tested at several stages during...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110062
EISBN: 978-1-62708-247-1
..., and be combined to a 3D image. This is called computer tomography (CT). Fig. 1 X-ray system based on geometrical magnification. Compared with imaging techniques based on electron and visible light, X-rays offer several favorable traits that makes them uniquely well suited for non-destructive...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720233
EISBN: 978-1-62708-305-8
... arrangement like that of computed tomography (CT) systems. In fact, industrial CT systems are used to obtain digital radiographs. The imaging performance with detector arrays is also comparable with that of computed tomography ( Table 5 ). Comparison of performance characteristics for film radiography, real...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720293
EISBN: 978-1-62708-305-8
... if the localized indication is a spurious indication, a film artifact, a video aberration, or a surface irregularity. Computed Tomography Computed tomography, also known as computerized axial tomography (or CAT scanning), is a more sophisticated x-ray imaging technique originally developed for medical...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270019
EISBN: 978-1-62708-301-0
..., corrosion, machining, welding, fluid flow, and so forth. It is a condition-monitoring technique and is very useful in predicting failures. Computed Tomography (CT) In this technique, a thin beam of radiation, generally x-rays, is made to pass through the component and the image of a thin cross...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.t56090131
EISBN: 978-1-62708-462-8
... computed tomography (CT) type image projections. Reference 19 described the set-up and application of one such novel 3D X-ray tool that overcomes sample size and speed limitations of traditional X-ray imaging systems. For example, the time required for high resolution imaging in the region of interest...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220085
EISBN: 978-1-62708-259-4
..., and laser scanning microscopes. atom probe tomography atomic force microscopy laser scanning confocal microscopy metallography scanning electron microscopy scanning transmission electron microscopy transmission electron microscopy Although optical microscopy is based on the interaction...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110550
EISBN: 978-1-62708-247-1
... in comparison to the bare substrate shows a similar positive peak profile (with a lower amplitude shoulder peak) indicating the defect is in the solder bump region. Figure 4 shows the 3D X-Ray tomography performed at the solder bump location and a missing solder bump was observed to be the root cause...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2015
DOI: 10.31399/asm.tb.spsp2.t54410001
EISBN: 978-1-62708-265-5
... variations in crystal orientations between microstructural features and substructures in steels. The technique used is referred to as Electron Backscatter Diffraction (EBSD) and is based on precise computer indexing of diffraction patterns produced by backscattered electrons generated by stepping...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270059
EISBN: 978-1-62708-301-0
.... In yet another machine, which is a computerized tomography scanner, x-ray scans are taken around an object and the different views combined on a computer to produce a slice image in a second. Screening a bag takes 9 to 12 slices. For bags arousing suspicion, the machine projects two images taken from...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.t56090021
EISBN: 978-1-62708-462-8
... domain reflectometry x-ray tomography Background The growing market needs (cloud computing, AI, 5G, and automotive) for more computing power is driving ICs beyond Moore’s law. As logic scaling starts to lose steam, advanced 3D IC packaging technologies come to the rescue, further extending...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 1988
DOI: 10.31399/asm.tb.eihdca.t65220143
EISBN: 978-1-62708-341-6
... the temperature at that point, it is necessary to measure the velocity along a number of intersecting paths and then “invert” the information to establish the spatial velocity distribution. To this end, the method of computer-assisted tomography (CAT), originally developed in the field of medicine, is being...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720001
EISBN: 978-1-62708-305-8
... arms for providing measurement input, a computer for making rapid calculations and comparisons based on the measurement input, and the computer software that controls the entire system. An example of a CMM probe taking measurements on a machined stiffener is illustrated in Fig. 2 . Coordinate...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.9781627084628
EISBN: 978-1-62708-462-8
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.t56090091
EISBN: 978-1-62708-462-8
.... Recently, new computational techniques, ptychographic x-ray computed tomography (PXCT), and ptychographic x-ray laminography (PyXL) have been reported, which break the traditional dependence of imaging resolution on optical resolution ( Ref 19 ). These techniques offer sub-20 nm resolution, which may...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110513
EISBN: 978-1-62708-247-1
... We Need Improved Wire-Bonding Methods ?”, proc. of 34th ISTFA, Nov . 2008 [11] Jacob P. , Jerjen I. , Nicoletti G. , “ Root-cause investigations of stitch bond - shearing by means of 3D-X-ray computer tomography (XCT), metallographic polishing and FIB ”. Proc. ISTFA 2010...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2023
DOI: 10.31399/asm.tb.edfatr.t56090109
EISBN: 978-1-62708-462-8
... improvement. Other ions sources (metal, inert, and otherwise) may need to be explored. Routine low kV operation that greatly reduces depth of penetration is needed. Amorphous layer formation and transistor damage need to be avoided. IR through-silicon imaging needs to improve to allow precision computer aided...