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company-related failures

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 September 2008
DOI: 10.31399/asm.tb.fahtsc.t51130087
EISBN: 978-1-62708-284-6
.... The term damage is often preferable to the term failure , because damage is a technical term that is very clear and has a specific meaning, generally related to the physical condition of the component. The term failure , on the other hand, has many more philosophical connotations. It is possible...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 September 2008
DOI: 10.31399/asm.tb.fahtsc.t51130043
EISBN: 978-1-62708-284-6
... sources of failure can be attributed to material imperfections. For wrought products, this could be related to segregation, inclusions, porosity, laps, and seams. For castings, these imperfections could be cold shuts, inclusions, shrinkage, voids, and porosity. Forgings can have laps, seams, segregation...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110524
EISBN: 978-1-62708-247-1
..., while visible degradation on the top surface from corrosion is generally easily visible with optical microscopy. [28] Passive optoelectronics usually have failure mechanisms caused by package-related failures. Examples include the shifting of optical fibers that couple the light in, delamination...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780081
EISBN: 978-1-62708-268-6
... the gap. Aerojet built the dispenser fuse to a U.S. government design. The company flight-tested and dropped two dispensers each month for lot-acceptance testing. After beginning initial production, Aerojet experienced no dispenser failures during the first several months of lot-acceptance testing...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780093
EISBN: 978-1-62708-268-6
... measurements, setting up measuring equipment, and performing complex mathematical calculations. For these reasons, it is generally a good idea to witness failure-analysis-related inspections, question assumptions made during the inspection to ensure concurrence on the approach, and understand what the...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780075
EISBN: 978-1-62708-268-6
... the item in the failed system may be an inspection escape). The failure analysis team may find sloppiness or errors in the inspection documentation, again suggesting an inspection escape. Inspection records: In a manner similar to that described previously, most companies retain their inspection...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110613
EISBN: 978-1-62708-247-1
..., but it puts that knowledge in perspective and provides direction. This article reviews normal transistor operation and then relates it to electronic behavior in the presence of defects, such as bridges and opens. These electronic principles are then applied to an inexpensive CMOS failure analysis...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 September 2008
DOI: 10.31399/asm.tb.fahtsc.t51130133
EISBN: 978-1-62708-284-6
... Abstract This article presents six case studies of failures with steel forgings. The case studies covered are crankshaft underfill; tube bending; spade bit; trim tear; upset forging; and avoidance of flow through, lap, and crack. The case studies illustrate difficulties encountered in either...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.stg2.t61280323
EISBN: 978-1-62708-267-9
... phases, and how these processes contribute to microstructural changes as a function of time, temperature, and applied stress. It also describes several failure examples and discusses related issues, including damage recovery, refurbishment, and repair. microstructure gas turbine components...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110673
EISBN: 978-1-62708-247-1
... about the need for analysis capabilities to understand failure mechanisms associated with these integrated circuits. As these parts grew in popularity, the requirement for failure analysis grew. During the late 1960’s many companies began taking the first steps toward establishing what we now know as a...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 September 2008
DOI: 10.31399/asm.tb.fahtsc.t51130311
EISBN: 978-1-62708-284-6
... Abstract This chapter focuses on the failure aspects of tool steels. The discussion covers the classification, chemical composition, main characteristics, and several failures of tool steels and their relation to heat treatment. The tool steels covered are hot work, cold work, plastic mold, and...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110666
EISBN: 978-1-62708-247-1
... issue. The ever-increasing complexity of the semiconductor fabrication process demands a commensurate increase in product team member collaboration, in turn requiring an understanding of related disciplines. To this end, it is important that failure analysis personnel understand basic concepts of...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110101
EISBN: 978-1-62708-247-1
... reflects that not all at-speed failures identified during testing, and subsequently diagnosed, are actual, physical defects. The Freescale test case summarized below is a good example of companies using the convenience and performance of at-speed diagnosis for design optimization, timing analysis, timing...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110262
EISBN: 978-1-62708-247-1
... and fabless companies rely on FA results to build defect pareto charts and identify problems that have the most impact to manufacturing yield ramp. Figure 2 Typical IC manufacturing time to market cycle Time to market can be shortened by finding root cause failures earlier and...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110603
EISBN: 978-1-62708-247-1
... related damage; defects due to aging; no traceability; unknown pedigree Scrapped parts Source: part manufacturers, testing companies, contract manufacturers Attributes: internal quality problems such as missing die or bond wires; die contamination; part termination damage Reclaimed parts...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780157
EISBN: 978-1-62708-268-6
... distribution characteristics to determine the probability of being above or below any particular value. In the failure analysis context, the normal distribution and its related probability distribution function are extremely important. Suppose the failure analysis team collects the range of outputs...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 May 2018
DOI: 10.31399/asm.tb.hma.t59250187
EISBN: 978-1-62708-287-7
... the trial, they found that for a period in the 1920s when dividends were $25 million, the top executives received bonuses of $14 million. The press and Wall Street condemned the secret bonus plan, both for the extreme bonuses and for the company’s failure to reveal this information to the shareholders...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 May 2018
DOI: 10.31399/asm.tb.hma.t59250207
EISBN: 978-1-62708-287-7
... exposed industrywide problems and failures that had existed for many years. Among them were poor labor relations, delayed modernization, an unbalanced product mix, and inconvenient mill locations in relation to the market. Other problems included steady price increases to cover union contracts rather than...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 May 2018
DOI: 10.31399/asm.tb.hma.t59250129
EISBN: 978-1-62708-287-7
... William Kroll. Various studies on the properties on titanium and research programs related to the production of titanium sponge and titanium metal products are then described. The chapter concludes with a discussion of titanium use in jet engines. jet engines metal products titanium titanium...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110634
EISBN: 978-1-62708-247-1
... voltage scaling. In addition, defects causing more subtle electrical fail types (e.g., timing-related failures) are becoming more common in future technologies. Rising test costs may force new testing methods to become adopted. These rising costs are caused by the trends listed above, their impact on...