1-11 of 11 Search Results for

brightfield illumination

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110042
EISBN: 978-1-62708-247-1
... details. It begins with the basic microscope column and construction. The article discusses microscope adjustments, brightfield and darkfield illumination, and microscope concepts important to liquid crystal techniques. It also discusses solid immersion lenses, infrared and ultraviolet microscopy...
Image
Published: 01 November 2019
Figure 24 In darkfield, objects illuminated from outside the field reflect light into the field of view, appearing bright against a dark field. In brightfield the field is illuminated, and objects tend to reflect light out of the field, and so appear dark. More
Image
Published: 01 November 2019
Figure 23 The left image of crystal defects is darkfield illuminated, the right image is brightfield. Light scattering objects show up well against the dark background. More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110545
EISBN: 978-1-62708-247-1
... in a module can be from the sun in operation or with an external bias applied to the module. Figure 2 Thermal image of solar panels under full sun illumination and short circuit load conditions showing cells with high power dissipation. Forward Bias Thermal Imaging To maximize local joule...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850267
EISBN: 978-1-62708-260-0
... between amplitude and optical-phase features and how they are revealed using appropriate illumination methods. It compares images obtained using bright field and dark field illumination, polarized and cross-polarized light, and interference-contrast techniques. It also discusses the use of photometers...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110153
EISBN: 978-1-62708-247-1
... on the thickness and nature of the substrate but also the quality of the illuminated image taken from the backside of the die. To minimize diffuse light scattering (caused by scratches and irregularities at the surface of the die that deteriorate image quality) a mean surface roughness of less than 5 nm...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
... are black when viewed under a microscope in brightfield illumination mode. Inclusions are also classified on the basis of their thickness as heavy or thin. Finally, they are characterized on the basis of their severity level based on the number or length of the inclusions present in a 0.50 mm 2 field...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850165
EISBN: 978-1-62708-260-0
... exhibit large differences in light reflectivity after polishing, the desired microstructure, or certain features of the microstructure, can be observed in the as-polished condition under bright-field illumination without recourse to subsequent treatments such as etching. Constituents that differ...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.9781627082600
EISBN: 978-1-62708-260-0
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.9781627082532
EISBN: 978-1-62708-253-2
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2022
DOI: 10.31399/asm.tb.tstap.9781627084284
EISBN: 978-1-62708-428-4