The analysis of composite materials using optical microscopy is a process that can be made easy and efficient with only a few contrast methods and preparation techniques. This chapter is intended to provide information that will help an investigator select the appropriate microscopy technique for the specific analysis objectives with a given composite material. The chapter opens with a discussion of macrophotography and microscope alignment, and then goes on to describe various illumination techniques that are useful for specific analysis requirements. These techniques include bright-field illumination, dark-field illumination, polarized-light microscopy, interference and contrast microscopy, and fluorescence microscopy. The chapter also provides a discussion of sample preparation materials such as dyes, etchants, and stains for the analysis of composite materials using optical microscopy.

Analyzing the structure of composite materials is essential for understanding how the part will perform in service. Assessing fiber volume variations, void content, ply orientation variability, and foreign object inclusions helps in preventing degradation of composite performance. This chapter describes the optical microscopy and bright-field illumination techniques involved in analyzing ply terminations, prepreg plies, splices, and fiber orientation to provide the insight necessary for optimizing composite structure and performance.

The formation of microcracks in composite materials may arise from static-, dynamic-, impact-, or fatigue-loading situations and also by temperature changes or thermal cycles. This chapter discusses the processes involved in the various methods for the microcrack analysis of composite materials, namely bright-field analysis, polarized-light analysis, contrast dyes analysis, and dark-field analysis. The analysis of microcracked composites using epi-fluorescence is also covered. In addition, the chapter describes the procedures for the determination and recording of microcracks in composite materials.