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background data assembling

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2015
DOI: 10.31399/asm.tb.cpi2.t55030360
EISBN: 978-1-62708-282-2
... Abstract This chapter concentrates almost exclusively on inspection techniques related to pressure vessels and pipework. The discussion covers the general aspects associated with inspection and the key factors relevant to it. In addition, the chapter addresses processes involved in data...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 September 2008
DOI: 10.31399/asm.tb.fahtsc.t51130043
EISBN: 978-1-62708-284-6
... sources of component failure. This is followed by a section on the stages of a failure analysis, which can proceed one after the other or occur at the same time. These stages of analysis are collection of background data, preliminary visual examination, nondestructive testing, selection and preservation...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.t66910475
EISBN: 978-1-62708-250-1
..., processing, and service histories of the failed component or structure and reconstructing, insofar as possible, the sequence of events leading to the failure. The collection of background data on the manufacturing and fabrication history of a component should begin with obtaining specifications and drawings...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 September 2008
DOI: 10.31399/asm.tb.fahtsc.t51130285
EISBN: 978-1-62708-284-6
... Abstract This chapter reviews the causes and cases associated with the problems originated by tempering of steels. To provide background on this phenomenon, a brief description of the martensite reactions and the steel heat treatment of tempering is given to review the different stages of...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110634
EISBN: 978-1-62708-247-1
... includes data feed-forward from one step to another and dynamic test routings. (See more background of Adaptive testing and examples at [1] .) Normally the first test applied is aimed at ensuring that there is reliable contact between the tester and the device. Each device I/O should be tested for a...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720267
EISBN: 978-1-62708-305-8
... especially useful on rough surfaces when good coupling is needed to minimize background noise and yield an adequate signal-to-noise ratio. Ultrasound can be used to measure material thickness by (a) determining resonant frequencies of a test piece and (b) measuring time required for an ultrasonic wave...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2001
DOI: 10.31399/asm.tb.secwr.t68350043
EISBN: 978-1-62708-315-7
... mechanism that is operating. Unfortunately, this approach is complicated by the fact that more than one mechanism may be operating at the same time and by the fact that those developing wear classification schemes have come from different backgrounds and experiences with wear. As a result, different...
Series: ASM Technical Books
Publisher: ASM International
Published: 30 November 2013
DOI: 10.31399/asm.tb.uhcf3.t53630001
EISBN: 978-1-62708-270-9
... design engineers to rethink their design and “discover” a method to make their design fail. For a complete evaluation, the sequence of stages in the investigation and analysis of failure, as detailed in Ref 1 , is: Collection of background data and selection of samples Preliminary...
Series: ASM Technical Books
Publisher: ASM International
Published: 23 January 2020
DOI: 10.31399/asm.tb.stemsem.9781627082921
EISBN: 978-1-62708-292-1
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720063
EISBN: 978-1-62708-305-8
... background noise. There are several possible causes of image degradation, including: Motion of the camera or object during image formation Poor illumination or improper placement of illumination Variations in sensor response Defects or poor contrast on the surface of the subject, such as...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110447
EISBN: 978-1-62708-247-1
... us closer to the interface of interest and only a thin layer of Ti needs to be sputtered away. Unfortunately, such via is included in an organic inter-layer dielectric and this hampers the access of the primary ion beam of the ToF-SIMS. This means that there is a background of carbon signal that...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270019
EISBN: 978-1-62708-301-0
... to collect the relevant background information. This facilitates the developing of a complete case history about the failure. The information to be collected falls into two groups: Information about the failed component Information about the failure itself Information about the failed...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720293
EISBN: 978-1-62708-305-8
....) thick. The image shown in (a) is unprocessed; the image in (b) is processed to subdue the background and to enhance edges and internal features. Courtesy of B.G. Isaacson, Bio-Imaging Research, Inc. Interpretation of the radiographic image requires a skilled specialist who can establish the...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720233
EISBN: 978-1-62708-305-8
... than the background of bremsstrahlung having the same wavelengths. Gamma rays are generated during the radioactive decay of both naturally occurring and artificially produced unstable isotopes. In all respects other than their origin, γ-rays and x-rays are identical. Unlike the broad spectrum...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2012
DOI: 10.31399/asm.tb.ffub.t53610549
EISBN: 978-1-62708-303-4
... is as follows: Collection of background data and selection of samples Preliminary examination of the failed part (visual examination and record keeping) Nondestructive testing Mechanical testing (including hardness and toughness testing) Selection, identification, preservation, and...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110524
EISBN: 978-1-62708-247-1
... come from a background of integrated circuit failure analysis. By contrast, failure analysis of optoelectronics is a nearly unexplored frontier. While very challenging and interesting, at the same time there is relatively little background work on which to build. This chapter does not contain a...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780177
EISBN: 978-1-62708-281-5
..., background, and other factors. Color meters are available that can measure the consistency of a color more closely than the eye can see, and manufacturers continue to improve their measurement methods. The ASTM standard for color evaluation is D 1729, which calls for visual evaluation of color samples...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270031
EISBN: 978-1-62708-301-0
... involves the collection of a large body of information in terms of background data, observation of features, laboratory testing, metallography, fractography, and analysis of data. The information gathered in these stages must be systematically linked to arrive at the cause or the most probable cause of the...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.horfi.t51180001
EISBN: 978-1-62708-256-3
... design, poor material, or manufacturing mistakes. Whether such “defects” exist in a given component that is undergoing failure analysis often can be determined only by someone with a materials background—because many defects are visible only with the aid of a microscope. While microscopes may be widely...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 September 2008
DOI: 10.31399/asm.tb.fahtsc.t51130111
EISBN: 978-1-62708-284-6
... , is as follows (Ref 2) : Collection of background data and selection of samples Preliminary examination of the failed part Nondestructive and mechanical testing Selection, identification, preservation, and/or cleaning of specimens Macroscopic examination and analysis and...