1-20 of 48 Search Results for

auger electron spectroscopy

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
... imaging, X-Ray photoelectron spectroscopy, X-ray fluorescence, Auger electron spectroscopy, Raman spectroscopy, oxygen analysis, and nanoindentation. cold-sprayed coatings residual-stress analysis hardness bond adhesion strength microscopy spectroscopy diffraction MATERIALS...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
... structure <5 μm >10 μm <100 ppm Moderate Raman Chemical structure >1 μm >1 μm <0.1 at.% Difficult Note: EDS, energy-dispersive spectroscopy; WDS, wavelength-dispersive spectroscopy; AES, Auger electron spectroscopy; XPS, x-ray photoelectron spectroscopy; TOF-SIMS, time...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110447
EISBN: 978-1-62708-247-1
... used in semiconductor industry are: Auger spectroscopy, dynamic secondary ion mass spectroscopy, time of flight static secondary ion mass spectroscopy (ToF-SIMS), X-ray photoelectron spectroscopy, scanning electron microscope-energy dispersive X-ray spectroscopy (SEM-EDX), and transmission electron...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2015
DOI: 10.31399/asm.tb.spsp2.t54410001
EISBN: 978-1-62708-265-5
... crystals in a process referred to as Wavelength Dispersive Spectroscopy (WDS) ( Ref 1.3 ). Auger Electron Spectroscopy The X-ray spectra generated from the atom inner shell electrons in SEM come from volumes relatively deep in specimens, distances on the order of one micron from the specimen...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.9781627082815
EISBN: 978-1-62708-281-5
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110434
EISBN: 978-1-62708-247-1
...Properties of analytical techniques including energy dispersive x-ray spectroscope (EDS) in the SEM or STEM (with thin samples), wavelength dispersive x-ray spectroscopy (WDS), Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS, also knows as ESCA), secondary ion mass...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.t66910475
EISBN: 978-1-62708-250-1
... photoelectrons or Auger electrons emitted from a surface excited by an x-ray beam or an electron beam. (Techniques known as x-ray photoelectron spectroscopy, XPS, or Auger electron spectroscopy, AES Quantitative chemical analysis of outermost atomic layers of surfaces Only true “surface analysis” techniques...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270019
EISBN: 978-1-62708-301-0
...; lateral resolution, 20 to 200 μm Electron probe microanalysis: Applicable to elements heavier than boron; accessible range, 0.001 to 10%; accuracy, 5 to 10%; lateral resolution, 0.2 to 1 μm Auger electron spectroscopy: Applicable to all elements except hydrogen and helium; accessible range...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720139
EISBN: 978-1-62708-305-8
... in metallurgical studies and comparisons of their capabilities with those of the scanning Auger microprobe. Secondary Ion Mass Spectroscopy (SIMS) X-Ray Photoelectron Spectroscopy (XPS) As noted above, the scanning Auger microprobe is essentially a SEM to which an Auger electron detector and an ion...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780093
EISBN: 978-1-62708-268-6
... technologies include energy-dispersive analysis of x-rays, spectrographic techniques (including electron probe microanalysis, Fourier transform infrared spectroscopy, mass spectrometry, secondary ion mass spectrometry, and Auger analysis), and chromatography. These technologies are described as follows...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110506
EISBN: 978-1-62708-247-1
... are chosen. Scanning Probe Microscopy (SPM) such as Atomic Force Microscopy (AFM), and Scanning Tunneling Microscopy (STM) reveal physical or chemical characteristics of the sample. Elemental analysis using Energy Dispersive X-Ray Spectroscopy (EDS), or Auger Electron Spectroscopy (AES...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2017
DOI: 10.31399/asm.tb.sccmpe2.t55090191
EISBN: 978-1-62708-266-2
... Early direct measurements of RIS were performed by Auger electron spectroscopy (AES) coupled with depth profiling by sputtering ( Ref 6.42 , 6.43 ). In general, the irradiations used heavy metal ions, were greatly accelerated (e.g., by approximately 10,000×) compared with LWR conditions, and were...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400149
EISBN: 978-1-62708-258-7
... of the constituents in the sample. The primary electrons also interact to generate other electrons, called secondary electrons, which can provide topographical information about the surface features of the sample. Other interactions include backscattered electrons, Auger electrons, and, photons. The results of some...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780343
EISBN: 978-1-62708-281-5
... of surfaces, determination of surface species Auger electron spectroscopy (AES) Elemental concentrations Chemical compositions of surfaces Wavelength dispersive x-ray analysis Elements present on polymer surfaces Identification of contaminants on polymer surfaces Problem Solving Molecular...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2012
DOI: 10.31399/asm.tb.pdub.t53420239
EISBN: 978-1-62708-310-2
..., a focused and collimated electron beam impinges on the surface of a sample, creating backscattered electrons, secondary electrons, characteristic X-rays, and Auger electrons, among other signals. Scanning electron microscopes are often coupled with energy-dispersive X-ray microanalysis (EDX...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110335
EISBN: 978-1-62708-247-1
... for Xe + [7] Secondary electron yield (30 kV on Al) 1.4 for Ne; 1.1 for He [8] 0.7 for Ga [9] 0.8 for Xe [8] Common applications Surface imaging, circuit edit, cross-section imaging, probe pad connections TEM lamella preparation, cross-sectioning, circuit edit, 3D tomography, fiducial...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270005
EISBN: 978-1-62708-301-0
... L.E. , and Palmberg P.W. , Auger Electron Spectroscopy , Methods of Surface Analysis , Czanderna A.W. , Ed., Elsevier , Amsterdam , 1975 , p 159 10.1016/B978-0-444-41344-4.50012-4 7. Radhakrishnan S. , National Aeronautical Laboratory , Bangalore, India , private...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2011
DOI: 10.31399/asm.tb.mnm2.9781627082617
EISBN: 978-1-62708-261-7
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780359
EISBN: 978-1-62708-281-5
... photoelectron spectroscopy (XPS) Elemental concentrations Chemical composition of surfaces Auger electron spectroscopy (AES) Elemental concentrations Chemical composition of surfaces Source: Ref 3 Fig. 1 Steps for performing failure analysis. The steps are the same regardless...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780141
EISBN: 978-1-62708-268-6
..., and scanning electron microscopy can reveal the presence of contaminants. Any of the materials analysis technologies (energy-dispersive analysis of x-rays, Fourier transform infrared spectroscopy, spectrometry, chromatography, secondary ion mass spectrometry, and Auger) can be used to identify elements...