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Image
Published: 30 November 2013
Fig. 7 Striations generated on a spectrum-loaded test article. Source: Ref 2
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Image
Electron micrograph showing a block-loaded test article with a band of 10 c...
Available to PurchasePublished: 30 November 2013
Fig. 8 Electron micrograph showing a block-loaded test article with a band of 10 cycles of a higher load. Source: Ref 2
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Examples of “good” welds addressed in this article. Initiation sites at a w...
Available to PurchasePublished: 01 July 1997
Fig. 12 Examples of “good” welds addressed in this article. Initiation sites at a weld ripple or a weld toe are shown.
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Center pie chart depicts the percentage of articles published on different ...
Available to Purchase
in Various Conventional and Advanced Sintering Methods to Consolidate Powders
> Powder Metallurgy and Additive Manufacturing: Fundamentals and Advancements
Published: 30 September 2024
Fig. 5.1 Center pie chart depicts the percentage of articles published on different sintering techniques (including review) since 2005. As shown, almost one-third of the published articles are based on materials processing using conventional sintering. Surrounding pie charts show articles
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Book Chapter
Investment Casting
Available to PurchaseSeries: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.stg2.t61280079
EISBN: 978-1-62708-267-9
... components. Directional casting to create a SC article provides composition flexibility and opens the possibility of additional alloy development for high-strength nickel-base superalloys. Although initially restricted to relatively small turbine airfoil components of aircraft gas turbines, CGDS and SC...
Abstract
This chapter discusses the application of investment casting to nickel- and cobalt-base superalloys. It describes the production of polycrystalline and single crystal castings, the materials normally used, and the part dimensions and tolerances typically achieved. It explains how patterns, molds, and shells are produced, discusses the practice of directional solidification, and examines an assortment of turbine components cast from nickel- and cobalt-base alloys. The chapter also addresses casting problems such as inclusions, porosity, distortion, core shift, and leaching and explains how to avoid them.
Book Chapter
General Design Guidelines
Available to PurchaseSeries: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780051
EISBN: 978-1-62708-281-5
... Abstract To ensure the proper application of plastics, one must keep in mind three factors that determine the appropriate end-use: material selection, processing, and design. This article begins by providing information on various factors pertinent to the anticipated use conditions...
Abstract
To ensure the proper application of plastics, one must keep in mind three factors that determine the appropriate end-use: material selection, processing, and design. This article begins by providing information on various factors pertinent to the anticipated use conditions of the article to be designed. This is followed by a discussion on several stages necessary to define the geometry of plastic parts. Details on the strength of and cost estimation for plastic parts are then provided. The article ends with a section providing information on the structure, properties, processing, and end-use applications of plastics.
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Scanning electron micrograph of surface structure near the origin of a low-...
Available to PurchasePublished: 30 November 2013
Fig. 9 Scanning electron micrograph of surface structure near the origin of a low-cycle fatigue-loaded test article
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Aloha Airlines Boeing 737 accident in Hawaii. The headline is a recreation ...
Available to PurchasePublished: 01 March 2006
Fig. 1.2 Aloha Airlines Boeing 737 accident in Hawaii. The headline is a recreation of one that appeared in a Newsweek article about the accident ( Ref 1.6 ). Photo source: Associated Press Wide World Photos. Reproduced with permission
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Book Chapter
Characterization of Plastics in Failure Analysis
Available to PurchaseSeries: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780359
EISBN: 978-1-62708-281-5
... Abstract This article reviews various analytical techniques most commonly used in plastic component failure analysis. The description of the techniques is intended to make the reader familiar with the general principles and benefits of the methodologies. The descriptions of the analytical...
Abstract
This article reviews various analytical techniques most commonly used in plastic component failure analysis. The description of the techniques is intended to make the reader familiar with the general principles and benefits of the methodologies. The descriptions of the analytical techniques are supplemented by a series of case studies that include pertinent visual examination results and the corresponding images that aided in the characterization of the failures. The techniques covered include Fourier transform infrared spectroscopy, differential scanning calorimetry, thermogravimetric analysis, thermomechanical analysis, and dynamic mechanical analysis. The article also discusses various analytical methods used to characterize the molecular weight distribution of a polymeric material. It provides information on a wide range of mechanical tests that are available to evaluate plastics and polymers, covering the various considerations in the selection and use of test methods.
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2022
DOI: 10.31399/asm.tb.tstap.t56040001
EISBN: 978-1-62708-428-4
... Abstract This article provides a high-level overview of thermal spray technologies and their applications and benefits. It is intended to educate members of government, industry, and academia to the benefits of thermal spray technology. The article describes the value of thermal spray...
Abstract
This article provides a high-level overview of thermal spray technologies and their applications and benefits. It is intended to educate members of government, industry, and academia to the benefits of thermal spray technology. The article describes the value of thermal spray technology with examples of application success stories. A few applications critical to thermal spray and market growth are briefly discussed. The article also summarizes the key research areas in thermal spray technology.
Book Chapter
Introduction to Corrosion Resistance of Bulk Materials
Available to PurchaseSeries: ASM Technical Books
Publisher: ASM International
Published: 01 December 2015
DOI: 10.31399/asm.tb.cpi2.t55030167
EISBN: 978-1-62708-282-2
... of metallic materials can be influenced greatly by alloying, metallurgical treatments, and mechanical treatments. The following articles consider methods of preventing corrosion based on these factors, as applicable, for a number of technologically important alloy systems. Alloying Chemical composition...
Abstract
This chapter discusses the factors influencing the corrosion resistance of bulk materials, namely alloying, metallurgical factors, and mechanical treatments.
Book Chapter
Discoveries of the Commercial Usefulness of Stainless Steel
Available to PurchaseSeries: ASM Technical Books
Publisher: ASM International
Published: 01 June 2010
DOI: 10.31399/asm.tb.hss.t52790017
EISBN: 978-1-62708-356-0
.... The steel that had been declared dead and almost useless became an absorbing topic of conversation among cutlers and steelmakers and a subject for newspaper articles. A new industry had been born in Sheffield! Brearley went on to obtain U.S., French and Canadian patents. Because of his diligence...
Abstract
This chapter presents the usefulness of martensitic chromium stainless steels discovered in England and America, the usefulness of ferritic chromium stainless steels discovered in America, and the usefulness of chromium-nickel stainless steels discovered in Germany. It also provides a short note on the usefulness of chromium-silicon steels.
Book Chapter
Package Failure Analysis: Flow and Technique
Available to PurchaseSeries: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110010
EISBN: 978-1-62708-247-1
... Abstract As semiconductor feature sizes have shrunk, the technology needed to encapsulate modern integrated circuits has expanded. Due to the various industry changes, package failure analyses are becoming much more challenging; a systematic approach is therefore critical. This article proposes...
Abstract
As semiconductor feature sizes have shrunk, the technology needed to encapsulate modern integrated circuits has expanded. Due to the various industry changes, package failure analyses are becoming much more challenging; a systematic approach is therefore critical. This article proposes a package failure analysis flow for analyzing open and short failures. The flow begins with a review of data on how the device failed and how it was processed. Next, non-destructive techniques are performed to document the condition of the as-received units. The techniques discussed are external optical inspection, X-ray inspection, scanning acoustic microscopy, infrared (IR) microscopy, and electrical verification. The article discusses various fault isolation techniques to tackle the wide array of failure signatures, namely IR lock-in thermography, magnetic current imaging, time domain reflectometry, and electro-optical terahertz pulse reflectometry. The final step is the step-by-step inspection and deprocessing stage that begins once the defect has been imaged.
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110513
EISBN: 978-1-62708-247-1
.... This article highlights some of the most frequent early life failure types in automotive applications. It describes some of the critical things to be considered while handling packages and printed circuit board layout. The article also provides information on failure anamnesis that shows how to use history...
Abstract
Root cause of failure in automotive electronics cannot be explained by the failure signatures of failed devices. Deeper investigations in these cases reveals that a superimposition of impact factors, which can never be represented by usual qualification testing, caused the failure. This article highlights some of the most frequent early life failure types in automotive applications. It describes some of the critical things to be considered while handling packages and printed circuit board layout. The article also provides information on failure anamnesis that shows how to use history, failure signatures, environmental conditions, regional failure occurrences, user profile issues, and more in the failure analysis process to improve root cause findings.
Book Chapter
Creep, Stress Relaxation, and Yielding
Available to PurchaseSeries: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780199
EISBN: 978-1-62708-281-5
... Abstract This article describes the general aspects of and practical problems of failure analysis of creep, stress relaxation, and yielding for homogeneous polymers. The effect of temperature and strain rate on the relationship between yield point and elastic modulus and the aging effect...
Abstract
This article describes the general aspects of and practical problems of failure analysis of creep, stress relaxation, and yielding for homogeneous polymers. The effect of temperature and strain rate on the relationship between yield point and elastic modulus and the aging effect that polymers often undergo at room temperature are also discussed.
Book Chapter
Failure Analysis Terms and Definitions
Available to PurchaseSeries: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110678
EISBN: 978-1-62708-247-1
... Abstract This article is a compilation of terms and definitions related to failure analysis that have been addressed in the proceedings of the International Symposium for Testing and Failure Analysis. failure analysis Acknowledgements This terms and definitions section, which...
Abstract
This article is a compilation of terms and definitions related to failure analysis that have been addressed in the proceedings of the International Symposium for Testing and Failure Analysis.
Book Chapter
Why Perform Failure Analysis?
Available to PurchaseSeries: ASM Technical Books
Publisher: ASM International
Published: 30 November 2013
DOI: 10.31399/asm.tb.uhcf3.t53630xvi
EISBN: 978-1-62708-270-9
... to be asking the failure analyst to determine root cause. However, experience and time will teach the failure analyst that the best way to “make a problem go away” is to discover root cause. This book may be the first of many books, papers, and articles you will read on the subject of failure analysis...
Abstract
Designs and materials continue to become more complex, with novel technologies developed to create them, and novel instruments invented to analyze them. Engineers at all stages of the design and manufacturing process should appreciate the reasons why formal failure analysis is performed. This chapter describes why failure analysis is conducted and outlines the responsibilities of the failure analyst.
Book Chapter
Diagnosis of Scan Logic and Diagnosis Driven Failure Analysis
Available to PurchaseSeries: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110101
EISBN: 978-1-62708-247-1
... Abstract In this overview of diagnosis of scan logic and diagnosis driven failure analysis, the authors explore the world of diagnosis of digital semiconductors devices. After shortly outlining the technology behind diagnosis, the main part of this article describes key improvements...
Abstract
In this overview of diagnosis of scan logic and diagnosis driven failure analysis, the authors explore the world of diagnosis of digital semiconductors devices. After shortly outlining the technology behind diagnosis, the main part of this article describes key improvements to the basic diagnosis tools, discussing their merits for the failure analysis engineer. The article also describes the various requirements and other considerations that typically need to be taken into account to set up a full working scan diagnosis system. It summarizes the principles of design with embedded compression technologies. Finally, several successful industrial applications of diagnosis are presented.
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2022
DOI: 10.31399/asm.tb.tstap.t56040010
EISBN: 978-1-62708-428-4
... Abstract This article provides a brief description of commercially important thermal spray processes and gives examples of applications and application requirements. The processes covered are flame, wire arc, plasma, high-velocity oxyfuel processes, detonation gun, and cold spray methods...
Abstract
This article provides a brief description of commercially important thermal spray processes and gives examples of applications and application requirements. The processes covered are flame, wire arc, plasma, high-velocity oxyfuel processes, detonation gun, and cold spray methods. Examples are provided of the applications in aerospace, automotive, and medical device industries as well as the use of thermal spray as an additive manufacturing technique.
Book Chapter
Photon Emission in Silicon Based Integrated Circuits
Available to PurchaseSeries: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110180
EISBN: 978-1-62708-247-1
... Abstract Photon emission (PE) is one of the major optical techniques for contactless isolation of functional faults in integrated circuits (ICs) in full electrical operation. This article describes the fundamental mechanisms of PE in silicon based ICs. It presents the opportunities...
Abstract
Photon emission (PE) is one of the major optical techniques for contactless isolation of functional faults in integrated circuits (ICs) in full electrical operation. This article describes the fundamental mechanisms of PE in silicon based ICs. It presents the opportunities of contactless characterization for the most important electronic device, the MOS - Field Effect Transistor, the heart of ICs and their basic digital element, the CMOS inverter. The article discusses the specification and selection of detectors for proper PE applications. The main topics are image resolution, sensitivity, and spectral range of the detectors. The article also discusses the value and application of spectral information in the PE signal. It describes state of the art IC technologies. Finally, the article discusses the applications of PE in ICs and also I/O devices, integrated bipolar transistors in BiCMOS technologies, and parasitic bipolar effects like latch up.
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