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T.J. Eden, D.E. Wolfe, V. Champagne, C. Widener
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IV characteristics of common failure modes for a 72-cell module with 3 amps...
Available to Purchase
in Solar Photovoltaic Module Failure Analysis[1]
> Microelectronics Failure Analysis: Desk Reference
Published: 01 November 2019
Figure 1 IV characteristics of common failure modes for a 72-cell module with 3 amps/cell of current output
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Book Chapter
Differentiating between EOS and ESD Failures for ICs
Available to PurchaseSeries: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110652
EISBN: 978-1-62708-247-1
..., the sample size (21) is simply VxL with a stress range from +/- 250 Volt to +/- 3000 Volt. All units were data-logged both pre- and post- test such that any leakage current equal or greater than 500 nano-Amps was “flagged” for analysis. Failing devices were analyzed using conventional electrical, chemical...
Abstract
In the Semiconductor I/C industry, it has been well documented that the proportion of factory and customer field returns attributed to device damage resulting from electrical over-stress (EOS) and electro-static discharge (ESD) can amount to 40 to 50%. This study entailed EOS and ESD simulation using a variety of models, namely the Human Body Model (HBM), the Charged Device Model (CDM) and the so-called Machine Model (MM), and then conducting electrical and physical failure analysis and comparing the results with documented analyses performed on customer field returns and factory failures. It is shown that a distinction can be made between EOS and ESD failures and between the characteristic failure signatures produced by the ESD models. The CDM physical failure location is at the input buffer and in the gate oxide, where as both HBM and MM failures occur mostly in the contacts at the input protection structures.
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2017
DOI: 10.31399/asm.tb.sccmpe2.t55090135
EISBN: 978-1-62708-266-2
Abstract
Nickel and nickel-base alloys are specified for many applications, such as oil and gas production, power generation, and chemical processing, because of their resistance to stress-corrosion cracking (SCC). Under certain conditions, however, SCC can be a concern. This chapter describes the types of environments and stress loads where nickel-base alloys are most susceptible to SCC. It begins with a review of the physical metallurgy of nickel alloys, focusing on the role of carbides and intermetallic phases. It then explains how SCC occurs in the presence of halides (such as chlorides, bromides, iodides, and fluorides), sulfur-bearing compounds (such as H2S and sulfur-oxyanions), high-temperature and supercritical water, and caustics (such as NaOH), while accounting for temperature, composition, microstructure, properties, environmental contaminants, and other factors. The chapter also discusses the effects of hydrogen embrittlement and provides information on test methods.
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110513
EISBN: 978-1-62708-247-1
Abstract
Root cause of failure in automotive electronics cannot be explained by the failure signatures of failed devices. Deeper investigations in these cases reveals that a superimposition of impact factors, which can never be represented by usual qualification testing, caused the failure. This article highlights some of the most frequent early life failure types in automotive applications. It describes some of the critical things to be considered while handling packages and printed circuit board layout. The article also provides information on failure anamnesis that shows how to use history, failure signatures, environmental conditions, regional failure occurrences, user profile issues, and more in the failure analysis process to improve root cause findings.
Book Chapter
An Overview of Integrated Circuit Testing Methods
Available to PurchaseSeries: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110634
EISBN: 978-1-62708-247-1
Abstract
This chapter presents an overview of microprocessor and application specific integrated circuit (IC) testing. It begins with a description of key industry trends that will impact how ICs will be tested in the future. Next, it provides a brief description of the most common tests applied in the IC industry, where technical issues that are causing methodology changes are emphasized. These include functional testing, structural testing, scan-based delay testing, built-in self-testing, memory testing, analog circuit testing, system-on-a-chip testing, and reliability testing. Trends discussed have driven the development of novel focus areas in test and the chapter discusses several of those areas, including test data volume containment, test power containment, and novel methods of defect-based test.
Book Chapter
An Overview of Analog Design for Test and Diagnosis
Available to PurchaseSeries: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110643
EISBN: 978-1-62708-247-1
... by a first-order low-pass filter in a way that does not add non-linearity. Variations up to about 20% in the resistance and capacitance have minimal effect on the result. The technique, as reported, used an off-chip op-amp resistor and capacitor, but an on-chip anti-alias filter of the ADC could be used...
Abstract
This article describes the most common, general-purpose analog design-for-test (DFT) methods, analog test buses and loopback, and shows their advantages and limitations in diagnosability and automatability. It also describes DFT and built-in self-test (BIST) techniques for the most common analog functions, namely phase-locked loop, serializer-deserializer, analog/digital converters, and radio frequency. Lastly, the challenges of creating BIST for analog functions are summarized, along with seven principles that must be exploited to meet these challenges. These principles show how the design constraints for analog BIST circuitry can be more relaxed than for the circuit under test, while delivering the required test accuracy and speed.
Book Chapter
Welding
Available to PurchaseSeries: ASM Technical Books
Publisher: ASM International
Published: 01 December 2008
DOI: 10.31399/asm.tb.ssde.t52310201
EISBN: 978-1-62708-286-0
... for horizontal welding with current and voltages from 150 to 200 amp and 22 to 38 V, respectively. Vertical welds can use 100% carbon dioxide with amperage of 60 to 110 amp and voltage of 20 to 24 V. Flow rates of gas are 20 to 25 L/min. It is possible to get high-carbon welds, which may not resist corrosion...
Abstract
This chapter provides a basis for understanding the influence of stainless steel alloy composition and metallurgy on the welding process, which involves complex dynamics associated with melting, refining, and thermal processing. It begins with an overview of the welding characteristics of the categories of stainless steels, namely austenitic, duplex, ferritic, martensitic, and precipitation-hardening stainless steels. This is followed by a discussion of the selection criteria for materials to be welded. Various welding processes used with stainless steel are then described. The chapter ends with a section on some of the practices to ensure safety and weld quality.
Book Chapter
Metallography
Available to PurchaseSeries: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720161
EISBN: 978-1-62708-305-8
... in alcohol 10 mL HCl, 90 mL anhydrous ethyl alcohol 10–30 s at 6 V Reveals delta ferrite, and the general structure of chromium and Cr-Ni steels Sulfuric acid in water 5 mL H 2 SO 4 , 95 mL H 2 O Room temperature; stainless steel cathode; 6 V (0.1–0.5 amp), 5–15 s; use hood For Fe-Cr-Ni alloys...
Abstract
This chapter describes the methods and equipment applicable to metallographic studies and discusses the preparation of specimens for examination by light optical microscopy. Five major operations for preparation of metallographic specimens are discussed: sectioning, mounting, grinding, polishing, and etching. The discussion covers their basic principles, advantages, types, and applications, as well as the equipment setup. The chapter includes tables that list etchants used for microscopic examination. It also provides information on microscopic examination, microphotography, and the effects of grain size on the structural properties of the material.
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110545
EISBN: 978-1-62708-247-1
... characteristics of common failure modes for a 72-cell module with 3 amps/cell of current output Thermal Imaging of Modules Many different techniques have been developed to characterize solar cells and their defects. The most commonly used is thermal imaging with an camera sensitive to infrared black...
Abstract
Post-mortem analysis of photovoltaic modules that have degraded performance is essential for improving the long term durability of solar energy. This article focuses on a general procedure for analyzing a failed module. The procedure includes electrical characterization followed by thermal imaging such as forward bias, reverse bias, and lock-in, and emission imaging such as electroluminescence and photoluminescence imaging.
Book Chapter
Economics
Available to PurchaseSeries: ASM Technical Books
Publisher: ASM International
Published: 01 June 1988
DOI: 10.31399/asm.tb.eihdca.t65220315
EISBN: 978-1-62708-341-6
... Comparison of energy requirements for high-frequency welding and arc welding of carbon steel (a) Source: Thermatool Corp. Process (b) Thickness, cm (in.) Arc volts Arc amps Power, kW Speed, m/h (ft/h) Energy, kWh per 30 m or 100 ft FCAW 0.32 28 325 9.1 60 4.6 0.125) (200) HFRW...
Abstract
Induction heating is a rapid, efficient technique for producing localized or through heating in a wide range of industries. The economics as well as the technical feasibility of induction heating should be important considerations prior to investing in such a system. A number of cost elements enter into the analysis. These include equipment and energy costs, production lot size and ease of automation, material savings, labor costs, and maintenance requirements. This chapter discusses each of these factors. It compares the cost elements of induction heating with those of its main competitor, gas-fired furnace heating. Several typical examples are provided to illustrate the economic considerations in design and application of induction heating processes.
Book Chapter
Metallurgical Definitions for Induction Heat Treating
Available to PurchaseSeries: ASM Technical Books
Publisher: ASM International
Published: 01 August 2015
DOI: 10.31399/asm.tb.piht2.t55050301
EISBN: 978-1-62708-311-9
... frequency induction heaters will have the plate current drop. Solid-s tate induction heaters will have an automatic frequency shift to regulate for constant output. 304 / Practical Induction Heat Treating, Second Edition current density. The amount of current in an area (amps/square inch). The higher...
Abstract
This appendix is a glossary of terms related to induction heat treating.
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2015
DOI: 10.31399/asm.tb.piht2.9781627083119
EISBN: 978-1-62708-311-9
Book Chapter
Surface Finishing
Available to PurchaseSeries: ASM Technical Books
Publisher: ASM International
Published: 01 December 2008
DOI: 10.31399/asm.tb.ssde.t52310193
EISBN: 978-1-62708-286-0
... (194 °F) with a current density of between 1.0 and 3.0 amp/m 2 . Other baths using perchloric acid are technically good but carry the risk of explosion. Coloring Stainless steel passive films are so thin that they are quite invisible. Oxide films are thicker and through optical interference can...
Abstract
This chapter discusses the functions of surface treatments important for stainless steel, namely the removal of oxide scale and cleaning, brightening, and coloring of the stainless surface. Details on the main methods of producing aesthetic surface finishes are also provided.
Book Chapter
Machining
Available to PurchaseSeries: ASM Technical Books
Publisher: ASM International
Published: 01 November 2013
DOI: 10.31399/asm.tb.mfub.t53740213
EISBN: 978-1-62708-308-9
Abstract
This chapter covers the practical aspects of machining, particularly for turning, milling, drilling, and grinding operations. It begins with a discussion on machinability and its impact on quality and cost. It then describes the dimensional and surface finish tolerances that can be achieved through conventional machining methods, the mechanics of chip formation, the factors that affect tool wear, the selection and use of cutting fluids, and the determination of machining parameters based on force and power requirements. It also includes information on nontraditional machining processes such as electrical discharge, abrasive jet, and hydrodynamic machining, laser and electron beam machining, ultrasonic impact grinding, and electrical discharge wire cutting.
Book Chapter
Conversion Tables
Available to PurchaseSeries: ASM Technical Books
Publisher: ASM International
Published: 01 August 1999
DOI: 10.31399/asm.tb.lmcs.t66560459
EISBN: 978-1-62708-291-4
... to 51 Units To convert To Multiply by amp-hr angstrom atmosphere Btu(a) Btu(a)/ft2sec Btu(a)/ft2hr Btu(a)ft2/hr OF Btu(a)/lbm OF Btu(a) in.! ft2hroF circular mil curie degree dyne/ern- electron volt foot ft2 ft3 ft ofwater(c) ft-Ibf ft-lbf/sec meter coulomb pascal joule watt/m2 watt/m2 watt/m2°K Jlkg OK...
Abstract
This appendix includes a temperature conversion table, a table containing equivalent hardness numbers, and a unit conversion table.
Book Chapter
Melting and Conversion
Available to PurchaseSeries: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.stg2.t61280041
EISBN: 978-1-62708-267-9
Abstract
This chapter discusses the melting and conversion of superalloys and the solidification challenges they present. Superalloys have high solute content which can lead to untreatable defects if they solidify too slowly. These defects, called freckles, are highly detrimental to fatigue life. The chapter explains how and why freckles form as well as how they can be prevented. It describes the criteria for selecting the proper melting method for specific alloys based on melt segregation and chemistry requirements. It compares standard processes, including electric arc furnace/argon oxygen decarburization melting, vacuum induction melting, vacuum arc remelting, and electroslag remelting. It also addresses related issues such as consumable remelt quality, control anomalies, melt pool characteristics, and melt-related defects, and includes a section that discusses the processes involved in converting cast ingots into mill products.
Book Chapter
Cold Spray Applications in the Defense Industry
Available to PurchaseSeries: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460227
EISBN: 978-1-62708-285-3
.... , James B. , and Champagne V. , “ B1 Bomber-FEB Panel Repair by Cold Spray ,” AMP, R3S, South Dakota School of Mines and Applied Research Laboratory, Cold Spray Action Team 2012 Annual Conference , 2012 9.24 Widener C.A. , Carter M.J. , Hrabe R.H. , Hoiland B...
Abstract
High-pressure cold spray repair process has been used on a number of different applications in the defense industry. This chapter describes various applications for cold spray systems that have operating pressures greater than 2.4 MPa (350 psi) and operating temperatures greater than 500 deg C (930 deg F).
Book Chapter
Scanning Probe Microscopy for Nanoscale Semiconductor Device Analysis
Available to PurchaseSeries: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110485
EISBN: 978-1-62708-247-1
... is in the nanometer range with current sensitivity in femto-amps. Figure 22 shows a schematic for a typical C-AFM system. Figure 22 Schematic for a typical C-AFM system. Dielectric layers in the semiconductor industry have continued to decrease in thickness as new technologies evolve and C-AFM has...
Abstract
Scanning Probe Microscope (SPM) has an increasing important role in the development of nanoscale semiconductor technologies. This article presents a detailed discussion on various SPM techniques including Atomic Force Microscopy (AFM), Scanning Kelvin Probe Microscopy, Scanning Capacitance Microscopy, Scanning Spreading Resistance Microscopy, Conductive-AFM, Magnetic Force Microscopy, Scanning Surface Photo Voltage Microscopy, and Scanning Microwave Impedance Microscopy. An overview of each SPM technique is given along with examples of how each is used in the development of novel technologies, the monitoring of manufacturing processes, and the failure analysis of nanoscale semiconductor devices.
Book Chapter
Monitoring and Testing of Weld Corrosion
Available to PurchaseBook: Corrosion of Weldments
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2006
DOI: 10.31399/asm.tb.cw.t51820203
EISBN: 978-1-62708-339-3
... ). These are obtained simply by making a polished surface anodic in 10% oxalic acid solution for 1.5 min with a current density of 1.0 amp/cm 2 . This results in an “over etch” which facilitates interpretation. On specimens that are free of chromium carbides at grain boundaries the different rates of dissolution...
Abstract
This chapter addresses in-service monitoring and corrosion testing of weldments. Three categories of corrosion monitoring are discussed: direct testing of coupons, electrochemical techniques, and nondestructive testing techniques. The majority of the test methods for evaluating corrosion of weldments are used to assess intergranular corrosion of stainless steels and high-nickel alloys. Other applicable tests evaluate pitting and crevice corrosion, stress-corrosion cracking, and microbiologically influenced corrosion. Each of these test methods is reviewed in this chapter.
Book Chapter
Aluminum and Its Importance for Sustainability
Available to PurchaseSeries: ASM Technical Books
Publisher: ASM International
Published: 30 June 2023
DOI: 10.31399/asm.tb.atia.t59340453
EISBN: 978-1-62708-427-7
...) emissions ( Ref 20.2 ). By far, the biggest proportion (90–95%) of the emissions are specific to the upstream processing of bauxite to produce primary aluminum ( Chapter 2 ). There are two major ways to reduce the carbon footprint of the primary industry: (1) reduce the number of amps to make a kilogram...
Abstract
This chapter addresses the implications for increased aluminum usage on major issues such as climate change and solid waste management. The chapter also considers three approaches for decarbonizing aluminum-product production.
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