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Xray analysis

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2015
DOI: 10.31399/asm.tb.spsp2.t54410001
EISBN: 978-1-62708-265-5
... Spectroscopy (EDS). In Electron Probe Microanalyzers the spectra are resolved with better resolution by diffraction of the characteristic Xrays from single crystals in a process referred to as Wavelength Dispersive Spectroscopy (WDS) ( Ref 1.3 ). Auger Electron Spectroscopy The X-ray spectra generated...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110513
EISBN: 978-1-62708-247-1
..., failure signatures, environmental conditions, regional failure occurrences, user profile issues, and more in the failure analysis process to improve root cause findings. automotive electronics failure analysis failure anamnesis preventive risk evaluation root cause analysis Automotives...
Series: ASM Technical Books
Publisher: ASM International
Published: 30 November 2023
DOI: 10.31399/asm.tb.ceeg.9781627084475
EISBN: 978-1-62708-447-5
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2015
DOI: 10.31399/asm.tb.spsp2.9781627082655
EISBN: 978-1-62708-265-5
Series: ASM Technical Books
Publisher: ASM International
Published: 30 November 2023
DOI: 10.31399/asm.tb.ceeg.t59370187
EISBN: 978-1-62708-447-5
... dimensions are identified by the designer for fitness for function and assembly. The process capability is established by statistical analysis on a batch of 20 to 25 castings from the preproduction run. Dimensions that may change over time, due to variability such as pattern wear, are measured by gauging...