1-20 of 198 Search Results for

X-ray techniques

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110434
EISBN: 978-1-62708-247-1
... Abstract This article provides an overview of the most common micro-analytical technique in the failure analysis laboratory: energy dispersive X-ray spectroscopy (EDS). It discusses the general characteristics, advantages, and disadvantages of some of the X-ray detectors attached to the...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110062
EISBN: 978-1-62708-247-1
.... and Ning T. H. , Proc. 20th Conf. on Solid-state Devices and Mater. , Tokyo , 1988 , pp. 523 . [5] Haddad W.S. and Trebes J.E. . Developments in Limited Data Image Reconstruction Techniques for Ultrahigh-Resolution X-ray Tomographic Imaging of Microchips . in Developments...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
... as optical microscopy, scanning electron microscopy (SEM), transmission electron microscopy (TEM), and focused ion beam microscopy. Techniques based on spectroscopy principles such as optical emission spectroscopy, energy dispersive spectroscopy (EDS), wavelength dispersive spectroscopy, x-ray...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110447
EISBN: 978-1-62708-247-1
... semiconductor industry surface analysis time of flight static secondary ion mass spectroscopy transmission electron microscope-EDX X-ray photoelectron spectroscopy Some physical FA techniques with the focus on material characterization have been described. The purpose is to establish the manufacturing...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110025
EISBN: 978-1-62708-247-1
...-destructive localization techniques. The techniques considered for advanced fault isolation are magnetic current imaging for shorts and opens; infrared thermography for electrical shorts; time-domain-reflectometry for shorts and opens; scanning acoustic microscopy; and 2D/3D X-Ray microscopy. The individual...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2018
DOI: 10.31399/asm.tb.msisep.t59220085
EISBN: 978-1-62708-259-4
... emitted x-rays and the methods used to access it, namely wavelength and energy dispersive spectroscopy and electron backscattering diffraction techniques. It also describes the role of focused ion beam milling in sample preparation and provides information on atom probes, atomic force microscopes, and...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
... coatings. The techniques covered are optical microscopy, X-Ray diffraction, scanning electron microscopy, focused ion beam machining, electron probe microanalysis, transmission electron microscopy, and electron backscattered diffraction. The techniques also include electron channeling contrast imaging, X...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720233
EISBN: 978-1-62708-305-8
... Abstract This chapter discusses radiography methods using x-rays, gamma rays, and neutrons. It begins with a discussion on the applications and principles of radiography followed by sections providing information on the sources of radiation, classifications, and characteristics of x-ray tubes...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.t66910475
EISBN: 978-1-62708-250-1
... Thickness of material penetrated limited only by power of x- or γ-ray source. Easily interpreted images. Good for complex shapes. Large areas/volumes may be inspected at one time. γ-ray sources very portable. Both x-ray and γ-ray techniques suitable for on-site use. Nondestructive National and international...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110550
EISBN: 978-1-62708-247-1
... view. In this first phase, techniques are generally nondestructive to maintain the integrity of the sample and verify that data collected can match that of the test fail data. When a component and area of interest are identified, additional non-destructive imaging techniques, such as X-Ray imaging...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110563
EISBN: 978-1-62708-247-1
... frit is that the mating surfaces do not need to be as flat as the other methods. It is typically electrically insulating, which can be a problem or a feature. One advantage for FA is that these seals can be heated to decap them, and gaps are easy to see with SAM (Scanning Acoustic Microscopy) or X-ray...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110010
EISBN: 978-1-62708-247-1
... optical inspection, X-ray inspection, scanning acoustic microscopy, infrared (IR) microscopy, and electrical verification. The article discusses various fault isolation techniques to tackle the wide array of failure signatures, namely IR lock-in thermography, magnetic current imaging, time domain...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720393
EISBN: 978-1-62708-305-8
... applications also include electrical resistivity testing, eddy current, and magnetic bridge testing, magnetic particle inspection, ultrasonic testing, x-ray radiography, gas permeability testing, and gamma-ray (γ-ray) density determination. The capabilities and limitations of these techniques are summarized in...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400149
EISBN: 978-1-62708-258-7
...) X-ray photoelectron spectroscopy (XPS) Field ion microscopy (FIM) Atom probe (AP) microanalysis Low-energy ion-scattering spectroscopy (LEISS) Secondary ion mass spectroscopy (SIMS) Rutherford backscattering spectroscopy (RBS) Because of the highly specialized techniques...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
... Abstract This article covers common techniques for surface characterization, including the modern scanning electron microscopy and methods for the chemical characterization of surfaces by Auger electron spectroscopy, X-ray photoelectron spectroscopy, and time-of-flight secondary ion mass...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2008
DOI: 10.31399/asm.tb.emea.t52240631
EISBN: 978-1-62708-251-8
... Abstract This appendix explains how to identify crystallographic planes and directions. It shows how Miller indices, a system for specifying crystallographic planes within a unit cell, are determined for cubic and hexagonal systems. It also explains how x-ray diffraction techniques are used in...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720139
EISBN: 978-1-62708-305-8
... capabilities of related techniques of these methods are also covered. chemical composition dissolved gases high-temperature combustion inert gas fusion methods optical emission spectroscopy scanning auger microprobe surface analysis X-ray fluorescence spectroscopy THE OVERALL CHEMICAL...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2012
DOI: 10.31399/asm.tb.pdub.t53420363
EISBN: 978-1-62708-310-2
...-rays are a form of electromagnetic radiation that has high energies and short wavelengths. Because the wavelengths of x-rays are approximately the same as the atomic spacings on metallic lattices, a number of x-ray techniques have been developed over the years to determine crystalline structure...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110603
EISBN: 978-1-62708-247-1
... errors in part markings or labels; validity of logo, part number, lot code, date code, and/or Pb-free marking; marking technique; quality of marking; mold cavities; straightness, coplanarity, scratches, bridging or other defects in terminations; surface texture X-ray inspection Die size; bond wire...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780343
EISBN: 978-1-62708-281-5
... analysis, namely differential thermal analysis, thermogravimetric analysis, thermal-mechanical analysis, and dynamic mechanical analysis. The following sections provide details on X-ray diffraction for analyzing crystalline phases and on a minimal scheme for polymer analysis and characterization to assist...