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Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2008
DOI: 10.31399/asm.tb.emea.t52240631
EISBN: 978-1-62708-251-8
...-Scherrer powder method uses an x-ray beam of constant wavelength and a specimen consisting of thousands of tiny crystals. Since there are a large number of powder particles with many different orientations, the diffracted beam produces a cone of radiation. Different reflection cones are recorded on a film...
Book Chapter

By Anshuman Patra
Series: ASM Technical Books
Publisher: ASM International
Published: 30 September 2024
DOI: 10.31399/asm.tb.pmamfa.t59400027
EISBN: 978-1-62708-479-6
... Abstract This chapter explains how to measure the shape, size, microstructure, and composition of powders as well as their flowability and crystallization behavior. It presents detailed workflows and calculations based on SEM, TEM, FESEM, and STEM imaging, x-ray diffraction, differential...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
... Abstract This chapter describes some of the most effective tools for investigating boiler tube failures, including scanning electron microscopy, optical emission spectroscopy, atomic absorption spectroscopy, x-ray fluorescence spectroscopy, x-ray diffraction, and x-ray photoelectron...
Book Chapter

By D. Srinivasan
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
... No. Characterization technique Key aspect for cold-sprayed coating 1 Optical microscopy Coating thickness, coating porosity, substrate-coating interface integrity, coating porosity after heat treatment 2 X-ray diffraction Feedstock powder phase evolution, as-sprayed and heat treated coating phase...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 30 September 2024
DOI: 10.31399/asm.tb.pmamfa.t59400391
EISBN: 978-1-62708-479-6
... manufacturing XRD x-ray diffraction Nomenclature of symbols Table A2 Nomenclature of symbols Symbol Definition a 1 lattice parameter of solute 1 (pure) a 2 lattice parameter of solute 2 (pure) A lattice parameter of alloy; angle of repose Ar Archimedes number Β...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2008
DOI: 10.31399/asm.tb.emea.9781627082518
EISBN: 978-1-62708-251-8
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400149
EISBN: 978-1-62708-258-7
... on the surface of a specimen can be analyzed for the compounds present. As an example of the use of a diffractometer, the oxidation product on a heavily scaled steel part was analyzed by x-ray diffraction. The oxide was scraped from the surface of the part, ground into a fine powder, and glued to a glass slide...
Image
Published: 01 June 2016
Fig. 5.4 (a) X-ray diffractograms comparing IN625 (nickel-base superalloy) powders and cold-sprayed IN625 coating reveal broadening of the diffraction peaks in the coating, indicative of macroscopic strain. (b) Hall-Williamson plot taken from the peak broadening data to calculate the extent More
Image
Published: 01 June 2016
Fig. 5.6 X-ray diffraction patterns comparing (a) warm-sprayed and (b) cold-sprayed titanium coating, along with the respective starting powders, indicate the presence of TiO oxides along with the metal in the warm-sprayed coating. Williamson-Hall plots for the (c) warm-sprayed and (d) cold More
Image
Published: 30 September 2024
in lattice strain, which can be elucidated by an increase in broadening and a reduction in intensity of x-ray diffraction peaks. Source: Ref 3.7 More
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 May 2018
DOI: 10.31399/asm.tb.hma.t59250047
EISBN: 978-1-62708-287-7
... Abstract This chapter covers the early studies and various discoveries by metals researchers to study the internal structure of metals. The topics covered include light microscopy, phase diagrams, X-ray diffraction, principles of precipitation hardening, and dislocation theory...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720139
EISBN: 978-1-62708-305-8
... sensitivity of ~0.005% and a precision for quantitative analysis of ~0.2% relative, or 0.005% absolute, whichever is greater. For powders, the sample size is several grams pressed into a pellet. Powder samples are typically attached to substrates not produced by x-ray or are pressed into pellets. For bulk...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2012
DOI: 10.31399/asm.tb.pdub.t53420239
EISBN: 978-1-62708-310-2
... diagrams. These include thermal analysis (TA), metallography, X-ray diffraction (XRD), dilatometry, electrical resistance measurement, and magnetic analysis methods, among others. All of these methods are based on the principle that when a phase transition in an alloy occurs, its physical and chemical...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430343
EISBN: 978-1-62708-253-2
... Amount by wt.% Oxygen 15.79 Aluminum 0.76 Silicon 0.75 Chromium 1.38 Iron 79.13 Nickel 0.19 For the purpose of phase identification, the scale sample was subjected to x-ray diffraction (XRD) analysis using a powder x-ray diffractometer, and the results of analysis...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780343
EISBN: 978-1-62708-281-5
..., for example, Cu k-alpha at 1.542 Å. Crystal diffraction follows Bragg’s law: n λ = 2 d  sine  θ where n is a constant (usually 1), λ is the wavelength of the x-ray, d is the interplanar spacing of the crystalline material, and sine θ is the experimental diffraction angle. A powder...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270019
EISBN: 978-1-62708-301-0
... successfully applied to detect flaws in metals, ceramics, composites, and microelectronic components. X-ray Diffraction X-ray diffraction is a common method for identifying phases in metallic materials, corrosion products, and surface deposits. Several cases of component failures due to locked...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400245
EISBN: 978-1-62708-258-7
... at the root. It may be a metal backing ring or strip; a pass of weld metal; or a nonmetal such as carbon, granular ux, or a protective gas. backing lm. A lm used as auxiliary support for the thin replica or specimen-supporting lm. back re ection. The diffraction of x-rays at a Bragg angle approaching 90...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2012
DOI: 10.31399/asm.tb.pdub.t53420363
EISBN: 978-1-62708-310-2
... is used mostly for determining the structure of single crystals. The Debye-Scherrer powder method uses an x-ray beam of constant wavelength and a specimen consisting of thousands of tiny crystals. Because there are a large number of powder particles with many different orientations, the diffracted beam...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.9781627082587
EISBN: 978-1-62708-258-7
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
... Abstract This article covers common techniques for surface characterization, including the modern scanning electron microscopy and methods for the chemical characterization of surfaces by Auger electron spectroscopy, X-ray photoelectron spectroscopy, and time-of-flight secondary ion mass...