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X-ray photoelectron spectroscopy

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
... Abstract This chapter describes some of the most effective tools for investigating boiler tube failures, including scanning electron microscopy, optical emission spectroscopy, atomic absorption spectroscopy, x-ray fluorescence spectroscopy, x-ray diffraction, and x-ray photoelectron...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110447
EISBN: 978-1-62708-247-1
... six methods used in semiconductor industry are: Auger spectroscopy, dynamic secondary ion mass spectroscopy, time of flight static secondary ion mass spectroscopy (ToF-SIMS), X-ray photoelectron spectroscopy, scanning electron microscope-energy dispersive X-ray spectroscopy (SEM-EDX), and transmission...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
...-Ray photoelectron spectroscopy, X-ray fluorescence, Auger electron spectroscopy, Raman spectroscopy, oxygen analysis, and nanoindentation. cold-sprayed coatings residual-stress analysis hardness bond adhesion strength microscopy spectroscopy diffraction MATERIALS CHARACTERIZATION...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
... Abstract This article covers common techniques for surface characterization, including the modern scanning electron microscopy and methods for the chemical characterization of surfaces by Auger electron spectroscopy, X-ray photoelectron spectroscopy, and time-of-flight secondary ion mass...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720139
EISBN: 978-1-62708-305-8
... is the only method able to detect hydrogen with microscopic spatial resolution). The primary ion beam can be rastered over the surface, providing for high sensitivity elemental mapping. Because it removes material from the surface, it also provides for depth profiling. X-ray photoelectron spectroscopy...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.9781627082815
EISBN: 978-1-62708-281-5
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.t66910475
EISBN: 978-1-62708-250-1
... electrons emitted from a surface excited by an x-ray beam or an electron beam. (Techniques known as x-ray photoelectron spectroscopy, XPS, or Auger electron spectroscopy, AES Quantitative chemical analysis of outermost atomic layers of surfaces Only true “surface analysis” techniques, sampling surface...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270019
EISBN: 978-1-62708-301-0
... to 1 μm Auger electron spectroscopy: Applicable to all elements except hydrogen and helium; accessible range, >0.1%; accuracy, 5 to 10%; analysis depth, 10 to 20 Å X-ray photoelectron spectroscopy: Applicable to all elements except hydrogen and helium; accessible range, >0.01...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110434
EISBN: 978-1-62708-247-1
... electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS, also knows as ESCA), secondary ion mass spectrometry (SIMS), Rutherford backscattering spectrometry (RBS), Fourier transform infrared spectroscopy (FTIR), and total-reflection x-ray fluorescence (TXRF). Each of these capabilities is given...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780343
EISBN: 978-1-62708-281-5
... Polymer morphology Polymer features and defects X-ray photoelectron spectroscopy (XPS) Elemental concentrations, oxidation states Chemical composition of surfaces, determination of surface species Auger electron spectroscopy (AES) Elemental concentrations Chemical compositions of surfaces...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400149
EISBN: 978-1-62708-258-7
... of a specimen, there are a number of specialized, sophisticated instruments and techniques available to the metallographer. These instruments are usually located in a research laboratory or specialized testing laboratory and include: Auger electron spectroscopy (AES) X-ray photoelectron spectroscopy...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780359
EISBN: 978-1-62708-281-5
... spectroscopy, x-ray photoelectron spectroscopy, and electron spectroscopy for chemical analysis, are specifically used to characterize very shallow surface layers. These techniques can be used to analyze material composition but are particularly suited for the analysis of surface contaminants ( Ref 10 ). While...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 1999
DOI: 10.31399/asm.tb.caaa.t67870191
EISBN: 978-1-62708-299-0
... 236 10.1016/0378-5963(85)90056-X 20. Davenport A.J. , Isaacs H.S. , and Kendig M.W. , Corros. Sci. , Vol 32 , 1991 , p 653 10.1016/0010-938X(91)90113-4 21. Wilson L. and Hinton B.R.W. , International Patent Application PCT/AU/88/00060 , 3 March 1988...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 2009
DOI: 10.31399/asm.tb.bcp.t52230459
EISBN: 978-1-62708-298-3
... Thermal Insulation ,” Annual Book of ASTM Standards , Vol 4.06 , ASTM International Birkbeck J.C. , Kuehler N.L. , Williams D.L. , and Moddeman W.E. , 1999 . X-Ray Photoelectron Spectroscopic Examinations of Beryllium Metal Surfaces Exposed to Chlorinated Solvents , Surf...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780146
EISBN: 978-1-62708-281-5
... ). The oxidation of HDPE and polymer degradations have been monitored by 13 C NMR ( Ref 33 ). Electron spin resonance (ESR) has been used to monitor the production of macroradicals and low-molecular-weight radicals resulting from the cleavage of polymer chains ( Ref 34 ). The x-ray photoelectron analysis...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.9781627082587
EISBN: 978-1-62708-258-7
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 July 2009
DOI: 10.31399/asm.tb.bcp.t52230523
EISBN: 978-1-62708-298-3
... . Status of Beryllium development for Fusion Applications , Fusion Eng. Des. , Vol 27 , p 179 – 190 10.1016/0920-3796(95)90125-6 Birkbeck J.C. , Kuehler N.L. , Williams D.L. , and Moddeman W.E. , 1999 . X-Ray Photoelectron Spectroscopic Examinations of Beryllium Metal...