1-20 of 31 Search Results for

X-ray photoelectron spectroscopy

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Image
Published: 01 December 2003
Fig. 7 Low-resolution x-ray photoelectron spectroscopy spectrum of an ethylene-chlorotrifluoroethylene copolymer More
Image
Published: 01 December 2003
Fig. 9 High-resolution x-ray photoelectron spectroscopy spectrum of the carbon 1s region from Fig. 7 . (a) Raw data. (b) Computer curve-fit, showing four individual components More
Image
Published: 01 December 2003
Fig. 10 X-ray photoelectron spectroscopy high-resolution spectrum of polyethylene terephthalate More
Image
Published: 01 December 2003
Fig. 12 Block diagram of a typical x-ray photoelectron spectroscopy spectrometer. UHV, ultrahigh vacuum More
Image
Published: 01 December 2003
Fig. 18 Schematic models derived from x-ray photoelectron spectroscopy and Auger electron spectroscopy analysis of (a) high-strength and (b) low-strength polyester-adhesive-brass laminates More
Image
Published: 01 December 2003
Fig. 22 X-ray photoelectron spectroscopy-ion milling depth profiles comparing laminates. (a) X laminate, 5 nm (50 Å)/min. (b) Y laminate, 5 nm (50 Å)/min More
Image
Published: 01 December 2003
Fig. 25 X-ray photoelectron spectroscopy survey spectra of the opposite sides of the RC-205 material after removal of release sheets. (a) Polyester side. (b) Polypropylene side More
Image
Published: 01 December 2003
Fig. 26 X-ray photoelectron spectroscopy survey spectra of the failure surfaces from white, spotty delaminations. (a) Board surface. (b) Prepreg surface More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
... Abstract This chapter describes some of the most effective tools for investigating boiler tube failures, including scanning electron microscopy, optical emission spectroscopy, atomic absorption spectroscopy, x-ray fluorescence spectroscopy, x-ray diffraction, and x-ray photoelectron...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110447
EISBN: 978-1-62708-247-1
... six methods used in semiconductor industry are: Auger spectroscopy, dynamic secondary ion mass spectroscopy, time of flight static secondary ion mass spectroscopy (ToF-SIMS), X-ray photoelectron spectroscopy, scanning electron microscope-energy dispersive X-ray spectroscopy (SEM-EDX), and transmission...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
...-Ray photoelectron spectroscopy, X-ray fluorescence, Auger electron spectroscopy, Raman spectroscopy, oxygen analysis, and nanoindentation. cold-sprayed coatings residual-stress analysis hardness bond adhesion strength microscopy spectroscopy diffraction MATERIALS CHARACTERIZATION...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
... Abstract This article covers common techniques for surface characterization, including the modern scanning electron microscopy and methods for the chemical characterization of surfaces by Auger electron spectroscopy, X-ray photoelectron spectroscopy, and time-of-flight secondary ion mass...
Image
Published: 01 December 2003
Fig. 11 Angular-dependent method for determining compositional gradients with x-ray photoelectron spectroscopy. Depth analyzed is proportional to sin θ. More
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720139
EISBN: 978-1-62708-305-8
..., it also provides for depth profiling. X-Ray Photoelectron Spectroscopy (XPS) X-ray photoelectron spectroscopy (XPS) directs a single energy x-ray beam onto the surface. This beam penetrates 10 to 100 μm into the sample, interacting with atoms and ejecting photoelectrons from their inner shells...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.9781627082815
EISBN: 978-1-62708-281-5
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780433
EISBN: 978-1-62708-281-5
... chloride W W 1 WDS XMC XPS XRD µ Abbreviations and Symbols / 435 wear volume, wear rate wear resistance wavelength-dispersive spectroscopy extra-high-strength molding compound x-ray photoelectron spectroscopy x-ray diffraction analysis surface energy, shear strain shear strain rate loss angle...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110434
EISBN: 978-1-62708-247-1
... (with thin samples), wavelength dispersive x-ray spectroscopy (WDS), Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS, also knows as ESCA), secondary ion mass spectrometry (SIMS), Rutherford backscattering spectrometry (RBS), Fourier transform infrared spectroscopy (FTIR), and total...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270019
EISBN: 978-1-62708-301-0
...: Applicable to all elements except hydrogen and helium; accessible range, >0.1%; accuracy, 5 to 10%; analysis depth, 10 to 20 Å X-ray photoelectron spectroscopy: Applicable to all elements except hydrogen and helium; accessible range, >0.01%; accuracy, qualitative and semiquantitative; analysis...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.t66910475
EISBN: 978-1-62708-250-1
... photoelectrons or Auger electrons emitted from a surface excited by an x-ray beam or an electron beam. (Techniques known as x-ray photoelectron spectroscopy, XPS, or Auger electron spectroscopy, AES Quantitative chemical analysis of outermost atomic layers of surfaces Only true “surface analysis” techniques...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780343
EISBN: 978-1-62708-281-5
... (SEM) Surface and particle morphology Particle size and shape, surface features Transmission electron microscopy Polymer morphology Polymer features and defects X-ray photoelectron spectroscopy (XPS) Elemental concentrations, oxidation states Chemical composition of surfaces, determination...