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X-ray diffraction

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Published: 01 December 2018
Fig. 6.65 X-ray diffraction profile of scale sample showing different diffraction peaks More
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Published: 01 December 2018
Fig. 6.152 X-ray diffraction profile of scale sample showing different diffraction peaks More
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Published: 01 March 2002
Fig. 6.30 X-ray diffraction data showing the oxides present in scale on a steel surface. Each peak represents a particular 2θ value and corresponding d -spacing for a constituent. Each peak is labeled with the constituent matching that particular 2θ angle. The vertical axis (intensity More
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Published: 01 June 2016
Fig. 5.5 X-ray diffraction patterns from (a) cold-sprayed titanium coating after removal of progressive layers from the coating compared with α titanium, indicating no phase transformation taking place in the coating, and (b) cold-sprayed WC-Co without any decarburization after the cold spray More
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Published: 01 June 2016
Fig. 5.6 X-ray diffraction patterns comparing (a) warm-sprayed and (b) cold-sprayed titanium coating, along with the respective starting powders, indicate the presence of TiO oxides along with the metal in the warm-sprayed coating. Williamson-Hall plots for the (c) warm-sprayed and (d) cold More
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Published: 01 June 2016
Fig. 5.26 Residual stress measured by means of x-ray diffraction sin 2 Ψ method on various cold-sprayed coatings: (a) aluminum, (b) aluminum alloy, (c) copper alloy, and (d) magnesium alloy. Source: Ref 5.24 , 5.57 More
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Published: 01 December 2018
Fig. 5.20 X-ray diffraction pattern of a scale on hot-rolled steel. Source: Ref 5.17 More
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Published: 01 December 2018
Fig. 5.21 X-ray diffraction profile for corrosion products formed on steel surface. Source: Ref 5.18 More
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Published: 01 December 2018
Fig. 5.22 X-ray diffraction pattern of anatase and brookite. Source: Ref 5.19 More
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Published: 01 December 2018
Fig. 5.25 Schematic showing basic principle of x-ray diffraction. More
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Published: 01 December 2003
Fig. 7 X-ray diffraction patterns of surface layers produced on 3% Cr-Mo-V steel plasma nitrided at 540 °C (1000 °F) for (a) 4 h, (b) 25 h, (c) 144 h, (d) 289 h, and (e) 400 h. Cr K α radiation More
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Published: 01 March 2012
Fig. 12.6 Use of X-ray diffraction (XRD) measurements of the lattice parameter to determine a point on a solvus curve. Adapted from Ref 12.2 More
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Published: 01 July 1997
Fig. 18 X-ray diffraction trace of fusion zone in Ti-6Al-4V sheet welded using a tantalum shim, showing peaks that identify hexagonal structures More
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Published: 01 March 2006
Fig. 10.13 Observation of dislocations in silicon by x-ray diffraction. Source: Ref 10.16 More
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Published: 01 March 2006
Fig. A.18 A complex jungle of dislocations observed in silicon by x-ray diffraction. Source: Ref A.31 More
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Published: 01 December 2003
Fig. 35 X-ray diffraction curve of unoriented polyethylene. (a) At 100 °C (212 °F). (b) At 120 °C (250 °F) More
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Published: 01 December 2003
Fig. 36 X-ray diffraction curve of two-dimensional ordering in a polymer, short-range ordering. Source: Ref 38 More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2008
DOI: 10.31399/asm.tb.emea.t52240631
EISBN: 978-1-62708-251-8
... Abstract This appendix explains how to identify crystallographic planes and directions. It shows how Miller indices, a system for specifying crystallographic planes within a unit cell, are determined for cubic and hexagonal systems. It also explains how x-ray diffraction techniques are used...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
... Abstract This chapter describes some of the most effective tools for investigating boiler tube failures, including scanning electron microscopy, optical emission spectroscopy, atomic absorption spectroscopy, x-ray fluorescence spectroscopy, x-ray diffraction, and x-ray photoelectron...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
... coatings. The techniques covered are optical microscopy, X-Ray diffraction, scanning electron microscopy, focused ion beam machining, electron probe microanalysis, transmission electron microscopy, and electron backscattered diffraction. The techniques also include electron channeling contrast imaging, X...