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SEM/EDS analysis

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Published: 01 August 2018
Fig. 8.73 (a) Oxide inclusion in as-cast steel. The sperical shape of the inclusion may indicate that it precipitated in the liquid state of the steel. SEM, SE. (b) EDS spectrum from the nonmetallic inclusion. The calculated quantitative analysis from the EDS data is listed on the right More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110434
EISBN: 978-1-62708-247-1
... down to a composition of about 0.1%, or with spatial resolution and depth sensitivity of 1 micron or less, so it is a reasonably powerful technique for many failure analysis problems. Properties of analytical techniques including energy dispersive x-ray spectroscope (EDS) in the SEM or STEM...
Image
Published: 01 August 2018
Fig. 8.76 (a) Sulfide nonmetallic inclusion in as-cast steel. SEM, BE. No etching (b) EDS spectrum of the inclusion. Quantitative analysis calculated from EDS results. Manganese sulfide. More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400149
EISBN: 978-1-62708-258-7
... similar to those found on a SEM. Wavelength dispersive spectroscopy is much more time-consuming than EDS and is thus used for a more accurate and detailed analysis. Fig. 6.24 An electron probe microanalyzer The microprobe can also generate images of the backscattered and secondary electrons...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270133
EISBN: 978-1-62708-301-0
... Abstract A second-stage compressor blade in an aircraft engine fractured after 21 h of service. The remaining portion of the blade was removed and examined as were several adjacent blades. Based on the results of SEM fractography, microstructural analysis, and hardness testing, the blade failed...
Image
Published: 01 August 2018
Fig. 8.74 (a) Oxide inclusion in as-cast steel. The inclusion is composed of two phases with different chemical compositions. SEM, BE. (b) The dark, polygonal phase is an oxide containing magnesium and aluminum, probably high melting point spinel (MgAl 2 O 4 ). Its shape indicates it has More
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
... (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS). Here, XPS is emphasized because of its preponderance in use for polymer analysis. Chemical characterization of surfaces by EDS instrumentation, which is commonly a module integrated with modern SEMs, is discussed in the section...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270025
EISBN: 978-1-62708-301-0
..., and these are characteristic of the chemical elements present in the specimen. Thus, with an x-ray spectrometer used in conjunction with a SEM, in situ chemical analysis can be carried out. This facility is very useful in failure analysis. For example, nonmetallic inclusions are deleterious in metal components. Cracks can...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.9781627083010
EISBN: 978-1-62708-301-0
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270107
EISBN: 978-1-62708-301-0
.... Testing Procedure and Results FRP Epoxy Scanning Electron Fractography The two tear surfaces shown as A and B in Fig. CH18.2 were Fig. CH18.1 Sketch showing the fastening of the rib to the blade examined in a SEM. One of them, A, was found corroded. The 108 / Failure Analysis of Engineering Structures...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430149
EISBN: 978-1-62708-253-2
... scales, 250×; and (b) SEM after metallography at location near failure showing fissures, 1000× Energy dispersive spectroscopy (EDS) analysis on the ID surface showed the presence of oxygen, magnesium, aluminum, silicon, calcium, phosphorus, and zinc, whereas the OD surface showed the presence...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430325
EISBN: 978-1-62708-253-2
... surface of the tube during EDS analysis. Normally such contamination is not observed on the steam-side scale. In the superheater steam coils, the source of water must be attemperation. The majority of the evidence was obtained through SEM as well as microstructural examination, wherein the blunt nature...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
... keV. Incorporating a STEM detector in a dual column FIB/SEM can be useful tool for localizing a defect in planar TEM section, prior to x-section analysis. Elemental Analysis Elemental composition of device features and defects can be characterized using energy dispersive spectroscopy (EDS) [1...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 September 2008
DOI: 10.31399/asm.tb.fahtsc.t51130351
EISBN: 978-1-62708-284-6
... features of the fracture surface as observed by the SEM. (a) Overall view of the fracture surface (111 μm). (b) Intergranular fracture observed on the fracture surface (10 μm) A hydrogen analysis was conducted on the MLG lever attach pin before and after baking for 24 h at 190 °C (375 °F...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270130
EISBN: 978-1-62708-301-0
... was tempered martensite, with partial spheroidization (Fig. CH28.6). Chemical Analysis Semiquantitative analysis of one of the bolts by EDAX in a SEM showed the presence of 14% Cr, 5% Ni, and 1.76% Cu, apart from Fe, indicating that the steel can be classi ed into one of the precipitation hardenable grades...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430290
EISBN: 978-1-62708-253-2
.... 6.124 SEM micrographs. (a) OD edge with a deep crack at heat-affected zone, 50×. (b) Intergranular cracking network on brittle fracture surface, 250× Besides the other usual contaminants, an EDS analysis indicated the presence of sulfur, chlorine (as chloride), and sodium along with moisture...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
... an image analyzer, SEM in conjunction with EDS, XRD, emission spectroscopy, XRF, atomic absorption spectrometry (AAS), and surface analysis techniques such as XPS or electron spectroscopy for chemical analysis. While some of these techniques are qualitative in nature, others provide quantitative...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270087
EISBN: 978-1-62708-301-0
... of crack initiation could not be established, material defects, improper root loading, and high operating temperatures were ruled out. This chapter describes how investigators came to their conclusions and what they learned through visual and SEM examination and qualitative elemental analysis. It includes...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2022
DOI: 10.31399/asm.tb.tstap.t56040055
EISBN: 978-1-62708-428-4
... Institute of Technology, Center for Advanced Coatings To distinguish a valid pore or crack from an artifact pore or crack, SEM images combined with energy dispersive spectrometry (EDS) can be useful. Figure 7 highlights the SEM image of Sample B bond coating at higher magnification; the color maps...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720139
EISBN: 978-1-62708-305-8
... a SEM. A secondary electron detector provides the capability to image the surface and locate areas of particular interest, as in a scanning electron microscope. However, the primary tool for chemical analysis is the Auger electron detector. Fig. 9 Schematic of a scanning Auger microprobe. Source...