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Published: 01 November 2019
Figure 8 Reflection at normal incidence of a plane wave at a delamination (left) and at a bonded interface (right). More
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Published: 01 November 2019
Figure 3 Reflection signal peak position vs. micrometer position [9] . More
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Published: 01 November 2019
Figure 14 Backside photon emission (a) without SIL, refraction and total reflection at the silicon surface occurs (b) with SIL refraction and total reflection is prevented. More
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Published: 01 November 2019
Figure 20 (a) Frontside reflection image of a diode test structure, n + diffusion under left metal pad. (b) PE image of injected minority carrier density outside space charge region; no PE signal above metal (c) PE line profile to determine the diffusion length. More
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Published: 01 December 1984
Figure 4-2 Schematic illustrating the laws of refraction and reflection. More
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Published: 01 April 2013
Fig. 13 Schematic of the effect of casting shapes on reflection and oscilloscope screen display of sound beams. See text for discussion. Source: Ref 2 More
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Published: 01 November 2010
Fig. 6.8 Use of light reflection as a tool for checking the sample plane More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030089
EISBN: 978-1-62708-349-2
... etched for 30 s using the CrO 3 /HNO 3 etch described in Table 5.3 . Reflected-light phase contrast, 50× objective Fig. 5.17 Etched (CrO 3 /HNO 3 , Table 5.3 ) composite specimen after being subjected to a varied solvent-sensitivity stress test. Darker striations show the stress effects...
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Published: 01 August 2012
Fig. 15.12 Principle of operation of direct reflective photoelectric sensors More
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Published: 01 November 2019
Figure 20 a) Reflected light and b) LSIM image using a 5mW, 540nm laser. A bottom level comb finger from a stack of three shown shorting to the ground plane is identified. More
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Published: 01 November 2019
Figure 36 Laser Scanning Microscope (LSM) forms an image by detecting reflections from a raster scanned laser. The example is a backside image showing interference lines caused by laser light waves reflecting from both surfaces of the die, which causes destructive and constructive interference. More
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Published: 01 November 2019
Figure 9 Ideal acoustic reflectivity (R) versus acoustic impedance of the second layer (Z 2 ) for plastic packages (Curve 1) and for ceramic packages (Curve 2). [Z] =1 Rayl = 1 kg/(m 2 s) More
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Published: 01 November 2019
Figure 15 Moduli of reflectance and transmission vs. the angle of incidence at a fluid - solid interface. Fluid: water @ 21°C. Solid: fused silica. More
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Published: 01 November 2019
Figure 12 An OBIC image (left) showing the position of diffusions on an IC. A reflected light image (right) is shown for registration. More
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Published: 01 November 2019
Figure 1 A low magnification LADA overlay image. The background is the reflected laser scanned image of the die. The false color overlay are the LADA sites. Green sites indicate where the laser pushes the DUT towards passing, and red sites indicate where the laser pushed the DUT towards More
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Published: 01 November 2019
Figure 13 (a) (c) Reflected laser image and (b) (d) frequency map signals on random digital logic of a 28 nm technology device. (a) and (b) are performed on a water-cooled tester; (c) and (d) are performed on an air-cooled tester. Bounding boxes indicate scan cells locations More
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Published: 01 November 2019
Figure 17 Scan cells’ bounding boxes overlay with (a) reflected laser and (b) laser-assisted device-alteration signal images. More
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Published: 01 November 2019
Figure 24 In darkfield, objects illuminated from outside the field reflect light into the field of view, appearing bright against a dark field. In brightfield the field is illuminated, and objects tend to reflect light out of the field, and so appear dark. More
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Published: 01 December 1984
Figure 4-12 Relative reflectivity of polished and etched (4% picral) carbon steel as influenced by the amount of ferrite and pearlite. More
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Published: 01 December 1984
Figure 4-23 Schematic of Linnik system reflected light two-beam interference microscope. (Courtesy of E. Leitz, Inc.) More