1-9 of 9 Search Results for

Pareto charts

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780011
EISBN: 978-1-62708-268-6
... short 156 Shelf too long 48 Pareto data are typically organized into a bar chart, showing the most frequently occurring defect on the left side of the chart, and then showing bars for each defect to the right in descending order of occurrence. In the case described previously, the shelving...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2000
DOI: 10.31399/asm.tb.aet.t68260233
EISBN: 978-1-62708-336-2
... and analysis for those who are not familiar with these techniques. Wolf ( Ref 2 ) reviewed the application of five of the seven tools, including Pareto charts, flow process charts, histograms, run charts, and control charts of statistical process control (SPC) to the aluminum extrusion and drawn-tube processes...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110506
EISBN: 978-1-62708-247-1
... Comprehensive report generation – wafer maps with thumbnail bitmap images, trend charts, pareto charts Integration with business practices – seamless interaction with manufacturing operations, file formats and data structures Data sharing - import data from, or export data to other yield analysis tools...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110262
EISBN: 978-1-62708-247-1
... and fabless companies rely on FA results to build defect pareto charts and identify problems that have the most impact to manufacturing yield ramp. Figure 2 Typical IC manufacturing time to market cycle Time to market can be shortened by finding root cause failures earlier and implementing...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110001
EISBN: 978-1-62708-247-1
... of stacking the suspected failing nets from all dies to generate a pareto chart. Net 17043 is assessed to be more critical since most dies fail the same path. Therefore, they should be prioritized for FA [10 , 11] . In this way, valuable FA resources are invested to achieve optimum yield learning. List...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.horfi.9781627082563
EISBN: 978-1-62708-256-3
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.horfi.t51180197
EISBN: 978-1-62708-256-3
... forces between at, parallel dies. The sides bulge outward, while the other surfaces become essentially at and parallel. Pareto diagram. A frequency diagram used to plot the relative impor- tance of the differences between groups of data in the form of a bar chart. Items with the greatest to lowest...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.horfi.t51180061
EISBN: 978-1-62708-256-3
... can take all the failures in the database and present them on a statistical chart like a Pareto diagram ( Fig. 1 ), the data may indicate that 80% of the company failures revolve around the top three failure mechanisms. From an economic point of view, the statistical database has just provided...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110447
EISBN: 978-1-62708-247-1
... in product by doing finger print of the trace elements in this small particle. Introduction Based on our failure Pareto, 30-40% of the field return failures in semiconductor products are caused by a process or material aberration. To solve the problem and prevent re-occurrence, our manufacturing needs...