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Pareto charts

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780011
EISBN: 978-1-62708-268-6
... occurring to least frequently occurring Defect Frequency during preceding 30 days Hole not drilled 687 Weld porosity 435 Paint runs 382 Missing paint 299 Shelf too short 156 Shelf too long 48 Pareto data are typically organized into a bar chart, showing the most...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110506
EISBN: 978-1-62708-247-1
... data mining – automatic failure mode classification (AFC), statistical data analysis, root cause theorization Comprehensive report generation – wafer maps with thumbnail bitmap images, trend charts, pareto charts Integration with business practices – seamless interaction with manufacturing...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2000
DOI: 10.31399/asm.tb.aet.t68260233
EISBN: 978-1-62708-336-2
... and analysis for those who are not familiar with these techniques. Wolf ( Ref 2 ) reviewed the application of five of the seven tools, including Pareto charts, flow process charts, histograms, run charts, and control charts of statistical process control (SPC) to the aluminum extrusion and drawn-tube processes...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110001
EISBN: 978-1-62708-247-1
... of stacking the suspected failing nets from all dies to generate a pareto chart. Net 17043 is assessed to be more critical since most dies fail the same path. Therefore, they should be prioritized for FA [10 , 11] . In this way, valuable FA resources are invested to achieve optimum yield learning...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110262
EISBN: 978-1-62708-247-1
... pareto charts and identify problems that have the most impact to manufacturing yield ramp. Figure 2 Typical IC manufacturing time to market cycle Time to market can be shortened by finding root cause failures earlier and implementing manufacturing changes faster to achieve target yields...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.horfi.9781627082563
EISBN: 978-1-62708-256-3
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.horfi.t51180061
EISBN: 978-1-62708-256-3
... the failures in the database and present them on a statistical chart like a Pareto diagram ( Fig. 1 ), the data may indicate that 80% of the company failures revolve around the top three failure mechanisms. From an economic point of view, the statistical database has just provided the direction as to how...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110447
EISBN: 978-1-62708-247-1
... failure Pareto, 30-40% of the field return failures in semiconductor products are caused by a process or material aberration. To solve the problem and prevent re-occurrence, our manufacturing needs to know the details of the material related defect. For this, there are several analytical methods available...