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Pareto analysis

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780011
EISBN: 978-1-62708-268-6
... the highest cost. It provides information on the use of Pareto analyses from both frequency-of-occurrence and cost perspectives to target specific areas for improvement. hidden factory Pareto analysis NEARLY EVERY ORGANIZATION has experienced “showstopper” system failures, similar to the one...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110506
EISBN: 978-1-62708-247-1
... analysis, defect modeling, layout link to schematics and netlist names Powerful data mining – automatic failure mode classification (AFC), statistical data analysis, root cause theorization Comprehensive report generation – wafer maps with thumbnail bitmap images, trend charts, pareto charts...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110001
EISBN: 978-1-62708-247-1
... holder ring [13] . Figure 8 Dead zones (dotted lined) on the wafer where analysis is obstructed. Figure 5 (a) Pogo tower (hard dock) and (b) cable docking (soft dock) solution. Figure 2 Wafer-level failure analysis flow. Figure 1 Stacked Pareto of suspected...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2000
DOI: 10.31399/asm.tb.aet.t68260233
EISBN: 978-1-62708-336-2
... experimentation and analysis for those who are not familiar with these techniques. Wolf ( Ref 2 ) reviewed the application of five of the seven tools, including Pareto charts, flow process charts, histograms, run charts, and control charts of statistical process control (SPC) to the aluminum extrusion and drawn...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110262
EISBN: 978-1-62708-247-1
.... In efforts to improve the time to market (TTM) cycle for semiconductor products (see Figure 2 ) both fab and fabless companies rely on FA results to build defect pareto charts and identify problems that have the most impact to manufacturing yield ramp. To maximize market profitability, it is imperative...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.horfi.t51180061
EISBN: 978-1-62708-256-3
... and Investigations subcommittee examine a damaged Firestone 500 tire during that committee’s 1978 hearings on the safety of the tire Fig. 1 A Pareto diagram is used to plot the relative importance of the differences between groups of data—in this case, the frequency of different types of failure...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.horfi.9781627082563
EISBN: 978-1-62708-256-3
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110447
EISBN: 978-1-62708-247-1
... of QFPs (top) and BGAs (bottom) Figure 3 Optical images of typical QFP leads (left) and BGA sphere (right). The green squares indicate areas that were analyzed with AES surface and AES depth profiling. Figure 4 The AES analysis of plated lead surface is shown at top, while the AES...