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Leakage

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720345
EISBN: 978-1-62708-305-8
... Fig. 3 Setup for the flux leakage inspection of welded steel tubing. Source: Ref 1 Fig. 4 Typical flaws in seamless tubing, (a) blister, (b) gouge, (c) lamination, (d) lap (arrow), (e) pit, (f) plug scores, (g) rolled-in slugs, (h) scab, (i) seam (arrow). Source: Ref 1...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110144
EISBN: 978-1-62708-247-1
... Figure 7 Diagram of MCM module. Capacitor leakage site is identified with arrow on side facing the die. Figure 8 Noted Area of the capacitor that exhibited greatest disturbance during electrically monitored mechanical decapsulation. Figure 9 Thinned capacitor location...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110269
EISBN: 978-1-62708-247-1
... Generation Summary Advanced mechanisms of PVC generation Table 2 Advanced mechanisms of PVC generation Fig. 11 Both positive and negative charges can be detected in inline e-beam inspection tools Fig. 8 Influence of leakage resistance to the voltage building up at the structure...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110587
EISBN: 978-1-62708-247-1
... Mode Choke Coil and (b) Surface Mount (Powder Choke Coil). Figure 1 Typical Surface mount Ta-CAP construction [1] . Figure 2 Common causes for the Ta CAPS’ high leakage or short failure condition [8] . Figure 3 Different types of Ta-CAPS: (a) Optical image showing...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270110
EISBN: 978-1-62708-301-0
... of a tubular frame. The tubular frame is charged with nitrogen gas. The tube had cracked below the lug, resulting in gas leakage. It was a fatigue fracture due to excessive flexural load. In one type of helicopter, a few failures were experienced at the lug joint of the mixing unit attachment. The mixing...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110285
EISBN: 978-1-62708-247-1
... contact is also visible indicating leakage to the N-well. Figure 77 AFP topographical image (Left) and the corresponding AFP current contrast image (Right) for a failing 130nm SRAM bit cell (box). The light of the optical microscope induces a photo electric effect in the active silicon...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110652
EISBN: 978-1-62708-247-1
... Leakage Contact/Junction in the pull-down transistor 2. I/O to Vss Icc Arc-over at pad to contact in pull-down transistor 3. I/O to Vcc Leakage Contact/Junction – pull-up transistor 4. I/O to Vcc Icc Arc-over at pad to contact - Pull-up transistor 5. I/O to I/O Leakage Contact...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430351
EISBN: 978-1-62708-253-2
... from an economizer coil failed due to leakage. The failure was noticed during the first hydro test after erection. The tube was never subjected to operation. As per the specifications, the MOC of the tube was SA 210M Grade A1 steel, and the tube dimensions were 38.1 mm (1.5 in.) OD and 4.06 mm (0.16...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780131
EISBN: 978-1-62708-268-6
.... Leaks can create stress raisers in bonded joints or welded joints and provide a crack-initiation site. Leaks can reduce system efficiencies if the leak path is around a filter or other control feature. Leaks can result in test failures in tests where freedom from leakage is an acceptance...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110279
EISBN: 978-1-62708-247-1
... as part of failure analysis or troubleshooting to determine the root cause of issues such as leakage and timing delay. Basic device characteristics and testing methodology are presented next. The parameters that define transistor operation are drain voltage (V d ), drain current (I d ), gate...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430204
EISBN: 978-1-62708-253-2
... Window-type fracture in waterwall tube due to hydrogen damage Hydrogen damage can occur under low as well as high pH conditions. The leakage of condenser cooling water (i.e., brackish or seawater used for cooling), or even acidic excursions of boiler water chemistry for short times can develop low...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110513
EISBN: 978-1-62708-247-1
..., dendrite formation, electrolytic corrosion by residue voltage in off-mode Humidity ingress through plastic needs some time before root cause mechanisms start Intrinsic pre-damages are frequently not considered in binning (reverse bias leakage) very tolerant RBL-specifications E-motors with integrated...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430325
EISBN: 978-1-62708-253-2
... of water or wet steam from the attemperation performed in the final superheater region. The superheater coil of a boiler failed after a service life of about 7 years. The failure had occurred in the form of a crack in the transverse direction, and leakage was noticed from this crack during a hydro test...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430149
EISBN: 978-1-62708-253-2
...×; and (d) SEM after metallography highlighting presence of creep voids, 1000× Fig. 6.3 (a) Close-up view at the leakage location on outer surface of the sample and (b) corresponding location on inner surface showing similar linear opening Fig. 6.4 Tube sample in WFMPI tested condition...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720183
EISBN: 978-1-62708-305-8
... magnetization. Source: Ref 2 Fig. 4 Leakage fields between two pieces of a broken bar magnet (a) with magnet pieces apart, and (b) with magnet pieces together (simulating a flaw). (c) Leakage field at a crack in a bar magnet. Source: Ref 2 Fig. 5 Magnetized bars showing directions...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110524
EISBN: 978-1-62708-247-1
... at the lasing wavelength, or images without a filter, show low contrast. [3] Fig 19 Typical light vs. current (L-I) data for good and degraded parts. The curve with kinks is from a field failure suspected to have failed due to ESD. Fig 20 Observations of reverse leakage on an Emcore VCSEL...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110016
EISBN: 978-1-62708-247-1
... Figure 6 SAM inspection showed 4 groups of 2-die stacking devices in this MCP device (left), and thermal emission showed the high Icc leakage is from the upper left stack (right) Figure 9 IR inspection images showed the die edge damage at the active circuit areas (arrowed). (a) focus...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2012
DOI: 10.31399/asm.tb.smfpa.t53500157
EISBN: 978-1-62708-317-1
.../sheet interface to avoid leakage of the fluid during SHF-P. Methods to Avoid Sheet Bulging Formed part quality in SHF-P is dependent on part geometry, incoming sheet material properties, interface conditions (friction), and process parameters (namely, pot pressure and BHF) during forming. Common...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110634
EISBN: 978-1-62708-247-1
... of these specifications include guaranteed noise margins, drive capabilities and input leakage currents. For example, each I/O is functionally tested at its minimum voltage level to ensure it meets specification. Detecting defects by measuring the quiescent current of the power supply (typically V DD ) is called I...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110499
EISBN: 978-1-62708-247-1
... to additional current leakage from the cell so that the charge is lost during the retention time. Other problems may be in the capacitor itself. There may be defective cells of parametric variations of the capacitance of the capacitor. The DRAM cell is tested by use of the sense amplifier which is controlled...