1-20 of 338 Search Results for

J-integral

Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.mmfi.t69540281
EISBN: 978-1-62708-309-6
... time-dependent fracture mechanics. It also introduces two new fracture indices, the J-integral for handling large-scale yielding and the C*-integral for creep crack growth, providing close-form and handbook solutions for each. C*-integral creep crack growth rate J-integral nonlinear fracture...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2012
DOI: 10.31399/asm.tb.ffub.t53610101
EISBN: 978-1-62708-303-4
... with the steps involved in determining strain energy release rates, stress intensity factors, J-integrals, R-curves, and crack tip opening displacement parameters. It also covers fracture toughness testing methods and the effect of measurement variables. crack tip opening displacement elastic...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780211
EISBN: 978-1-62708-281-5
... Abstract This article briefly describes the historical development of fracture resistance testing of polymers and reviews several test methods developed for determining the fracture toughness of polymeric materials. The discussion covers J-integral testing, the methods for determining linear...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460209
EISBN: 978-1-62708-285-3
...-008-9203-3 8.11 Singh H. , Sidhu T.S. , and S. Kalsi B.S. , Cold Spray Technology: Future of Coating Deposition Processes , Fratt. Integr. Struttur. , Vol 22 , 2012 , p 69 – 84 10.3221/IGF-ESIS.22.08 8.12 Karthikeyan J. , “ Cold Spray Technology: International...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 May 2018
DOI: 10.31399/asm.tb.hma.t59250207
EISBN: 978-1-62708-287-7
... Johnstown and Lackawanna. Blast furnaces and BOFs were added later to make it a fully integrated plant. The first integrated steel company to be affected by the new market with increasing imports was J&L. They sold an interest in the company in 1968 to a Texas conglomerate called Ling-Temco-Vought...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270031
EISBN: 978-1-62708-301-0
....a0003751 2. Parker J.D. , McMinn A. , and Foulds J. , Material Sampling for the Assessment of Component Integrity , Life Assessment and Life Extension of Power Plant Components , Narayanan T.V. et al. , Ed., PVP, Vol 171 , The American Society of Mechanical Engineers...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430376
EISBN: 978-1-62708-253-2
.... , Don’t Let Those Boiler Tubes Fail Again , Power Engineering , January 1997 6.19 Estilles J. and Soria M. , “ Reducing Corrosion and Potential Boiler Failure with Superior Iron Transport Technology ,” GE Infrastructure Water and Process Technologies , 2009 , p 1 – 37 6.20...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2005
DOI: 10.31399/asm.tb.mmfi.9781627083096
EISBN: 978-1-62708-309-6
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110634
EISBN: 978-1-62708-247-1
...] Hawkins C. and Soden J. , “ Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICs, ” Int. Test Conf. , Nov. 1985 , pp. 544 - 555 . [3] Hawkins C. and Soden J. , “ Reliability and Electrical Properties of Gate Oxide Shorts in CMOS ICs...
Series: ASM Technical Books
Publisher: ASM International
Published: 30 April 2020
DOI: 10.31399/asm.tb.bpapp.t59290201
EISBN: 978-1-62708-319-5
... Temperature on Its Microstructure and Mechanical Properties , J. Mater. Process. Technol. , Vol 130 , 2002 , p 321 – 327 10.1016/S0924-0136(02)00739-2 3. Julien B. , Ste-Marie M. , Pelletier R. , Lapointe F. , and Turenne S. , Parametric Modeling of MIM As-Sintered Properties...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110563
EISBN: 978-1-62708-247-1
... R. , Ma Y.Z. , Liu B.H. , Chen C.Q. , Tan P.K. , Lam J. , Mai Z.H. , “ A controlled, mechanical method for MEMS decapsulation ”, 2017 IEEE 24th Int'l Symp. on the Physical and Failure Analysis of Integrated Circuits (IPFA) , Chengdu, China , 2017 . 10.1109/IPFA...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110025
EISBN: 978-1-62708-247-1
... L. , Venkata M. , Tran L. , Donna W. , Qiu W. , Alton J. , Taday P.F. , and Lin M. : “ Advanced Fault Isolation Technique Using Electro-Optical Terahertz Pulse Reflectometry ,” Proc. 19th Int. Symp. Phys. Fail. Anal. Integr. Circuits (IPFA) , July 2-6, 2012...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.stg2.t61280353
EISBN: 978-1-62708-267-9
... minima. Number of heats (casts) of metal, number of tests, number of component shapes, relationship of the test specimen location to the component location to be represented (integral test specimen versus specimens that are cut up from actual components), accuracy of heat treatment, and so on all play a...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110062
EISBN: 978-1-62708-247-1
... , Atomic Data and Nuclear Data Tables Vol. 54 ( no.2 ), 181 – 342 ( July 1993 ). 10.1006/adnd.1993.1013 [2] Colangelo J. , Microelectronic Failure Analysis Desk Reference , Fourth Edition , ASM International , 2002 . [3] Effects of x-ray irradiation on the channel hot-carrier...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110262
EISBN: 978-1-62708-247-1
.... , Lam J. , Mai Z.H. , Failure Analysis Methodology on Resistive Open Defects, ISTFA 2014: Conference Proceedings ( 2014 ) [8] Goh SH , Lee HC , Lim TY , Ting Fei , Ngow YT , Ng JG , Kong FL , Lau WY , Lim SK , Lam Jeffrey , A Novel Scan...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110001
EISBN: 978-1-62708-247-1
...] Kudva S.M. , Clark R. , Vallett D. , Ross D , Hasegawa T. , Gilfeather G. , Thayer M. , Pabbisetty S. , Shreeve R. , Ash B. , Serpiello J. , Huffman K. , Wagner L. , Kazmi S. , “ The SEMATECH Failure Analysis Roadmap ”, Proc Int’l...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.9781627082532
EISBN: 978-1-62708-253-2
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110209
EISBN: 978-1-62708-247-1
... References [1] Elliott C. T. , Day D. , Wilson D. J. , “ An Integrating Detector for Serial Scan Thermal Imaging ”, Infrared Physics , Vol. 22 ( 1982 ). pp. 31 - 42 . 10.1016/0020-0891(82)90016-1 [2] Pote D. , Thome G. , Guthrie T. , “ An Overview of Infrared...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110111
EISBN: 978-1-62708-247-1
... current distribution, as these are not known a priori. This requires solving a specific subset of Maxwell’s equations, namely the Biott-Savart law, that can be expressed in general (integral) form as: (1) B ( r ) = ∫ ∫ ∫ τ J ( r ′ ) × ( r − r ′ ) ‖ r...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2012
DOI: 10.31399/asm.tb.smff.t53400053
EISBN: 978-1-62708-316-4
.... and Chaboche J.-L. , Mechanics of Solid Materials , Cambridge University Press , 1990 10.1017/CBO9781139167970 5.13 Ghaei A. , Green D.E. , Taherizadeh A. , Semi-implicit Numerical Integration of Yoshida-Uemori Two Surface Plasticity Model , International Journal of...