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Interference microscopy

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030089
EISBN: 978-1-62708-349-2
... include bright-field illumination, dark-field illumination, polarized-light microscopy, interference and contrast microscopy, and fluorescence microscopy. The chapter also provides a discussion of sample preparation materials such as dyes, etchants, and stains for the analysis of composite materials using...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850267
EISBN: 978-1-62708-260-0
... on the nature of the problem, the expertise of the investigator, and the available equipment. Microscopy methods for enhancing contrast include the following Dark-field illumination Polarized light Phase contrast Interference methods Filters 4-2 Basic Concepts in Light Optical Theory...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030115
EISBN: 978-1-62708-349-2
.... These methods include: Bright field Polarized light Phase contrast Differential interference contrast (DIC), also known as Nomarski Modulation contrast, also known as Hoffman modulation contrast Epi-illumination Optical staining The various methods of transmitted optical microscopy...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780141
EISBN: 978-1-62708-268-6
... material performance (e.g., fuels and explosives). Contaminants can interfere with painting and other coating operations, allowing corrosion to accelerate, coatings to flake off, and so on. There are numerous techniques for confirming contaminant presence. Magnification, optical microscopy...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110067
EISBN: 978-1-62708-247-1
... attach region. Figure 22 A real-time x-ray image of the TO-220 package shown in Fig. 16 , taken after temperature cycling. Figure 44 X-ray radiographic inspection (A) and scanning laser acoustic microscopy (SLAM) (B) of IC packages. Figure 1 Coefficient of thermal expansion...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2018
DOI: 10.31399/asm.tb.fibtca.t52430107
EISBN: 978-1-62708-253-2
... 37.1 61.9 Avg 39.02 59.36 Abstract Abstract This chapter describes some of the most effective tools for investigating boiler tube failures, including scanning electron microscopy, optical emission spectroscopy, atomic absorption spectroscopy, x-ray fluorescence spectroscopy, x...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110042
EISBN: 978-1-62708-247-1
... from laser microscopy from the backside often show interference patterns. These patterns result from the destructive and constructive interference of monochromatic light waves that are reflected from each surface of the die. The effect can be so pronounced that the circuit can be quite hard to see...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110010
EISBN: 978-1-62708-247-1
... highlights the residue observed between Pins A2 and A3 after THB stress. Figure 2 Red circle highlights the residue observed between bumps after reflow stress. Figure 3 Red circle highlights the defect observed using scanning acoustic microscopy. With further analysis the defect...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780193
EISBN: 978-1-62708-268-6
..., optical microscopy, scanning electron microscopy, along with EDAX, spectrometry, chromatography (depending on material type) Interference Dimensional inspection, tolerance analysis, visual examination, microscopic examination Wear Dimensional inspection, tolerance analysis, visual examination...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.t67850165
EISBN: 978-1-62708-260-0
... in reflectivity from one another or from the matrix by at least 6 to 8 percent in the as-polished condition can be distinguished clearly. Smaller differences in reflectivity can be accentuated and made visible by the use of vapor-deposited interference films or by the use of phase-contrast illumination. Inclusion...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 1984
DOI: 10.31399/asm.tb.mpp.9781627082600
EISBN: 978-1-62708-260-0
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270102
EISBN: 978-1-62708-301-0
.... dowel bolts fatigue failure fractography low-cycle fatigue test metallography scanning electron microscopy Summary Background Pertinent Specifications and Manufacturing Details Testing Procedure and Results The spur and bevel gears of an aircraft engine were fastened by a set...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.omfrc.t53030177
EISBN: 978-1-62708-349-2
... lead to ambient- and elevated-temperature property degradation. In the following figures, ultrathin sections were developed from the composite materials to use transmitted-light optical microscopy contrast techniques to determine the phases. Figure 10.1 shows a cross section of a carbon-fiber...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110461
EISBN: 978-1-62708-247-1
... Figure 38 An illustration of implementation of off-axis electron holography in a TEM for two-dimensional dopant profiling. A Lorentz or objective mini lens is used for achieving a large field of view. The coherent electron beam passing through the sample and vacuum interfere with each other...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780109
EISBN: 978-1-62708-268-6
... • Galler D. and Blanchard R.A. , Failure Analysis of Components , Electronic Failure Analysis Handbook , Martin P.L. , Ed., McGraw-Hill , New York, NY , 1999 • Goldstein J.I. and Newbury D.E. , Scanning Electron Microscopy and X-Ray Microanalysis , 2nd ed...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720139
EISBN: 978-1-62708-305-8
... interferences in the x-ray regime are free of interferences in the visible light regime and can be better analyzed by OES. Combustion and Vacuum Fusion Analysis Combustion and vacuum fusion analysis is well suited to measuring gaseous impurities in metals. Electron Probe Microanalysis (EPMA...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110550
EISBN: 978-1-62708-247-1
...] Zulkifli S. , Zee B. , Qui W. and Gu A. , “ High-Res 3D X-ray Microscopy for Non-Destructive Failure Analysis of Chip-to-Chip Micro-bump Interconnects in Stacked Die Packages ,” in International Symposium on the Physical and Failure Analysis of Integrated Circuits , 2017 . 10.1109...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110180
EISBN: 978-1-62708-247-1
... in silicon ,” Phys. Rev. , vol. 102 , no. 2 , p. 369 , 1956 . 10.1103/PhysRev.102.369 [4] Khurana N. and Chiang C. L. , “ Analysis of Product Hot Electron Problems by Gated Emission Microscopy ,” Proc. IEEE IRPS , p. 189 , 1986 . 10.1109/IRPS.1986.362132 [5] Breitenstein...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110111
EISBN: 978-1-62708-247-1
... . Detecting power shorts from front and backside of ic packages using scanning squid microscopy . In Proc. of the 25th Int’l Symp. on Testing and Failure Analysis , page 11 , Santa Clara, CA , November 1999 . [3] Dias R. , Skoglund L. , Wang Z. , and Smith D. . Integration...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720161
EISBN: 978-1-62708-305-8
...Abstract Abstract This chapter describes the methods and equipment applicable to metallographic studies and discusses the preparation of specimens for examination by light optical microscopy. Five major operations for preparation of metallographic specimens are discussed: sectioning, mounting...