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Fourier transform infrared spectroscopy

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110434
EISBN: 978-1-62708-247-1
... STEM (with thin samples), wavelength dispersive x-ray spectroscopy (WDS), Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS, also knows as ESCA), secondary ion mass spectrometry (SIMS), Rutherford backscattering spectrometry (RBS), Fourier transform infrared spectroscopy (FTIR...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780141
EISBN: 978-1-62708-268-6
... microscopy, and scanning electron microscopy can reveal the presence of contaminants. Any of the materials analysis technologies (energy-dispersive analysis of x-rays, Fourier transform infrared spectroscopy, spectrometry, chromatography, secondary ion mass spectrometry, and Auger) can be used to identify...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780093
EISBN: 978-1-62708-268-6
... not available to the failure analysis team, many commercial laboratories can provide the services. Chemical and materials analysis technologies include energy-dispersive analysis of x-rays, spectrographic techniques (including electron probe microanalysis, Fourier transform infrared spectroscopy, mass...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780131
EISBN: 978-1-62708-268-6
... transform infrared spectroscopy is a good technology for identifying the presence of such contaminants. The epoxy or adhesive application process can be critical. For example, some manufacturers require wetting both surfaces to be sealed with the epoxy or adhesive and then pushing the two surfaces...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.9781627082815
EISBN: 978-1-62708-281-5
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2010
DOI: 10.31399/asm.tb.scm.t52870063
EISBN: 978-1-62708-314-0
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110603
EISBN: 978-1-62708-247-1
... analyzer (TMA), dynamic mechanical analyzer (DMA), hardness testers, Fourier transform infrared spectroscope (FTIR). Information on original part material may be needed Packaging evaluation Severity: non-destructive Tools/Equipment: scanning acoustic microscope (SAM), ion chromatography. Die...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110219
EISBN: 978-1-62708-247-1
...] . The amplitude and phase values estimated by Fast-Fourier-Transformation (FFT) are equal to those obtained by classical LIT, with the only difference that classical LIT requires repetition of the measurements at individual lock-in frequencies. The approach of acquiring the entire TRTR reduces the...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780109
EISBN: 978-1-62708-268-6
... silicone in the area, it is an indication that the bond area was contaminated. The failure analysis team can also use Fourier transform infrared (FTIR) spectroscopy (as outlined in Chapter 11 ) to assess if contaminants were present. FTIR is commonly used for this purpose, and it is particularly well...