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Conductors (devices)

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110196
EISBN: 978-1-62708-247-1
... image (a) localizing a short circuit site on a 1MB SRAM and backside reflected light (b) image of the same field of view. Note that the shorting particle on top of metal-1 is not visible from the backside in (b). Figure 17 Backside SEI image (a) showing an open conductor resulting from an FIB...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110485
EISBN: 978-1-62708-247-1
.... Figure 9 AFM image of slip lines (dislocations) at the silicon surface of a fabricated device. The green arrows point to the slip lines. Figure 10 System schematic of a SKPM [8] . Figure 13 Locally induced capacitance variation in a p-doped semiconductor substrate; a) a negative...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110025
EISBN: 978-1-62708-247-1
... a board or individual components. It is based on the principle of using a high-temperature (72K) superconducting quantum interference device (SQUID) to measure the vertical components of the magnetic fields surrounding conductors carrying current through short circuits or current arising from standing...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110111
EISBN: 978-1-62708-247-1
... spot at the center of the image. Figure 1 (Left) Magnetic field around a current element. The vertical component as detected by a sensor above the conductor is shown. Note opposite signs of the field on each side of the conductor (image courtesy of D. Vallett, Peaksource). (Right) 2D false...
Book Chapter

By J. W. Ekin
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 1983
DOI: 10.31399/asm.tb.mlt.t62860465
EISBN: 978-1-62708-348-5
..., size, and weight can be substantial and is the main motivating force for the use of superconducting magnets in a number of devices. 13.1.1 Applications Superconducting composites are used extensively today in many applications (a) where high magnetic fields must be generated economically or (b...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2015
DOI: 10.31399/asm.tb.piht2.9781627083119
EISBN: 978-1-62708-311-9
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110351
EISBN: 978-1-62708-247-1
... and Ga ion sputtering into Si and Cu samples at a range of energies from 9 KeV to 35 keV. [95] Figure 48 A neon beam was used to machine a trench through Si and stop on transistor diffusion fins and poly (metal-gate) regions from the backside of a 22 nm device. [99] Figure 41...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720345
EISBN: 978-1-62708-305-8
... to reveal the presence of the flaw. Various means are used to magnetize the tube. A current carrying conductor inside the tube produces a circular magnetic field, magnetizing the tube in a circumferential direction. The magnetic flux is diverted by the longitudinal component of any flaws in its path...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720183
EISBN: 978-1-62708-305-8
... by placing the contact surfaces of the yoke next to and on either side of the bead (rotating yoke about 90° from position shown here). Source: Ref 2 Fig. 8 Use of central conductors for circular magnetization of (a) long hollow cylindrical parts and (b) short hollow cylindrical and ring-like...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 1983
DOI: 10.31399/asm.tb.mlt.t62860163
EISBN: 978-1-62708-348-5
... commercial components is described by Clark and Fickett (1969) . An extensive discussion of techniques using SQUID (Superconducting Quantum Interference Devices) detectors is given by Gifford, Webb, and Wheatley (1972) . Other devices, which convert the low-level dc voltage to ac in the cryostat...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 2013
DOI: 10.31399/asm.tb.ems.t53730037
EISBN: 978-1-62708-283-9
.... It discusses the significance of energy bands, intrinsic and extrinsic conduction, and the properties of compound semiconductors. It also covers semiconductor devices, including p-n junctions, light emitting diodes, transistors, and piezoelectric crystals. electrical behavior light emitting diodes...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.9781627082501
EISBN: 978-1-62708-250-1
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 1988
DOI: 10.31399/asm.tb.eihdca.t65220241
EISBN: 978-1-62708-341-6
... times, the high heating rates of induction are needed for processing nonconductors. This chapter describes broad methods of accomplishing such objectives: modification of the field of magnetic induction, use of devices to prevent auxiliary equipment or certain portions of a workpiece from being heated...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 1988
DOI: 10.31399/asm.tb.eihdca.t65220281
EISBN: 978-1-62708-341-6
... increases. Coating thickness is therefore limited by the properties of the plastic itself. Similar techniques are employed in insulating electrical conductors using polyemide film or tape. The high-temperature resistance of the polyemide film, which is applied in the form of high-integrity tape heat...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 1983
DOI: 10.31399/asm.tb.mlt.t62860515
EISBN: 978-1-62708-348-5
... the practical use of all thermometers is associated with some approximation of the thermodynamic temperature scale. A short section is devoted to types of temperature measuring devices. The characteristics of commercially available resistance-type strain gauges at low temperatures are stressed. greases...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720063
EISBN: 978-1-62708-305-8
.... Therefore, a machine vision system includes both visual sensing and interpretive capabilities. An image sensing device, such as a vidicon camera or a charge-coupled device (CCD) image sensor, is nothing more than a visual sensor that receives light through its lens and converts this light into electrical...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 August 1999
DOI: 10.31399/asm.tb.caaa.t67870001
EISBN: 978-1-62708-299-0
... such as chemical processing equipment. Also for nameplates, fan blades, flue lining, sheet metal work, spun holloware, and fin stock 1350 Electrical conductors 2011 Screw machine products. Appliance parts and trim, ordnance, automotive, electronic, fasteners, hardware, machine parts 2014 Truck frames...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110132
EISBN: 978-1-62708-247-1
...] Searls Damion , Don Anura , Dy Emilie , Goyal Deepak , “ Time Domain Reflectometry as a Device Packaging Level Failure Analysis and Failure Localization Tool ”, ISTFA 2000: Proceedings of the 26th International Symposium for Testing and Failure Analysis , Pp. 285 – 291 . [3...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2008
DOI: 10.31399/asm.tb.emea.t52240303
EISBN: 978-1-62708-251-8
.... Fig. 17.4 Density of state-energy curves and band structures Although all metals are relatively good conductors of electricity, they exhibit a range of resistivities. There are a number of reasons for this variability. The resistivity of a metal depends on the density of states of the most...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110180
EISBN: 978-1-62708-247-1
... FinFET 10nm and Smaller Band Gap Engineering Strain and Channel Mobility Forward Bias Reverse Bias Leaky pn Junction Avalanche Breakdown As discussed in the introduction, light emission phenomena are very unlikely in commercial passive devices built from conductor and insulator...