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CMOS inverter

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110180
EISBN: 978-1-62708-247-1
... contactless characterization for the most important electronic device, the MOS - Field Effect Transistor, the heart of ICs and their basic digital element, the CMOS inverter. The article discusses the specification and selection of detectors for proper PE applications. The main topics are image resolution...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110613
EISBN: 978-1-62708-247-1
... 2003 . 10. Rodriguez R. , Stathis J. , and Linder B. , “ Modeling and experimental verification of the effect of gate oxide breakdown on CMOS inverters, ” International Reliability Physics Symposium (IRPS) , pp. 11 - 16 , April 2003 . 11. Suehle J. , “ Utrathin gate...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110196
EISBN: 978-1-62708-247-1
... response to the resistance variation and/or the induced electromotive force. The IC effect was simulated with Spice for a resistive defect short-circuiting the PMOS of a CMOS inverter as shown in Figure 6 . TLS of the resistive defect was simulated by varying the resistance value. Figure 6 CMOS...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110228
EISBN: 978-1-62708-247-1
... interaction and its effect on the CMOS circuit. The LADA interactions will be covered in four sections: Cross-sectional views of the OBIC current sources in an inverter are presented. Examples of well-based OBIC are shown. The drift and diffusion components of OBIC are explained. Guidelines...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110351
EISBN: 978-1-62708-247-1
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110643
EISBN: 978-1-62708-247-1
.... , “ Phase Noise and Jitter in CMOS Ring Oscillators ”, J. Solid-State Circuits , vol.41 , pp. 1803 - 1816 , Aug. 2006 10.1109/JSSC.2006.876206 [22] Sunter S. , “ A General Strategy for BIST of High-Speed Analog Functions ”, Informal Proc. of Workshop on Test and Verification of High...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110244
EISBN: 978-1-62708-247-1
... Probing of Flip Chip Packaged Microprocessors ,” Journal of Vacuum Science and Technology B , 16 , p 3625 ( 1998 ) 10.1116/1.590316 [9] Kasapi S. et al. , “ Laser Beam Backside Probing of CMOS Integrated Circuits ,” Microelectronics Reliability , 39 , 957 ( 1999 ) 10.1016/S0026-2714...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110042
EISBN: 978-1-62708-247-1
.... If you remove the eyepiece from a common microscope and invert it so you look through the bottom, it makes a fine hand lens for quickly examining an object. A practical microscope requires an illuminator. The illuminator illustrated in figure 1 is an epi-illuminator, epi meaning ‘above’ in...