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Auger electron spectroscopy

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Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
...-Ray photoelectron spectroscopy, X-ray fluorescence, Auger electron spectroscopy, Raman spectroscopy, oxygen analysis, and nanoindentation. cold-sprayed coatings residual-stress analysis hardness bond adhesion strength microscopy spectroscopy diffraction MATERIALS CHARACTERIZATION...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
... Abstract This article covers common techniques for surface characterization, including the modern scanning electron microscopy and methods for the chemical characterization of surfaces by Auger electron spectroscopy, X-ray photoelectron spectroscopy, and time-of-flight secondary ion mass...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110447
EISBN: 978-1-62708-247-1
... six methods used in semiconductor industry are: Auger spectroscopy, dynamic secondary ion mass spectroscopy, time of flight static secondary ion mass spectroscopy (ToF-SIMS), X-ray photoelectron spectroscopy, scanning electron microscope-energy dispersive X-ray spectroscopy (SEM-EDX), and transmission...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.9781627082815
EISBN: 978-1-62708-281-5
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2015
DOI: 10.31399/asm.tb.spsp2.t54410001
EISBN: 978-1-62708-265-5
... Auger Electron Spectroscopy (AES) is capable of showing thin concentrations of low atomic number elements exposed at fracture surfaces in specimens broken under high vacuum in Auger electron microscopes. The latter experimental technique has been very important in showing impurity atom segregation...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110434
EISBN: 978-1-62708-247-1
... of 1 micron or less, so it is a reasonably powerful technique for many failure analysis problems. Table 1 Properties of analytical techniques including energy dispersive x-ray spectroscope (EDS) in the SEM or STEM (with thin samples), wavelength dispersive x-ray spectroscopy (WDS), Auger...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.t66910475
EISBN: 978-1-62708-250-1
...-ray mapping of 0.25 mm 2 area or line scanning is possible. Requires specialized equipment in conjunction with an electron microscope. Electron penetration depth about 10 μm so limited use in analysis of surface films C.7 Electron spectroscopy Analysis of either photoelectrons or Auger...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270019
EISBN: 978-1-62708-301-0
... to 1 μm Auger electron spectroscopy: Applicable to all elements except hydrogen and helium; accessible range, >0.1%; accuracy, 5 to 10%; analysis depth, 10 to 20 Å X-ray photoelectron spectroscopy: Applicable to all elements except hydrogen and helium; accessible range, >0.01...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720139
EISBN: 978-1-62708-305-8
... of related techniques of these methods are also covered. chemical composition dissolved gases high-temperature combustion inert gas fusion methods optical emission spectroscopy scanning auger microprobe surface analysis X-ray fluorescence spectroscopy THE OVERALL CHEMICAL COMPOSITION...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110506
EISBN: 978-1-62708-247-1
... (STM) reveal physical or chemical characteristics of the sample. Elemental analysis using Energy Dispersive X-Ray Spectroscopy (EDS), or Auger Electron Spectroscopy (AES). ...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2017
DOI: 10.31399/asm.tb.sccmpe2.t55090191
EISBN: 978-1-62708-266-2
... are not applicable to RIS. Early direct measurements of RIS were performed by Auger electron spectroscopy (AES) coupled with depth profiling by sputtering ( Ref 6.42 , 6.43 ). In general, the irradiations used heavy metal ions, were greatly accelerated (e.g., by approximately 10,000×) compared with LWR...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2002
DOI: 10.31399/asm.tb.mgppis.t60400149
EISBN: 978-1-62708-258-7
... of a specimen, there are a number of specialized, sophisticated instruments and techniques available to the metallographer. These instruments are usually located in a research laboratory or specialized testing laboratory and include: Auger electron spectroscopy (AES) X-ray photoelectron spectroscopy...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780093
EISBN: 978-1-62708-268-6
... system, the specimen is illuminated with an electron stream (similar to the approach used by scanning electron microscopy). The specimen then emits Auger electrons, which are electrons emitted by the excitation and de-excitation of atoms. These Auger electrons can be captured by a detector and correlated...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780343
EISBN: 978-1-62708-281-5
... Polymer morphology Polymer features and defects X-ray photoelectron spectroscopy (XPS) Elemental concentrations, oxidation states Chemical composition of surfaces, determination of surface species Auger electron spectroscopy (AES) Elemental concentrations Chemical compositions of surfaces...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 March 2012
DOI: 10.31399/asm.tb.pdub.t53420239
EISBN: 978-1-62708-310-2
... in the reaction zone of diffusion couples can be detected simply using an optical microscope. Different measurement techniques can be used to determine the chemical compositions on both sides of the interfaces. These are Auger electron spectroscopy (AES), secondary ion mass spectrometry (SIMS), Rutherford...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2005
DOI: 10.31399/asm.tb.faesmch.t51270005
EISBN: 978-1-62708-301-0
... 6. Joshi A. , Davis L.E. , and Palmberg P.W. , Auger Electron Spectroscopy , Methods of Surface Analysis , Czanderna A.W. , Ed., Elsevier , Amsterdam , 1975 , p 159 10.1016/B978-0-444-41344-4.50012-4 7. Radhakrishnan S. , National Aeronautical Laboratory...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110335
EISBN: 978-1-62708-247-1
... and indirectly. A dual beam configuration, in combination with energy dispersive spectroscopy (EDS), indirectly enables 3D tomography and chemical mapping in a slice by slice fashion. The ion beam is used as a tool for removing material while the electron beam performs the crucial analysis. In contrast to EDS...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 October 2011
DOI: 10.31399/asm.tb.mnm2.9781627082617
EISBN: 978-1-62708-261-7
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780359
EISBN: 978-1-62708-281-5
... (MS) Molecular structure Material identification, additives X-ray photoelectron spectroscopy (XPS) Elemental concentrations Chemical composition of surfaces Auger electron spectroscopy (AES) Elemental concentrations Chemical composition of surfaces Source: Ref 3...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780141
EISBN: 978-1-62708-268-6
..., and scanning electron microscopy can reveal the presence of contaminants. Any of the materials analysis technologies (energy-dispersive analysis of x-rays, Fourier transform infrared spectroscopy, spectrometry, chromatography, secondary ion mass spectrometry, and Auger) can be used to identify elements...