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Auger electron spectroscopy

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Published: 01 January 2017
Fig. 6.12 Comparison using auger electron spectroscopy (AES) ( Ref 6.45 , 6.61 ) of commercial-purity type 304, commercial-purity type 348, and high-purity type 348 stainless steels irradiated to various fluences in an advanced test reactor (ATR) or BWR. The average of all grain-boundary data More
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Published: 01 June 2016
Fig. 5.30 Auger electron spectroscopy of the fracture surface of an aluminum cold-sprayed coating (a) in the as-sprayed condition and (b) after ion beam milling, revealing the surface layer chemistry. Source: Ref 5.76 More
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Published: 01 December 2003
Fig. 16 Auger electron spectroscopy survey spectra comparing the metal sides of (a) high- and (b) low-peel-strength polyester-adhesive-metal laminates More
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Published: 01 December 2003
Fig. 17 Auger electron spectroscopy depth profiles of the specimens in Fig. 16 More
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Published: 01 December 2003
Fig. 21 Auger electron spectroscopy-ion milling depth profiles comparing laminates. (a) X laminate, 5 nm (50 Å)/min. (b) Y laminate, 10 nm (100 Å)/min More
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Published: 01 December 2003
Fig. 28 Auger electron spectroscopy survey spectrum from integrated circuit chip solder pad failure surface More
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780383
EISBN: 978-1-62708-281-5
... Abstract This article covers common techniques for surface characterization, including the modern scanning electron microscopy and methods for the chemical characterization of surfaces by Auger electron spectroscopy, X-ray photoelectron spectroscopy, and time-of-flight secondary ion mass...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 June 2016
DOI: 10.31399/asm.tb.hpcspa.t54460121
EISBN: 978-1-62708-285-3
...-Ray photoelectron spectroscopy, X-ray fluorescence, Auger electron spectroscopy, Raman spectroscopy, oxygen analysis, and nanoindentation. cold-sprayed coatings residual-stress analysis hardness bond adhesion strength microscopy spectroscopy diffraction MATERIALS CHARACTERIZATION...
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Published: 01 December 2003
Fig. 18 Schematic models derived from x-ray photoelectron spectroscopy and Auger electron spectroscopy analysis of (a) high-strength and (b) low-strength polyester-adhesive-brass laminates More
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Published: 01 January 2017
Fig. 1.25 Grain-boundary segregation measurements in alloy 600 and type 304 stainless steel. Shown are Auger electron spectroscopy measurements of phosphorus segregation in the two alloys as compared to the model prediction for phosphorus segregation in nickel. More
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Published: 01 December 2015
Fig. 23 Grain-boundary segregation measurements in Alloy 600 and type 304 stainless steel. Shown are auger electron spectroscopy measurements of phosphorus segregation in the two alloys as compared with model prediction for phosphorus segregation in nickel. More
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Published: 01 December 2003
Fig. 13 Ion impact removal of atoms or clusters from solid surfaces. Mass analysis of the sputtered particles is the basis of the static SIMS technique. Simultaneous Auger electron spectroscopy analysis of the bottom of the etch crater produces chemical depth profiles. More
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110447
EISBN: 978-1-62708-247-1
... six methods used in semiconductor industry are: Auger spectroscopy, dynamic secondary ion mass spectroscopy, time of flight static secondary ion mass spectroscopy (ToF-SIMS), X-ray photoelectron spectroscopy, scanning electron microscope-energy dispersive X-ray spectroscopy (SEM-EDX), and transmission...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.9781627082815
EISBN: 978-1-62708-281-5
Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2003
DOI: 10.31399/asm.tb.cfap.t69780433
EISBN: 978-1-62708-281-5
... length critical crack length initial crack size acrylonitrile-butadiene-styrene acetals Auger electron spectroscopy aramid ber American National Standards Institute ammonium polyphosphate American Society for Testing and Materials alumina trihydrate thickness butadiene bulk molding compound Building...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2015
DOI: 10.31399/asm.tb.spsp2.t54410001
EISBN: 978-1-62708-265-5
... Spectroscopy (EDS). In Electron Probe Microanalyzers the spectra are resolved with better resolution by diffraction of the characteristic Xrays from single crystals in a process referred to as Wavelength Dispersive Spectroscopy (WDS) ( Ref 1.3 ). Auger Electron Spectroscopy The X-ray spectra generated...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 April 2013
DOI: 10.31399/asm.tb.imub.t53720139
EISBN: 978-1-62708-305-8
... of related techniques of these methods are also covered. chemical composition dissolved gases high-temperature combustion inert gas fusion methods optical emission spectroscopy scanning auger microprobe surface analysis X-ray fluorescence spectroscopy THE OVERALL CHEMICAL COMPOSITION...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 November 2019
DOI: 10.31399/asm.tb.mfadr7.t91110434
EISBN: 978-1-62708-247-1
... (with thin samples), wavelength dispersive x-ray spectroscopy (WDS), Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS, also knows as ESCA), secondary ion mass spectrometry (SIMS), Rutherford backscattering spectrometry (RBS), Fourier transform infrared spectroscopy (FTIR), and total...
Book Chapter

Series: ASM Technical Books
Publisher: ASM International
Published: 01 December 2009
DOI: 10.31399/asm.tb.sfa.t52780093
EISBN: 978-1-62708-268-6
..., Fourier transform infrared spectroscopy, mass spectrometry, secondary ion mass spectrometry, and Auger analysis), and chromatography. These technologies are described as follows. Energy-Dispersive Analysis of X-Rays Perhaps the most common materials analysis technology is energy-dispersive analysis...
Series: ASM Technical Books
Publisher: ASM International
Published: 01 January 2000
DOI: 10.31399/asm.tb.cub.t66910475
EISBN: 978-1-62708-250-1
... photoelectrons or Auger electrons emitted from a surface excited by an x-ray beam or an electron beam. (Techniques known as x-ray photoelectron spectroscopy, XPS, or Auger electron spectroscopy, AES Quantitative chemical analysis of outermost atomic layers of surfaces Only true “surface analysis” techniques...