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ASM Technical Books
Microelectronics Failure Analysis: Desk Reference (Seventh Edition)Available to Purchase
Edited by
ASM International
ISBN electronic:
978-1-62708-247-1
Publication date:
2019
Book Chapter
Failure Analysis Terms and Definitions Available to Purchase
By
Christopher L. Henderson
Christopher L. Henderson
Semitracks Inc.
Search for other works by this author on:
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Published:2019
Page range:
678 - 694
Abstract
This article is a compilation of terms and definitions related to failure analysis that have been addressed in the proceedings of the International Symposium for Testing and Failure Analysis.
You do not currently have access to this chapter.
Citation
Christopher L. Henderson, Failure Analysis Terms and Definitions, Microelectronics Failure Analysis: Desk Reference, 7th ed., Edited By Tejinder Gandhi, ASM International, 2019, p 678–694, https://doi.org/10.31399/asm.tb.mfadr7.t91110678
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