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ASM Technical Books
Microelectronics Failure Analysis: Desk Reference (Seventh Edition)
Edited by
ASM International
ISBN electronic:
978-1-62708-247-1
Publication date:
2019
Book Chapter
Failure Analysis Terms and Definitions
By
Christopher L. Henderson
Christopher L. Henderson
Semitracks Inc.
Search for other works by this author on:
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Published:2019
Page range:
678 - 694
Abstract
This article is a compilation of terms and definitions related to failure analysis that have been addressed in the proceedings of the International Symposium for Testing and Failure Analysis.
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Citation
Christopher L. Henderson, Failure Analysis Terms and Definitions, Microelectronics Failure Analysis: Desk Reference, 7th ed., Edited By Tejinder Gandhi, ASM International, 2019, p 678–694, https://doi.org/10.31399/asm.tb.mfadr7.t91110678
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