Microelectronics Failure Analysis: Desk Reference (Seventh Edition)
Fault Isolation Using Time Domain Reflectometry, Electro Optical Terahertz Pulse Reflectometry and Time Domain Transmissometry
-
Published:2019
Abstract
Time-domain based characterization methods, mainly time-domain reflectometry (TDR) and time-domain transmissometry (TDT), have been used to locate faults in twisted cables, telegraph lines, and connectors in the electrical and telecommunication industry. This article provides a brief review of conventional TDR and its application limitations to advanced packages in semiconductor industry. The article introduces electro optical terahertz pulse reflectometry (EOTPR) and discusses how its improvements of using high frequency impulse signal addressed application challenges and quickly made it a well-adopted tool in the industry. The third part of this article introduces a new method which combines impulse signal and the...
Sign in
ASM members
Member Sign InHemachandar Tanukonda Devarajulu, Deepak Goyal, Mayue Xie, Fault Isolation Using Time Domain Reflectometry, Electro Optical Terahertz Pulse Reflectometry and Time Domain Transmissometry, Microelectronics Failure Analysis: Desk Reference, 7th ed., Edited By Tejinder Gandhi, ASM International, 2019, p 132–143, https://doi.org/10.31399/asm.tb.mfadr7.t91110132
Download citation file:
Join ASM International
Being a member of the world’s largest association of materials professionals provides the benefits and resources you need to accomplish your personal and professional goals.