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Electronic Device Failure Analysis Technology Roadmap
By
Electronic Device Failure Analysis Society
Electronic Device Failure Analysis Society
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ASM International
ISBN electronic:
978-1-62708-462-8
Publication date:
2023
Book Chapter
Failure Analysis Future Roadmap
-
Published:2023
Page range:
155 - 163
Abstract
This chapter summarizes critical gaps and long-term needs in failure analysis technology as it relates to logic and memory devices and IC packages. It assesses the impact of vertical integration, new materials, and expansion in the third dimension on volume analysis, sample preparation and measurement methods, and cross-sectioning and imaging.
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Citation
Nicholas Antoniou, Failure Analysis Future Roadmap, Electronic Device Failure Analysis Technology Roadmap, By Electronic Device Failure Analysis Society, ASM International, 2023, p 155–163, https://doi.org/10.31399/asm.tb.edfatr.t56090155
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